nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A method for determining foil thicknesses in TEM by using convergent beam electron diffraction under weak beam conditions
|
Botros, K.Z. |
|
1995 |
26 |
6 |
p. 539-543 |
artikel |
2 |
An electron diffraction study of the misfit layer compound (NdS)nNbS2
|
Meng-Burany, X. |
|
1995 |
26 |
6 |
p. 545-550 |
artikel |
3 |
A TEM study of α-phase stability in Zr-2.5 Nb pressure tubes following neutron irradiation (A TEM study of α-phase stability)
|
Griffiths, M. |
|
1995 |
26 |
6 |
p. 555-557 |
artikel |
4 |
A TEM study of the stability of intermetallic precipitates in Zircaloy nuclear reactor components
|
Griffiths, M. |
|
1995 |
26 |
6 |
p. 551-553 |
artikel |
5 |
Crystallization kinetics in ferroelectric thin films: Viability of atomic force microscopy
|
Griswold, Ellen M. |
|
1995 |
26 |
6 |
p. 559-564 |
artikel |
6 |
Detection of impurity segregation in zone-confined, polycrystalline tin-doped indium oxide thin films by STM and AFM
|
Rauf, I.A. |
|
1995 |
26 |
6 |
p. 565-569 |
artikel |
7 |
Diary
|
|
|
1995 |
26 |
6 |
p. 571-572 |
artikel |
8 |
Direct structure determination by electron crystallography: Protein data sets
|
Dorset, Douglas L. |
|
1995 |
26 |
6 |
p. 511-520 |
artikel |
9 |
Editorial
|
Arsenault, A.L. |
|
1995 |
26 |
6 |
p. v |
artikel |
10 |
Elastic strain determination in semiconductor epitaxial layers by HREM
|
Robertson, M.D. |
|
1995 |
26 |
6 |
p. 521-537 |
artikel |
11 |
Evaluation of a metaphase chromosome finder: Potential application to chromosome-based radiation dosimetry
|
McLean, J.R.N. |
|
1995 |
26 |
6 |
p. 489-492 |
artikel |
12 |
Imaging biological specimens with the confocal scanning laser microscope/macroscope
|
Damaskinos, S. |
|
1995 |
26 |
6 |
p. 493-502 |
artikel |
13 |
Low energy electron point source microscopy
|
Kreuzer, H.J. |
|
1995 |
26 |
6 |
p. 503-509 |
artikel |
14 |
Very early Canadian electron microscopists and their microscopy
|
Watson, John H.L. |
|
1995 |
26 |
6 |
p. 483-488 |
artikel |