nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A maximum information utilization approach in X-ray fluorescence analysis
|
Papp, T. |
|
2009 |
64 |
8 |
p. 761-770 10 p. |
artikel |
2 |
An X-ray refractive lens comprising two sections cut from a gramophone record for a portable total reflection X-ray fluorescence spectrometer
|
Kunimura, Shinsuke |
|
2009 |
64 |
8 |
p. 771-774 4 p. |
artikel |
3 |
Chemical effects on valence→L emissions of lanthanide compounds
|
Hayashi, Hisashi |
|
2009 |
64 |
8 |
p. 753-755 3 p. |
artikel |
4 |
Crystal optics for hard-X-ray spectroscopy of highly charged ions
|
Beyer, H.F. |
|
2009 |
64 |
8 |
p. 736-743 8 p. |
artikel |
5 |
Determination of carbon in natural freshwater biofilms with total reflection X-ray fluorescence spectrometry
|
Óvári, M. |
|
2009 |
64 |
8 |
p. 802-804 3 p. |
artikel |
6 |
Development of an X-ray detector using surface plasmon resonance
|
Kunieda, Y. |
|
2009 |
64 |
8 |
p. 744-746 3 p. |
artikel |
7 |
Development of soft X-ray multilayer laminar-type plane gratings and varied-line-spacing spherical grating for flat-field spectrograph in the 1–8 keV region
|
Koike, Masato |
|
2009 |
64 |
8 |
p. 756-760 5 p. |
artikel |
8 |
Editorial Board
|
|
|
2009 |
64 |
8 |
p. IFC- 1 p. |
artikel |
9 |
Enamels in stained glass windows: Preparation, chemical composition, microstructure and causes of deterioration
|
Schalm, O. |
|
2009 |
64 |
8 |
p. 812-820 9 p. |
artikel |
10 |
Hg diffusion in books of XVIII and XIX centuries by synchrotron microprobe
|
Pessanha, S. |
|
2009 |
64 |
8 |
p. 805-807 3 p. |
artikel |
11 |
High-sensitivity x-ray absorption fine structure investigation of arsenic shallow implant in silicon
|
Yamazaki, H. |
|
2009 |
64 |
8 |
p. 808-811 4 p. |
artikel |
12 |
ICXOM-19 special issue
|
|
|
2009 |
64 |
8 |
p. 727-728 2 p. |
artikel |
13 |
Possibilities and limitations of synchrotron X-ray powder diffraction with double crystal and double multilayer monochromators for microscopic speciation studies
|
De Nolf, Wout |
|
2009 |
64 |
8 |
p. 775-781 7 p. |
artikel |
14 |
Quality of electron probe X-ray microanalysis determinations obtained from laboratory reference materials of the coppery alloys and basaltic glasses
|
Pavlova, Liudmila A. |
|
2009 |
64 |
8 |
p. 782-787 6 p. |
artikel |
15 |
Recent trends of projection X-ray microscopy in Japan
|
Yada, K. |
|
2009 |
64 |
8 |
p. 729-735 7 p. |
artikel |
16 |
Spatially resolved micro-X-ray fluorescence and micro-X-ray absorption fine structure study of a fractured granite bore core following a radiotracer experiment
|
Denecke, Melissa A. |
|
2009 |
64 |
8 |
p. 791-795 5 p. |
artikel |
17 |
Stress analysis in tungsten and Si3N4 coated silicon wafers
|
Ogilvie, Robert E. |
|
2009 |
64 |
8 |
p. 788-790 3 p. |
artikel |
18 |
Tracking the pathway of diesel exhaust particles from the nose to the brain by X-ray florescence analysis
|
Matsui, Yasuto |
|
2009 |
64 |
8 |
p. 796-801 6 p. |
artikel |
19 |
X-ray waveguiding for micro- and nanofocusing
|
Dabagov, Sultan B. |
|
2009 |
64 |
8 |
p. 747-752 6 p. |
artikel |