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                             82 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Adsorbate structure and vibrations on the Bi/Si(001)-(1 × 2) surface Lyman, P.F.
1996
221 1-4 p. 426-429
4 p.
artikel
2 Anomalous dispersion X-ray reflectometry for model-independent determination of Al/C multilayer structures Ohkawa, T.
1996
221 1-4 p. 416-419
4 p.
artikel
3 Aspects of the inverse scattering problem in neutron specular reflection Lipperheide, R.
1996
221 1-4 p. 514-519
6 p.
artikel
4 C60—amine adducts at the air—water interface: A new class of Langmuir monolayers Vaknin, David
1996
221 1-4 p. 152-158
7 p.
artikel
5 Characterization of interface roughness in W/Si multilayers by high resolution diffuse X-ray scattering Salditt, T.
1996
221 1-4 p. 13-17
5 p.
artikel
6 Characterization of Si/Ge interfaces by diffuse X-ray scattering in the region of total external reflection Schlomka, J.-P.
1996
221 1-4 p. 44-52
9 p.
artikel
7 Chiral melting of the Si(113) (3 × 1) reconstruction Abernathy, D.L.
1996
221 1-4 p. 126-133
8 p.
artikel
8 Comparative swelling of gels and polymer brush layers Karim, A.
1996
221 1-4 p. 331-336
6 p.
artikel
9 Conceptional design of a flexible neutron reflectometer at ‘SINQ’ Clemens, D.
1996
221 1-4 p. 507-513
7 p.
artikel
10 Correlation between non-collinear exchange coupling and interface structure in Fe/Cr(001) superlattices Schreyer, A.
1996
221 1-4 p. 366-369
4 p.
artikel
11 Cu island growth on Cu(110) Robinson, I.K.
1996
221 1-4 p. 70-76
7 p.
artikel
12 Diffraction of neutron standing waves in thin films Zhang, Huai
1996
221 1-4 p. 455-468
14 p.
artikel
13 Diffraction of neutron standing waves in thin films with resonance enhancement Zhang, Huai
1996
221 1-4 p. 450-454
5 p.
artikel
14 Dynamic scaling phenomena in growth processes Kardar, Mehran
1996
221 1-4 p. 60-64
5 p.
artikel
15 Effect of roughness correlations in multilayers on Bragg peaks in X-ray diffuse scattering Kaganer, V.M.
1996
221 1-4 p. 34-43
10 p.
artikel
16 Effects of mobile polymer concentration and chain length on the structure of tethered chains Lee, Lay-Theng
1996
221 1-4 p. 320-324
5 p.
artikel
17 Electron-density maps for the Si(1 1 1) 7 × 7 surface calculated with the maximum-entropy technique using X-ray and electron-diffraction data Carvalho, C.A.M.
1996
221 1-4 p. 469-486
18 p.
artikel
18 Epitaxial growth and lattice match of cobalt and nickel disilicides/Si(111) gold and cobalt doping of NiSi2 Gay, J.-M.
1996
221 1-4 p. 90-95
6 p.
artikel
19 Epitaxy at the organic—inorganic interface Fenter, P.
1996
221 1-4 p. 145-151
7 p.
artikel
20 Exact determination of the neutron reflection amplitude or phase Majkrzak, C.F.
1996
221 1-4 p. 520-523
4 p.
artikel
21 Faceting of stepped silicon (113) surfaces: Self assembly of nanoscale gratings Mochrie, S.G.J.
1996
221 1-4 p. 105-125
21 p.
artikel
22 Global minimization in reconstruction of the scattering-length density profile by X-ray reflectivity data Samoilenko, I.I.
1996
221 1-4 p. 542-546
5 p.
artikel
23 Grazing incidence X-ray diffraction study of the InAs/GaAs interface Rhan, H.
1996
221 1-4 p. 226-229
4 p.
artikel
24 Grazing-incidence X-ray magnetic scattering studies of UO2(0 0 1) surfaces Watson, G.M.
1996
221 1-4 p. 405-407
3 p.
artikel
25 Growth-induced interface roughness of GaAs/AlAs-layers studied by X-ray scattering under grazing angles Klemradt, U.
1996
221 1-4 p. 27-33
7 p.
artikel
26 Identification of an incommensurate FeAl2 overlayer on FeAl(110) using X-ray diffraction and reflectivity Baddorf, A.P.
1996
221 1-4 p. 141-144
4 p.
artikel
27 Increased thermal stability due to addition of Ge in B/Si(111) heterostructures Tweet, Douglas J.
1996
221 1-4 p. 218-225
8 p.
artikel
28 Influence of order in thin smectic polymer films on the structure at the surface Henn, G.
1996
221 1-4 p. 174-184
11 p.
artikel
29 In situ X-ray scattering study of the Pt(111)-solution interface: Ordered anion structures and their influence on copper underpotential deposition Lucas, C.A.
1996
221 1-4 p. 245-250
6 p.
artikel
30 Interface and overlayer structure of epitaxial CaF2 thin films on Si(111): An X-ray scattering study Huang, K.G.
1996
221 1-4 p. 192-200
9 p.
artikel
31 Interfacial roughness of partially correlated metallic multilayers studied by non-specular X-ray reflectivity Paniago, R.
1996
221 1-4 p. 10-12
3 p.
artikel
32 Interfacial scattering from surfactant monolayers in microemulsions Lee, D.D.
1996
221 1-4 p. 296-300
5 p.
artikel
33 Kerr effect in X-ray grazing incidence geometry Matveev, V.M.
1996
221 1-4 p. 408-410
3 p.
artikel
34 Long-range exchange interactions in epitaxial layered magnetic structures Grünberg, P.
1996
221 1-4 p. 357-365
9 p.
artikel
35 Magnetic and structural properties of Fe/Nb multilayers Rehm, Ch.
1996
221 1-4 p. 377-381
5 p.
artikel
36 Magnetic depth profile of Au/Fe/Ni trilayers Li, Yi
1996
221 1-4 p. 382-387
6 p.
artikel
37 Moments analysis of X-ray reflection profiles Rieutord, F.
1996
221 1-4 p. 538-541
4 p.
artikel
38 Neutron diffraction and reflectivity studies of the Cr Néel transition in Fe/Cr (001) superlattices Fullerton, Eric E.
1996
221 1-4 p. 370-376
7 p.
artikel
39 Neutron reflection studies of phase separation and transesterification in thin film polymer blends Wong, Apollo P.Y.
1996
221 1-4 p. 301-305
5 p.
artikel
40 Neutron reflectivity measurements of homopolymer interfaces reinforced with random copolymers Kulasekere, R.
1996
221 1-4 p. 306-308
3 p.
artikel
41 Neutron reflectivity measurements of titanium—beryllium multilayers Munter, Alan E.
1996
221 1-4 p. 500-506
7 p.
artikel
42 Neutron reflectivity of end grafted polymers in poor solvent: Kinetic effects Perahia, D.
1996
221 1-4 p. 337-341
5 p.
artikel
43 Neutron reflectivity study of structural changes in barium stearate Langmuir—Blodgett films during annealing Feigin, L.
1996
221 1-4 p. 185-191
7 p.
artikel
44 Neutron reflectometry study on an interface of octane and D2O at low surfactant (C10E4) concentration Jeng, U.
1996
221 1-4 p. 168-173
6 p.
artikel
45 Neutron scattering studies of magnetic thin films and multilayers Majkrzak, C.F.
1996
221 1-4 p. 342-356
15 p.
artikel
46 Observation of the Zeeman splitting for neutrons reflected by magnetic layers Felcher, G.P.
1996
221 1-4 p. 494-499
6 p.
artikel
47 Observation of two length scales above T N in a holmium thin film Gehring, P.M.
1996
221 1-4 p. 398-404
7 p.
artikel
48 Off-specular reflectivity study of sputter-deposition of platinum during growth You, H.
1996
221 1-4 p. 77-85
9 p.
artikel
49 On the reflectivity of polymers: Neutrons and X-rays Russell, T.P.
1996
221 1-4 p. 267-283
17 p.
artikel
50 Orientation dependence of homoepitaxy: An in situ X-ray scattering study of Ag Elliott, W.C.
1996
221 1-4 p. 65-69
5 p.
artikel
51 “Over the horizon” SANS: Measurements on near-surface Poiseuille shear-induced ordering of dilute solutions of threadlike micelles Hamilton, W.A.
1996
221 1-4 p. 309-319
11 p.
artikel
52 Phase effects in neutron reflection by microemulsions and polymers Reiss, G.
1996
221 1-4 p. 533-537
5 p.
artikel
53 Phase-sensitive multiple-diffraction studies of single crystals Kovalchuk, M.V.
1996
221 1-4 p. 445-449
5 p.
artikel
54 Polarized neutron reflectometry on metal evaporated videotapes van der Graaf, A.
1996
221 1-4 p. 393-397
5 p.
artikel
55 Polarized neutron reflectometry studies of magnetic oxidic Fe3O4/NiO and Fe3O4/CoO multilayers Ball, A.R.
1996
221 1-4 p. 388-392
5 p.
artikel
56 Probing interface roughness by X-ray scattering de Boer, Dick K.G.
1996
221 1-4 p. 18-26
9 p.
artikel
57 Resonant X-ray reflectivity study of Fe/Cr superlattices Bai, Jiaming
1996
221 1-4 p. 411-415
5 p.
artikel
58 Roughness of surfaces and interfaces Press, W.
1996
221 1-4 p. 1-9
9 p.
artikel
59 Specular and diffuse reflectivity from thin films containing misfit dislocations Miceli, P.F.
1996
221 1-4 p. 230-234
5 p.
artikel
60 Structure of oxide overlayer studied by energy dispersive X-ray diffraction Dmowski, W.
1996
221 1-4 p. 420-425
6 p.
artikel
61 Structure, translational state and morphology of the Ag/MgO(001) interface during its formation Guénard, P.
1996
221 1-4 p. 205-209
5 p.
artikel
62 Structure under confinement in a smectic-A and lyotropic surfactant hexagonal phase Idziak, Stefan H.J.
1996
221 1-4 p. 289-295
7 p.
artikel
63 Surface atomic ordering of Cu3Au (001) above T c Kimura, M.
1996
221 1-4 p. 101-104
4 p.
artikel
64 Surface freezing and surface-phase behaviors in binary mixtures of alkanes Wu, X.Z.
1996
221 1-4 p. 261-266
6 p.
artikel
65 Surface induced changes in the critical behavior of the β1—β2 phase transition in V2H Paniago, R.
1996
221 1-4 p. 210-214
5 p.
artikel
66 Surface X-ray diffraction on the potassium-induced reconstruction of the Ag(001) surface Meyerheim, H.L.
1996
221 1-4 p. 134-140
7 p.
artikel
67 The effect of shear on the adsorption of non-ionic surfactants at the liquid—solid interface Penfold, J.
1996
221 1-4 p. 325-330
6 p.
artikel
68 The growth and atomic structure of the Si(111)7 × 7—Pb buried interface Edwards, K.A.
1996
221 1-4 p. 201-204
4 p.
artikel
69 The growth of Sm on Mo(110) studied by surface X-ray diffraction Nicklin, C.L.
1996
221 1-4 p. 86-89
4 p.
artikel
70 Thermal vibration amplitudes and structure of Sb on Si(0 0 1) by X-ray standing waves Qian, Y.
1996
221 1-4 p. 430-436
7 p.
artikel
71 The simultaneous analysis of multi-contrast neutron and X-ray grazing incidence reflection data from amphiphilic layers Lee, Ellen M.
1996
221 1-4 p. 159-167
9 p.
artikel
72 The structure and phase behavior of electrodeposited halides on single-crystal metal surfaces Ocko, B.M.
1996
221 1-4 p. 238-244
7 p.
artikel
73 The use of X-ray standing waves and evanescent-wave emission to study buried strained-layer heterostructures Lee, T.-L.
1996
221 1-4 p. 437-444
8 p.
artikel
74 Thin polymer films on rough surfaces Tolan, M.
1996
221 1-4 p. 53-59
7 p.
artikel
75 Toward the solution of the inverse problem in neutron reflectometry de Haan, V.O.
1996
221 1-4 p. 524-532
9 p.
artikel
76 X-ray and neutron diffuse scattering from multilayers of fatty acid salt molecules Stömmer, R.
1996
221 1-4 p. 284-288
5 p.
artikel
77 X-ray diffraction in quantum-well structures Zolotoyabko, E.
1996
221 1-4 p. 487-493
7 p.
artikel
78 X-ray interface characterization of Ge δ layers on Si (001) Bahr, D.
1996
221 1-4 p. 96-100
5 p.
artikel
79 X-ray off-specular reflectivity studies of electrochemical pitting of Cu surfaces in sodium bicarbonate solution Feng, Y.P.
1996
221 1-4 p. 251-256
6 p.
artikel
80 X-ray reflectivity studies of the surface structure of liquid metals Magnussen, O.M.
1996
221 1-4 p. 257-260
4 p.
artikel
81 X-ray reflectivity study of thin film oxide superconductors Han, S.-W.
1996
221 1-4 p. 235-237
3 p.
artikel
82 X-ray synchrotron radiation study of rare-gas film growth Rieutord, F.
1996
221 1-4 p. 215-217
3 p.
artikel
                             82 gevonden resultaten
 
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