| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A laser plasma X-ray source for the analysis of wafer surfaces by grazing emission X-ray fluorescence spectrometry
|
Schwenke, H.
|
|
2004
|
59 |
8 |
p. 1159-1164
6 p.
|
artikel
|
| 2 |
Analysis of organic substances and trace elements in aerosol samples using Fourier transform infra-red and total reflection X-ray fluorescence methods, initial experiments
|
Hallquist, Mattias
|
|
2004
|
59 |
8 |
p. 1193-1197
5 p.
|
artikel
|
| 3 |
A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis
|
Streli, C.
|
|
2004
|
59 |
8 |
p. 1199-1203
5 p.
|
artikel
|
| 4 |
A novel gas-filled detector for pulsed X-ray sources
|
Beaven, Peter A.
|
|
2004
|
59 |
8 |
p. 1329-1334
6 p.
|
artikel
|
| 5 |
Application of total reflection X-ray photoelectron spectroscopy to boron and phosphorus on Si wafer surface measurement
|
Iijima, Yoshitoki
|
|
2004
|
59 |
8 |
p. 1273-1276
4 p.
|
artikel
|
| 6 |
A simple and precise total reflection X-ray fluorescence spectrometer: construction and its applications
|
Tiwari, M.K.
|
|
2004
|
59 |
8 |
p. 1141-1147
7 p.
|
artikel
|
| 7 |
Biomonitoring of trace elements in Vietnamese freshwater mussels
|
Wagner, Annemarie
|
|
2004
|
59 |
8 |
p. 1125-1132
8 p.
|
artikel
|
| 8 |
Censoring: a new approach for detection limits in total-reflection X-ray fluorescence
|
Pajek, M.
|
|
2004
|
59 |
8 |
p. 1091-1099
9 p.
|
artikel
|
| 9 |
Characterization of high-k gate dielectric and metal gate electrode semiconductor samples with a total reflection X-ray fluorescence spectrometer
|
Sparks, Chris M.
|
|
2004
|
59 |
8 |
p. 1227-1234
8 p.
|
artikel
|
| 10 |
Characterization of urban air pollution by total reflection X-ray fluorescence
|
Schmeling, Martina
|
|
2004
|
59 |
8 |
p. 1165-1171
7 p.
|
artikel
|
| 11 |
Comparison of SiLi detector and silicon drift detector for the determination of low Z elements in total reflection X-ray fluorescence
|
Streli, C.
|
|
2004
|
59 |
8 |
p. 1211-1213
3 p.
|
artikel
|
| 12 |
Detection of unknown localized contamination on silicon wafer surface by sweeping-total reflection X-ray fluorescence analysis
|
Mori, Yoshihiro
|
|
2004
|
59 |
8 |
p. 1277-1282
6 p.
|
artikel
|
| 13 |
Development and applications of grazing exit micro X-ray fluorescence instrument using a polycapillary X-ray lens
|
Emoto, T.
|
|
2004
|
59 |
8 |
p. 1291-1294
4 p.
|
artikel
|
| 14 |
Direct analysis of biological samples by total reflection X-ray fluorescence
|
Marcó P., Lué M.
|
|
2004
|
59 |
8 |
p. 1077-1090
14 p.
|
artikel
|
| 15 |
Discovery of a new element ‘nipponium’: re-evaluation of pioneering works of Masataka Ogawa and his son Eijiro Ogawa
|
Yoshihara, H.K.
|
|
2004
|
59 |
8 |
p. 1305-1310
6 p.
|
artikel
|
| 16 |
Editorial Board
|
|
|
2004
|
59 |
8 |
p. IFC-
1 p.
|
artikel
|
| 17 |
Energy dispersive transmission X-ray scanning micro-imaging with an X-ray guide tube
|
Hosokawa, Yoshinori
|
|
2004
|
59 |
8 |
p. 1301-1304
4 p.
|
artikel
|
| 18 |
Evaluation of carbon films on the Japanese smoked roof tile “Ibushi-Kawara” by angle-dependent soft X-ray emission spectroscopy using synchrotron radiation
|
Muramatsu, Yasuji
|
|
2004
|
59 |
8 |
p. 1317-1322
6 p.
|
artikel
|
| 19 |
Grazing exit electron probe microanalysis of submicrometer precipitates in a copper base alloy
|
Awane, Tohru
|
|
2004
|
59 |
8 |
p. 1235-1241
7 p.
|
artikel
|
| 20 |
High intensity monocapillary X-ray guide tube with 10 micrometer spatial resolution for analytical X-ray microscope
|
Ohzawa, Sumito
|
|
2004
|
59 |
8 |
p. 1295-1299
5 p.
|
artikel
|
| 21 |
Nondestructive dose determination and depth profiling of arsenic ultrashallow junctions with total reflection X-ray fluorescence analysis compared to dynamic secondary ion mass spectrometry
|
Pepponi, G.
|
|
2004
|
59 |
8 |
p. 1243-1249
7 p.
|
artikel
|
| 22 |
Notes for Contributors
|
|
|
2004
|
59 |
8 |
p. I-II
nvt p.
|
artikel
|
| 23 |
Preface
|
Gohshi, Yohichi
|
|
2004
|
59 |
8 |
p. 1047-1048
2 p.
|
artikel
|
| 24 |
Preliminary classification of polymers by using total-reflection X-ray fluorescence spectra
|
Boeykens, Susana
|
|
2004
|
59 |
8 |
p. 1189-1192
4 p.
|
artikel
|
| 25 |
Progress of microfocus X-ray systems for fluoroscopic and computed tomography
|
Hirakimoto, Akira
|
|
2004
|
59 |
8 |
p. 1101-1106
6 p.
|
artikel
|
| 26 |
Semiconductor applications of nanoliter droplet methodology with total reflection x-ray fluorescence analysis
|
Miller, Thomasin C.
|
|
2004
|
59 |
8 |
p. 1117-1124
8 p.
|
artikel
|
| 27 |
Study on deposition kinetics of high-K materials by X-ray fluorescence techniques
|
Carpanese, Caterina
|
|
2004
|
59 |
8 |
p. 1183-1187
5 p.
|
artikel
|
| 28 |
Surface analysis of thin stainless steel films and thick-coated steel by simultaneous application of conversion electron and X-ray Mössbauer spectroscopy
|
Nomura, K.
|
|
2004
|
59 |
8 |
p. 1259-1264
6 p.
|
artikel
|
| 29 |
The capabilities of total reflection X-ray fluorescence in the polymeric analytical field
|
Vázquez, Cristina
|
|
2004
|
59 |
8 |
p. 1215-1219
5 p.
|
artikel
|
| 30 |
The experimental background and the model description for the waveguide-resonance propagation of X-ray radiation through a planar narrow extended slit
|
Egorov, V.K.
|
|
2004
|
59 |
8 |
p. 1049-1069
21 p.
|
artikel
|
| 31 |
Theory of X-ray absorption and emission spectra
|
Mukoyama, Takeshi
|
|
2004
|
59 |
8 |
p. 1107-1115
9 p.
|
artikel
|
| 32 |
The use of a portable total reflection X-ray fluorescence spectrometer for trace element determination in freshwater microcrustaceans (Daphnia)
|
Mages, Margarete
|
|
2004
|
59 |
8 |
p. 1265-1272
8 p.
|
artikel
|
| 33 |
Total-reflection X-ray absorption fine structure on liquid surface
|
Tanida, Hajime
|
|
2004
|
59 |
8 |
p. 1071-1076
6 p.
|
artikel
|
| 34 |
Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution
|
Pepponi, G.
|
|
2004
|
59 |
8 |
p. 1205-1209
5 p.
|
artikel
|
| 35 |
Total reflection X-ray fluorescence spectrometric determination of element inlets from mining activities at the upper Tisza catchment area, Hungary
|
Óvári, M.
|
|
2004
|
59 |
8 |
p. 1173-1181
9 p.
|
artikel
|
| 36 |
Total-reflection X-ray fluorescence studies of trace elements in biomedical samples
|
Kubala-Kukuś, A.
|
|
2004
|
59 |
8 |
p. 1283-1289
7 p.
|
artikel
|
| 37 |
Trace elements distribution and post-mortem intake in human bones from Middle Age by total reflection X-ray fluorescence
|
Carvalho, M.L.
|
|
2004
|
59 |
8 |
p. 1251-1257
7 p.
|
artikel
|
| 38 |
Validation of vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis of silicon wafers
|
Hellin, D.
|
|
2004
|
59 |
8 |
p. 1149-1157
9 p.
|
artikel
|
| 39 |
Wavelength dispersive grazing incidence X-ray fluorescence of multilayer thin films
|
Awaji, Naoki
|
|
2004
|
59 |
8 |
p. 1133-1139
7 p.
|
artikel
|
| 40 |
X-ray absorption near edge spectroscopy from reflection x-ray absorption fine structure under the grazing incidence conditions
|
Tani, Katsuhiko
|
|
2004
|
59 |
8 |
p. 1221-1225
5 p.
|
artikel
|
| 41 |
X-ray analysis of a single aerosol particle with combination of scanning electron microscope and synchrotron radiation X-ray microscope
|
Toyoda, Masatoshi
|
|
2004
|
59 |
8 |
p. 1311-1315
5 p.
|
artikel
|
| 42 |
X-ray fluorescence analysis of heavy elements with a portable synchrotron
|
Yamada, Hironari
|
|
2004
|
59 |
8 |
p. 1323-1328
6 p.
|
artikel
|
Tijdschrift beschrijving