nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A discussion about the significance of absorbance and sample optical thickness in conventional absorption spectrometry and wavelength modulated laser absorption spectrometry: an alternative view
|
Harnly, J.M. |
|
2004 |
59 |
3 |
p. 389-390 2 p. |
artikel |
2 |
Analytical model for the bremsstrahlung spectrum in the 0.25–20 keV photon energy range
|
Castellano, Gustavo |
|
2004 |
59 |
3 |
p. 313-319 7 p. |
artikel |
3 |
Authors’ reply
|
Axner, Ove |
|
2004 |
59 |
3 |
p. 390-392 3 p. |
artikel |
4 |
Demountable direct injection high efficiency nebulizer for inductively coupled plasma mass spectrometry
|
Westphal, Craig S. |
|
2004 |
59 |
3 |
p. 353-368 16 p. |
artikel |
5 |
Detection of bromine in thermoplasts from consumer electronics by laser-induced plasma spectroscopy
|
Radivojevic, I. |
|
2004 |
59 |
3 |
p. 335-343 9 p. |
artikel |
6 |
Editorial Board
|
|
|
2004 |
59 |
3 |
p. IFC- 1 p. |
artikel |
7 |
Laser-induced plasma expansion: theoretical and experimental aspects
|
Capitelli, M. |
|
2004 |
59 |
3 |
p. 271-289 19 p. |
artikel |
8 |
Matrix effect on emission/current correlated analysis in laser-induced breakdown spectroscopy of liquid droplets
|
Huang, Jer-Shing |
|
2004 |
59 |
3 |
p. 321-326 6 p. |
artikel |
9 |
Notes for Contributors
|
|
|
2004 |
59 |
3 |
p. I-II nvt p. |
artikel |
10 |
Relativistic component of chemical shift of Uranium X-ray emission lines
|
Batrakov, Yuri F |
|
2004 |
59 |
3 |
p. 345-351 7 p. |
artikel |
11 |
Scanning vs. single spot laser ablation (λ=213 nm) inductively coupled plasma mass spectrometry
|
González, Jhanis J. |
|
2004 |
59 |
3 |
p. 369-374 6 p. |
artikel |
12 |
Spatial profiling of analyte signal intensities in inductively coupled plasma mass spectrometry
|
Holliday, Alison E. |
|
2004 |
59 |
3 |
p. 291-311 21 p. |
artikel |
13 |
Temporal analysis of laser-induced plasma properties as related to laser-induced breakdown spectroscopy
|
Hohreiter, V. |
|
2004 |
59 |
3 |
p. 327-333 7 p. |
artikel |
14 |
TOF plotter—a program to perform routine analysis time-of-flight mass spectral data
|
Knippel, Brad C. |
|
2004 |
59 |
3 |
p. 375-387 13 p. |
artikel |