| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Anti-shock controller design for optical drives
|
Zhou, Yu
|
|
2004
|
12 |
7 |
p. 811-817
7 p.
|
artikel
|
| 2 |
A pictorial human–computer interface concept for supervisory control
|
Wittenberg, Carsten
|
|
2004
|
12 |
7 |
p. 865-878
14 p.
|
artikel
|
| 3 |
Automation and control issues in the design of a pharmaceutical pilot plant
|
Bequette, B.Wayne
|
|
2004
|
12 |
7 |
p. 901-908
8 p.
|
artikel
|
| 4 |
Combining first principles with black-box techniques for reaction systems
|
Chen, Libei
|
|
2004
|
12 |
7 |
p. 819-826
8 p.
|
artikel
|
| 5 |
Conference calendar-update 12/6
|
|
|
2004
|
12 |
7 |
p. 931-932
2 p.
|
artikel
|
| 6 |
Constrained model predictive control of blow tank consistency
|
Allison, Bruce J.
|
|
2004
|
12 |
7 |
p. 837-845
9 p.
|
artikel
|
| 7 |
Estimating product composition profiles in batch distillation via partial least squares regression
|
Zamprogna, Eliana
|
|
2004
|
12 |
7 |
p. 917-929
13 p.
|
artikel
|
| 8 |
Flowmeter random error estimation by an analytical variance estimation method: a simple test bed
|
Biscarri, F.
|
|
2004
|
12 |
7 |
p. 857-863
7 p.
|
artikel
|
| 9 |
Identification and control of an industrial polymerisation reactor
|
Mourue, G
|
|
2004
|
12 |
7 |
p. 909-915
7 p.
|
artikel
|
| 10 |
Identification of sensor faults on turbofan engines using pattern recognition techniques
|
Aretakis, N.
|
|
2004
|
12 |
7 |
p. 827-836
10 p.
|
artikel
|
| 11 |
Model-based diagnosis of sensor faults for ESP systems
|
Ding, E.L.
|
|
2004
|
12 |
7 |
p. 847-856
10 p.
|
artikel
|
| 12 |
On control of resist film uniformity in the microlithography process
|
Khuen Ho, Weng
|
|
2004
|
12 |
7 |
p. 881-892
12 p.
|
artikel
|
| 13 |
Preface to special section on process control
|
Daoutidis, Prodromos
|
|
2004
|
12 |
7 |
p. 879-
1 p.
|
artikel
|
| 14 |
Robust set-point controllers for an electric arc furnace cooling system
|
Shinohara, A.
|
|
2004
|
12 |
7 |
p. 799-810
12 p.
|
artikel
|
| 15 |
Run-to-run control and performance monitoring of overlay in semiconductor manufacturing
|
Bode, C.A.
|
|
2004
|
12 |
7 |
p. 893-900
8 p.
|
artikel
|
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