nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A comparative study of SiO2 deposited by PECVD and thermal method as passivation for multicrystalline silicon solar cells
|
Panek, P. |
|
2009 |
165 |
1-2 |
p. 64-66 3 p. |
artikel |
2 |
Al/Au ohmic contact to n-ZnO by dc sputtering
|
Kim, J.H. |
|
2009 |
165 |
1-2 |
p. 77-79 3 p. |
artikel |
3 |
A study on mobility degradation in nMOSFETs with HfO2 based gate oxide
|
Hyvert, G. |
|
2009 |
165 |
1-2 |
p. 129-131 3 p. |
artikel |
4 |
Carrier transport in SiC crystals and radiation detectors as affected by defect traps and inhomogeneities
|
Kažukauskas, V. |
|
2009 |
165 |
1-2 |
p. 34-37 4 p. |
artikel |
5 |
Comparison of different electrochemical deposits for contact metallization of silicon solar cells
|
Boulord, C. |
|
2009 |
165 |
1-2 |
p. 53-56 4 p. |
artikel |
6 |
Comprehensive study of InAs/GaAs quantum dots by means of complementary methods
|
Kaczmarczyk, M. |
|
2009 |
165 |
1-2 |
p. 98-102 5 p. |
artikel |
7 |
Controlling the size of InAs quantum dots on Si1−x Ge x /Si(001) by metalorganic vapor-phase epitaxy
|
Kawaguchi, Kenichi |
|
2009 |
165 |
1-2 |
p. 103-106 4 p. |
artikel |
8 |
Correlation between thickness and optical properties of thin diamond-like carbon films deposited with RF PACVD method
|
Smietana, M. |
|
2009 |
165 |
1-2 |
p. 132-134 3 p. |
artikel |
9 |
Dynamical behavior of methylchloride on GaAs(001)
|
Ozeki, M. |
|
2009 |
165 |
1-2 |
p. 107-110 4 p. |
artikel |
10 |
Editorial Board
|
|
|
2009 |
165 |
1-2 |
p. CO2- 1 p. |
artikel |
11 |
Elaboration and optical properties of type-II ZnTe on ZnSe heterostructures
|
Najjar, Rita |
|
2009 |
165 |
1-2 |
p. 85-87 3 p. |
artikel |
12 |
Elaboration of (111) oriented 3C–SiC/Si layers for template application in nitride epitaxy
|
Zielinski, M. |
|
2009 |
165 |
1-2 |
p. 9-14 6 p. |
artikel |
13 |
Electrical and structural characterization of InAs/InGaAs quantum dot structures on GaAs
|
Rimada, J.C. |
|
2009 |
165 |
1-2 |
p. 111-114 4 p. |
artikel |
14 |
Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements
|
Sayad, Y. |
|
2009 |
165 |
1-2 |
p. 67-70 4 p. |
artikel |
15 |
Electrical characterization of 6H-SiC grown by physical vapor transport method
|
Zaremba, G. |
|
2009 |
165 |
1-2 |
p. 23-27 5 p. |
artikel |
16 |
Highly sensitive determination of N+ doping level in 3C–SiC and GaN epilayers by Fourier transform infrared spectroscopy
|
Portail, M. |
|
2009 |
165 |
1-2 |
p. 42-46 5 p. |
artikel |
17 |
High temperature behaviour of AlGaN/AlN/GaN Hall-FET sensors
|
Bouguen, L. |
|
2009 |
165 |
1-2 |
p. 1-4 4 p. |
artikel |
18 |
InAs/GaAs quantum dots morphology: Nanometric scale HAADF simulations
|
Araújo, D. |
|
2009 |
165 |
1-2 |
p. 88-93 6 p. |
artikel |
19 |
Influence of Mg composition on the characteristics of MgZnO/ZnO heterostructures grown by co-sputtering
|
Kim, Young Yi |
|
2009 |
165 |
1-2 |
p. 80-84 5 p. |
artikel |
20 |
Lead iodide crystals prepared under stoichiometric and nonstoichiometric conditions
|
Matuchova, M. |
|
2009 |
165 |
1-2 |
p. 60-63 4 p. |
artikel |
21 |
LPE growth of InP layers from rare-earth treated melts for radiation detector structures
|
Grym, J. |
|
2009 |
165 |
1-2 |
p. 94-97 4 p. |
artikel |
22 |
MIS field effect transistor with barium titanate thin film as a gate insulator
|
Firek, P. |
|
2009 |
165 |
1-2 |
p. 126-128 3 p. |
artikel |
23 |
Monte Carlo simulation of bulk semiconductors for accurate calculation of drift velocity as a parameter for drift-diffusion, hydrodynamic models
|
Donnarumma, Gesualdo |
|
2009 |
165 |
1-2 |
p. 47-49 3 p. |
artikel |
24 |
Multiexcited state study in InAs DWELL structures
|
Casas-Espinola, J.L. |
|
2009 |
165 |
1-2 |
p. 115-117 3 p. |
artikel |
25 |
Novel construction of CdTe solar cell based on polyketanil structure
|
Sibiński, Maciej |
|
2009 |
165 |
1-2 |
p. 71-73 3 p. |
artikel |
26 |
Optical investigation of stacking faults in 4H–SiC epitaxial layers: Comparison of 3C and 8H polytypes
|
Juillaguet, S. |
|
2009 |
165 |
1-2 |
p. 5-8 4 p. |
artikel |
27 |
Optimization of Si interface control layer thickness for high-k GaAs metal–insulator–semiconductor structures
|
Akazawa, Masamichi |
|
2009 |
165 |
1-2 |
p. 122-125 4 p. |
artikel |
28 |
Polarity determination and control of SiC grown on Si
|
Pezoldt, Jörg |
|
2009 |
165 |
1-2 |
p. 28-33 6 p. |
artikel |
29 |
Polymer temperature sensor for textronic applications
|
Bielska, Sylwia |
|
2009 |
165 |
1-2 |
p. 50-52 3 p. |
artikel |
30 |
Power devices in Polish National Silicon Carbide Program
|
Kubiak, A. |
|
2009 |
165 |
1-2 |
p. 18-22 5 p. |
artikel |
31 |
Recent progress in 3.3kV SiC diodes
|
Brosselard, P. |
|
2009 |
165 |
1-2 |
p. 15-17 3 p. |
artikel |
32 |
Schottky diode parameters extraction using Lambert W function
|
Jung, W. |
|
2009 |
165 |
1-2 |
p. 57-59 3 p. |
artikel |
33 |
Structural analysis of CdS thin films obtained by multiple dips of oscillating chemical bath
|
Gutiérrez Lazos, C.D. |
|
2009 |
165 |
1-2 |
p. 74-76 3 p. |
artikel |
34 |
The RHEED tracking of the droplet epitaxial grown quantum dot and ring structures
|
Nemcsics, Á. |
|
2009 |
165 |
1-2 |
p. 118-121 4 p. |
artikel |
35 |
Thermal degradation of Au/Ni2Si/n-SiC ohmic contacts under different conditions
|
Kuchuk, A.V. |
|
2009 |
165 |
1-2 |
p. 38-41 4 p. |
artikel |