nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Angular dispersion of polar phonons in a hexagonal GaN–AlN superlattice
|
Gleize, J |
|
2001 |
82 |
1-3 |
p. 27-29 3 p. |
artikel |
2 |
Annealing behavior of Pd/GaN (0001) microstructure
|
Kim, C.C. |
|
2001 |
82 |
1-3 |
p. 105-107 3 p. |
artikel |
3 |
Author index
|
|
|
2001 |
82 |
1-3 |
p. 268-270 3 p. |
artikel |
4 |
Characterisation of nitride thin films by electron backscattered diffraction
|
Trager-Cowan, C |
|
2001 |
82 |
1-3 |
p. 19-21 3 p. |
artikel |
5 |
Characterization of GaN layers grown on porous silicon
|
Missaoui, A |
|
2001 |
82 |
1-3 |
p. 98-101 4 p. |
artikel |
6 |
Confined exciton-polariton modes in a thin, homo-epitaxial, GaN film grown by molecular beam epitaxy
|
Morel, Aurélien |
|
2001 |
82 |
1-3 |
p. 173-177 5 p. |
artikel |
7 |
Deep levels in MOCVD n-type hexagonal gallium nitride studied by high resolution deep level transient spectroscopy
|
Muret, P |
|
2001 |
82 |
1-3 |
p. 91-94 4 p. |
artikel |
8 |
Deep levels introduced in n-GaN grown by the ELOG technique by high-energy electron irradiation
|
Goodman, S.A |
|
2001 |
82 |
1-3 |
p. 95-97 3 p. |
artikel |
9 |
Defects in undoped and Mg-doped GaN and Al x Ga1−x N
|
Meyer, B.K |
|
2001 |
82 |
1-3 |
p. 77-81 5 p. |
artikel |
10 |
Density-of-states distribution in AlGaN obtained from transient photocurrent analysis
|
Niehus, M |
|
2001 |
82 |
1-3 |
p. 206-208 3 p. |
artikel |
11 |
Detailed deep trap analysis in Mg-doped p-type GaN layers grown by MOVPE
|
Witte, H |
|
2001 |
82 |
1-3 |
p. 85-87 3 p. |
artikel |
12 |
Donor binding energies in group III-nitride-based quantum wells: influence of internal electric fields
|
Morel, A |
|
2001 |
82 |
1-3 |
p. 221-223 3 p. |
artikel |
13 |
Effective carrier mass and mobility versus carrier concentration in p- and n-type α-GaN determined by infrared ellipsometry and Hall resistivity measurements
|
Kasic, A |
|
2001 |
82 |
1-3 |
p. 74-76 3 p. |
artikel |
14 |
Electron and hole dynamics in GaN
|
Ye, Hong |
|
2001 |
82 |
1-3 |
p. 131-133 3 p. |
artikel |
15 |
Electronic and vibrational properties of Mg- and O-related complexes in GaN
|
Fall, C.J |
|
2001 |
82 |
1-3 |
p. 88-90 3 p. |
artikel |
16 |
Epitaxial growth of GaN thin films on sapphire (0001) by pulsed laser deposition: influence of surface preparation and nitridation
|
Deiss, J.L |
|
2001 |
82 |
1-3 |
p. 68-70 3 p. |
artikel |
17 |
Etch end-point detection of GaN-based devices using optical emission spectroscopy
|
Kim, H.S. |
|
2001 |
82 |
1-3 |
p. 159-162 4 p. |
artikel |
18 |
Evaluation of SiC as a substrate material for nitride materials heteroepitaxy
|
Masri, P. |
|
2001 |
82 |
1-3 |
p. 53-55 3 p. |
artikel |
19 |
Femtosecond laser machining of gallium nitride
|
Kim, T |
|
2001 |
82 |
1-3 |
p. 262-264 3 p. |
artikel |
20 |
Formation of ohmic contacts to MOCVD grown p-GaN by controlled activation of Mg
|
Kaminska, E |
|
2001 |
82 |
1-3 |
p. 265-267 3 p. |
artikel |
21 |
Gallium droplet formation during MOVPE and thermal annealing of GaN
|
Karpov, S.Yu |
|
2001 |
82 |
1-3 |
p. 22-24 3 p. |
artikel |
22 |
GaN-based high-power laser diodes
|
Miyajima, Takao |
|
2001 |
82 |
1-3 |
p. 248-252 5 p. |
artikel |
23 |
GaN electronics for high power, high temperature applications
|
Pearton, S.J. |
|
2001 |
82 |
1-3 |
p. 227-231 5 p. |
artikel |
24 |
GaN layer structures with buried tungsten nitrides (WN x ) using epitaxial lateral overgrowth via MOVPE
|
Hiramatsu, K |
|
2001 |
82 |
1-3 |
p. 62-64 3 p. |
artikel |
25 |
Growth and characterisation of self-assembled cubic GaN quantum dots
|
Adelmann, C |
|
2001 |
82 |
1-3 |
p. 212-214 3 p. |
artikel |
26 |
Growth of c-GaN on Si(100)
|
Nishimura, S |
|
2001 |
82 |
1-3 |
p. 25-26 2 p. |
artikel |
27 |
High etching rate of GaN films by KrF excimer laser
|
Chu, Chen-Fu |
|
2001 |
82 |
1-3 |
p. 42-44 3 p. |
artikel |
28 |
High nitrogen pressure growth of GaN crystals and their applications for epitaxy of GaN — based structures
|
Grzegory, I |
|
2001 |
82 |
1-3 |
p. 30-34 5 p. |
artikel |
29 |
High rate etching of sapphire wafer using Cl2/BCl3/Ar inductively coupled plasmas
|
Sung, Y.J. |
|
2001 |
82 |
1-3 |
p. 50-52 3 p. |
artikel |
30 |
HREM study of basal stacking faults in GaN layers grown over sapphire substrate
|
Potin, V |
|
2001 |
82 |
1-3 |
p. 114-116 3 p. |
artikel |
31 |
Impact of MOCVD-GaN ‘templates’ on the spatial non-uniformities of strain and doping distribution in hydride vapour phase epitaxial GaN
|
Valcheva, E |
|
2001 |
82 |
1-3 |
p. 35-38 4 p. |
artikel |
32 |
Improvement of diodes performance with a multiple-pair buffer layer by MOCVD
|
Yang, Chien-Cheng |
|
2001 |
82 |
1-3 |
p. 253-255 3 p. |
artikel |
33 |
Improvement of electrical property and surface morphology of GaN grown by RF-plasma assisted molecular beam epitaxy by introduction of multiple AlN intermediate layer
|
Kikuchi, A |
|
2001 |
82 |
1-3 |
p. 12-15 4 p. |
artikel |
34 |
Influence of the partial pressure of GaCl3 in the growth process of GaN by HVPE under nitrogen
|
Aujol, E |
|
2001 |
82 |
1-3 |
p. 65-67 3 p. |
artikel |
35 |
InGaN/GaN quantum wells grown by molecular beam epitaxy emitting at 300 K in the whole visible spectrum
|
Damilano, B |
|
2001 |
82 |
1-3 |
p. 224-226 3 p. |
artikel |
36 |
Investigation of beryllium implanted P-type GaN
|
Yu, Chang-Chin |
|
2001 |
82 |
1-3 |
p. 82-84 3 p. |
artikel |
37 |
MBE growth of different hexagonal GaN crystal structures on vicinal (100) GaAs substrates
|
Georgakilas, A |
|
2001 |
82 |
1-3 |
p. 16-18 3 p. |
artikel |
38 |
Microstructure of GaN nucleation layer during initial stage MOCVD growth
|
Kim, C.C. |
|
2001 |
82 |
1-3 |
p. 108-110 3 p. |
artikel |
39 |
Modelling of absorption and emission spectra of In x Ga1−x N layers grown by MBE
|
Siozade, L |
|
2001 |
82 |
1-3 |
p. 71-73 3 p. |
artikel |
40 |
Molecular beam epitaxy growth and doping of III-nitrides on Si(111): layer morphology and doping efficiency
|
Calleja, E |
|
2001 |
82 |
1-3 |
p. 2-8 7 p. |
artikel |
41 |
Multiple atomic configurations of the a edge threading dislocation in GaN
|
Chen, J |
|
2001 |
82 |
1-3 |
p. 117-119 3 p. |
artikel |
42 |
New form of ordering in AlGaN
|
Ruterana, P |
|
2001 |
82 |
1-3 |
p. 203-205 3 p. |
artikel |
43 |
Nonlinear spectroscopy of homoepitaxial GaN
|
Schweitzer, C |
|
2001 |
82 |
1-3 |
p. 156-158 3 p. |
artikel |
44 |
Ohmic performance of ZnO and ITO/ZnO contacted with n-type GaN layer
|
Tang, Bang-Tai |
|
2001 |
82 |
1-3 |
p. 259-261 3 p. |
artikel |
45 |
Optical properties of boron nitride thin films deposited by microwave PECVD
|
Soltani, A |
|
2001 |
82 |
1-3 |
p. 170-172 3 p. |
artikel |
46 |
Optical properties of GaNAs/GaAs structures
|
Buyanova, I.A |
|
2001 |
82 |
1-3 |
p. 143-147 5 p. |
artikel |
47 |
Optical properties of self-assembled InGaN/GaN quantum dots
|
Taliercio, T |
|
2001 |
82 |
1-3 |
p. 151-155 5 p. |
artikel |
48 |
Optoelectronic characterization of blue InGaN/GaN LEDS grown by MBE
|
Dalmasso, S |
|
2001 |
82 |
1-3 |
p. 256-258 3 p. |
artikel |
49 |
Organisers and sponsors
|
|
|
2001 |
82 |
1-3 |
p. x- 1 p. |
artikel |
50 |
p and n type doping of cubic GaN on SiC (001)
|
Martinez-Guerrero, E |
|
2001 |
82 |
1-3 |
p. 59-61 3 p. |
artikel |
51 |
Patterned dielectric mirrors for lateral overgrowth of GaN-based lasers.
|
Kim, Taek |
|
2001 |
82 |
1-3 |
p. 245-247 3 p. |
artikel |
52 |
Patterning of GaN by ion implantation-dependent etching
|
Schiestel, S |
|
2001 |
82 |
1-3 |
p. 111-113 3 p. |
artikel |
53 |
Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by infrared ellipsometry and Raman spectroscopy
|
Schubert, M |
|
2001 |
82 |
1-3 |
p. 178-181 4 p. |
artikel |
54 |
Photoconductance measurements and Stokes shift in InGaN alloys
|
Reverchon, J.-L |
|
2001 |
82 |
1-3 |
p. 197-199 3 p. |
artikel |
55 |
Photoluminescence and absorption spectroscopy of silicon-doped InGaN layers
|
Schenk, H.P.D. |
|
2001 |
82 |
1-3 |
p. 163-166 4 p. |
artikel |
56 |
Photoluminescence of Ga-face AlGaN/GaN single heterostructures
|
Martı́nez-Criado, G |
|
2001 |
82 |
1-3 |
p. 200-202 3 p. |
artikel |
57 |
Photoluminescence study of GaN grown by pulsed laser deposition in nitrogen atmosphere
|
Mah, K.W |
|
2001 |
82 |
1-3 |
p. 128-130 3 p. |
artikel |
58 |
Photoreflectance investigations of GaN epitaxial layers
|
Sitarek, P |
|
2001 |
82 |
1-3 |
p. 209-211 3 p. |
artikel |
59 |
Preface
|
Hoffmann, Axel |
|
2001 |
82 |
1-3 |
p. 1- 1 p. |
artikel |
60 |
Processing-induced electron traps in n-type GaN
|
Auret, F.D. |
|
2001 |
82 |
1-3 |
p. 102-104 3 p. |
artikel |
61 |
Properties of GaAsN/GaAs quantum wells studied by optical detection of cyclotron resonance
|
Hai, P.N |
|
2001 |
82 |
1-3 |
p. 218-220 3 p. |
artikel |
62 |
Prospective investigations of orthorhombic ZnGeN2: synthesis, lattice dynamics and optical properties
|
Viennois, R |
|
2001 |
82 |
1-3 |
p. 45-49 5 p. |
artikel |
63 |
Pump and probe spectroscopy of InGaN multi quantum well based laser diodes
|
Kawakami, Y |
|
2001 |
82 |
1-3 |
p. 188-193 6 p. |
artikel |
64 |
Raman scattering study of gallium nitride heavily doped with manganese
|
Gębicki, W |
|
2001 |
82 |
1-3 |
p. 182-184 3 p. |
artikel |
65 |
Renormalization of the exciton parameters in piezoelectric nitride quantum structures: the effects of injection intensity and temperature
|
Bigenwald, P |
|
2001 |
82 |
1-3 |
p. 185-187 3 p. |
artikel |
66 |
Resonant Rayleigh scattering of exciton–polaritons in nitride-based multiple quantum wells
|
Malpuech, Guillaume |
|
2001 |
82 |
1-3 |
p. 134-136 3 p. |
artikel |
67 |
Short-channel effects in AlGAN/GaN HEMTs
|
Breitschädel, O |
|
2001 |
82 |
1-3 |
p. 238-240 3 p. |
artikel |
68 |
Size and shape effects in electromagnetic response of quantum dots and quantum dot arrays
|
Maksimenko, S.A |
|
2001 |
82 |
1-3 |
p. 215-217 3 p. |
artikel |
69 |
Structural quality and ordering of MBE grown Al x Ga1−x N-layers
|
Kirste, L |
|
2001 |
82 |
1-3 |
p. 9-11 3 p. |
artikel |
70 |
Subject index
|
|
|
2001 |
82 |
1-3 |
p. 271-277 7 p. |
artikel |
71 |
Surface morphology of GaN grown by molecular beam epitaxy
|
Vézian, S |
|
2001 |
82 |
1-3 |
p. 56-58 3 p. |
artikel |
72 |
Synthesis and characterization of the bulk crystalline carbon–nitride phase synthesised by high-pressure technique
|
Dymont, V.P |
|
2001 |
82 |
1-3 |
p. 39-41 3 p. |
artikel |
73 |
Synthesis, structure and optical properties of GaN nanocrystals prepared by sequential ion implantation in dielectrics
|
Borsella, E |
|
2001 |
82 |
1-3 |
p. 148-150 3 p. |
artikel |
74 |
Temperature dependent electroluminescence in GaN and InGaN/GaN LEDs
|
Lancefield, D |
|
2001 |
82 |
1-3 |
p. 241-244 4 p. |
artikel |
75 |
The atomic structure and properties of wurtzite GaN epitaxial layers
|
Ruterana, P. |
|
2001 |
82 |
1-3 |
p. 123-127 5 p. |
artikel |
76 |
The dependence of the optical energies on InGaN composition
|
O'Donnell, K.P |
|
2001 |
82 |
1-3 |
p. 194-196 3 p. |
artikel |
77 |
The preparation and characterisation of gallium nitride using the Hi-Prexx facility
|
Russell, D. |
|
2001 |
82 |
1-3 |
p. 120-122 3 p. |
artikel |
78 |
Time-resolved optical properties of GaN grown by metalorganic vapor phase epitaxy with indium surfactant
|
Pozina, G |
|
2001 |
82 |
1-3 |
p. 137-139 3 p. |
artikel |
79 |
Time-resolved spectroscopy of MBE-grown GaN/AlGaN hetero- and homo-epitaxial quantum wells
|
Gallart, M |
|
2001 |
82 |
1-3 |
p. 140-142 3 p. |
artikel |
80 |
Two-dimensional electron gas transport properties in AlGaN/GaN single- and double-heterostructure field effect transistors
|
Maeda, Narihiko |
|
2001 |
82 |
1-3 |
p. 232-237 6 p. |
artikel |
81 |
Vertical motional narrowing of exciton-polaritons in GaN based quantum wells
|
Malpuech, Guillaume |
|
2001 |
82 |
1-3 |
p. 167-169 3 p. |
artikel |