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                             35 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A comparative study of SiO2 deposited by PECVD and thermal method as passivation for multicrystalline silicon solar cells Panek, P.
2009
165 1-2 p. 64-66
3 p.
artikel
2 Al/Au ohmic contact to n-ZnO by dc sputtering Kim, J.H.
2009
165 1-2 p. 77-79
3 p.
artikel
3 A study on mobility degradation in nMOSFETs with HfO2 based gate oxide Hyvert, G.
2009
165 1-2 p. 129-131
3 p.
artikel
4 Carrier transport in SiC crystals and radiation detectors as affected by defect traps and inhomogeneities Kažukauskas, V.
2009
165 1-2 p. 34-37
4 p.
artikel
5 Comparison of different electrochemical deposits for contact metallization of silicon solar cells Boulord, C.
2009
165 1-2 p. 53-56
4 p.
artikel
6 Comprehensive study of InAs/GaAs quantum dots by means of complementary methods Kaczmarczyk, M.
2009
165 1-2 p. 98-102
5 p.
artikel
7 Controlling the size of InAs quantum dots on Si1−x Ge x /Si(001) by metalorganic vapor-phase epitaxy Kawaguchi, Kenichi
2009
165 1-2 p. 103-106
4 p.
artikel
8 Correlation between thickness and optical properties of thin diamond-like carbon films deposited with RF PACVD method Smietana, M.
2009
165 1-2 p. 132-134
3 p.
artikel
9 Dynamical behavior of methylchloride on GaAs(001) Ozeki, M.
2009
165 1-2 p. 107-110
4 p.
artikel
10 Editorial Board 2009
165 1-2 p. CO2-
1 p.
artikel
11 Elaboration and optical properties of type-II ZnTe on ZnSe heterostructures Najjar, Rita
2009
165 1-2 p. 85-87
3 p.
artikel
12 Elaboration of (111) oriented 3C–SiC/Si layers for template application in nitride epitaxy Zielinski, M.
2009
165 1-2 p. 9-14
6 p.
artikel
13 Electrical and structural characterization of InAs/InGaAs quantum dot structures on GaAs Rimada, J.C.
2009
165 1-2 p. 111-114
4 p.
artikel
14 Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements Sayad, Y.
2009
165 1-2 p. 67-70
4 p.
artikel
15 Electrical characterization of 6H-SiC grown by physical vapor transport method Zaremba, G.
2009
165 1-2 p. 23-27
5 p.
artikel
16 Highly sensitive determination of N+ doping level in 3C–SiC and GaN epilayers by Fourier transform infrared spectroscopy Portail, M.
2009
165 1-2 p. 42-46
5 p.
artikel
17 High temperature behaviour of AlGaN/AlN/GaN Hall-FET sensors Bouguen, L.
2009
165 1-2 p. 1-4
4 p.
artikel
18 InAs/GaAs quantum dots morphology: Nanometric scale HAADF simulations Araújo, D.
2009
165 1-2 p. 88-93
6 p.
artikel
19 Influence of Mg composition on the characteristics of MgZnO/ZnO heterostructures grown by co-sputtering Kim, Young Yi
2009
165 1-2 p. 80-84
5 p.
artikel
20 Lead iodide crystals prepared under stoichiometric and nonstoichiometric conditions Matuchova, M.
2009
165 1-2 p. 60-63
4 p.
artikel
21 LPE growth of InP layers from rare-earth treated melts for radiation detector structures Grym, J.
2009
165 1-2 p. 94-97
4 p.
artikel
22 MIS field effect transistor with barium titanate thin film as a gate insulator Firek, P.
2009
165 1-2 p. 126-128
3 p.
artikel
23 Monte Carlo simulation of bulk semiconductors for accurate calculation of drift velocity as a parameter for drift-diffusion, hydrodynamic models Donnarumma, Gesualdo
2009
165 1-2 p. 47-49
3 p.
artikel
24 Multiexcited state study in InAs DWELL structures Casas-Espinola, J.L.
2009
165 1-2 p. 115-117
3 p.
artikel
25 Novel construction of CdTe solar cell based on polyketanil structure Sibiński, Maciej
2009
165 1-2 p. 71-73
3 p.
artikel
26 Optical investigation of stacking faults in 4H–SiC epitaxial layers: Comparison of 3C and 8H polytypes Juillaguet, S.
2009
165 1-2 p. 5-8
4 p.
artikel
27 Optimization of Si interface control layer thickness for high-k GaAs metal–insulator–semiconductor structures Akazawa, Masamichi
2009
165 1-2 p. 122-125
4 p.
artikel
28 Polarity determination and control of SiC grown on Si Pezoldt, Jörg
2009
165 1-2 p. 28-33
6 p.
artikel
29 Polymer temperature sensor for textronic applications Bielska, Sylwia
2009
165 1-2 p. 50-52
3 p.
artikel
30 Power devices in Polish National Silicon Carbide Program Kubiak, A.
2009
165 1-2 p. 18-22
5 p.
artikel
31 Recent progress in 3.3kV SiC diodes Brosselard, P.
2009
165 1-2 p. 15-17
3 p.
artikel
32 Schottky diode parameters extraction using Lambert W function Jung, W.
2009
165 1-2 p. 57-59
3 p.
artikel
33 Structural analysis of CdS thin films obtained by multiple dips of oscillating chemical bath Gutiérrez Lazos, C.D.
2009
165 1-2 p. 74-76
3 p.
artikel
34 The RHEED tracking of the droplet epitaxial grown quantum dot and ring structures Nemcsics, Á.
2009
165 1-2 p. 118-121
4 p.
artikel
35 Thermal degradation of Au/Ni2Si/n-SiC ohmic contacts under different conditions Kuchuk, A.V.
2009
165 1-2 p. 38-41
4 p.
artikel
                             35 gevonden resultaten
 
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