nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accounting for time-dependent effects on CMOS total-dose response in space environments
|
Fleetwood, Daniel M. |
|
1994 |
43 |
1-2 |
p. 129-138 10 p. |
artikel |
2 |
Atomic displacement and total ionizing dose damage in semiconductors
|
BraƤunig, D. |
|
1994 |
43 |
1-2 |
p. 105-127 23 p. |
artikel |
3 |
Charge collection and SEU mechanisms
|
Musseau, O. |
|
1994 |
43 |
1-2 |
p. 151-163 13 p. |
artikel |
4 |
Cosmic rays and their interactions with the geomagnetic field and shielding material
|
Heinrich, W. |
|
1994 |
43 |
1-2 |
p. 19-34 16 p. |
artikel |
5 |
Editorial
|
Adams, Len |
|
1994 |
43 |
1-2 |
p. v-vi nvt p. |
artikel |
6 |
Editorial Board
|
|
|
1994 |
43 |
1-2 |
p. IFC- 1 p. |
artikel |
7 |
Hardness assurance for space system microelectronics
|
Pease, Ronald L. |
|
1994 |
43 |
1-2 |
p. 191-204 14 p. |
artikel |
8 |
Predicting end-of-life performance of microelectronics in space
|
Holmes-Siedle, Andrew |
|
1994 |
43 |
1-2 |
p. 57-77 21 p. |
artikel |
9 |
Proton induced spallation reactions
|
McNulty, Peter J. |
|
1994 |
43 |
1-2 |
p. 139-149 11 p. |
artikel |
10 |
Radiation effects in materials
|
Dauphin, J. |
|
1994 |
43 |
1-2 |
p. 47-56 10 p. |
artikel |
11 |
Radiation effects on solid state imaging devices
|
Hopkinson, G.R. |
|
1994 |
43 |
1-2 |
p. 79-91 13 p. |
artikel |
12 |
Radiation-hardened microelectronics for space applications
|
Winokur, P.S. |
|
1994 |
43 |
1-2 |
p. 175-190 16 p. |
artikel |
13 |
Solar cell radiation damage
|
Crabb, R.L. |
|
1994 |
43 |
1-2 |
p. 93-103 11 p. |
artikel |
14 |
Solar proton events and their effect on space systems
|
Tranquille, C. |
|
1994 |
43 |
1-2 |
p. 35-45 11 p. |
artikel |
15 |
Test methods for single event upset/latch-up
|
Harboe-Sorensen, R. |
|
1994 |
43 |
1-2 |
p. 165-174 10 p. |
artikel |
16 |
The radiation belts
|
Daly, E.J. |
|
1994 |
43 |
1-2 |
p. 1-17 17 p. |
artikel |