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                             21 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A comparative analysis of five chrome green pigments based on different spectroscopic techniques Desnica, V.
2003
58 4 p. 681-687
7 p.
artikel
2 Adulterations in first century bc: the case of Greek silver drachmae analyzed by X-ray methods Constantinescu, Bogdan
2003
58 4 p. 759-765
7 p.
artikel
3 A flexible and accurate quantification algorithm for electron probe X-ray microanalysis based on thin-film element yields Schalm, O.
2003
58 4 p. 669-680
12 p.
artikel
4 Analysis of alkali-silicate glasses by electron probe analysis Jurek, Karel
2003
58 4 p. 741-744
4 p.
artikel
5 A study of internal oxidation in carburized steels by glow discharge optical emission spectroscopy and scanning electron microscopy An, X.
2003
58 4 p. 689-698
10 p.
artikel
6 Change in silica sources in Roman and post-Roman glass Aerts, A.
2003
58 4 p. 659-667
9 p.
artikel
7 Characterization of the main causes of deterioration of grisaille paint layers in 19th century stained-glass windows by J.-B. Capronnier Schalm, O.
2003
58 4 p. 589-607
19 p.
artikel
8 Comparative study of trace element contents in human full-term placenta and fetal membranes by total reflection X-ray fluorescence Kubala-Kukuś, A.
2003
58 4 p. 725-734
10 p.
artikel
9 Comparison between major and trace element concentrations in garnet performed by EPMA and micro-PIXE techniques Vaggelli, G.
2003
58 4 p. 699-709
11 p.
artikel
10 Concentration distribution of trace elements: from normal distribution to Lévy flights Kubala-Kukuś, A.
2003
58 4 p. 717-724
8 p.
artikel
11 Depth selective chemical state analysis of Pb and S in fly ash in municipal solid waste incinerators using X-ray absorption spectroscopy Kawai, Jun
2003
58 4 p. 635-639
5 p.
artikel
12 Editorial Board 2003
58 4 p. IFC-
1 p.
artikel
13 Formation of binary and ternary metal deposits on glass–ceramic carbon electrode surfaces: electron-probe X-ray microanalysis, total-reflection X-ray fluorescence analysis, X-ray photoelectron spectroscopy and scanning electron microscopy study Alov, Nikolai V.
2003
58 4 p. 735-740
6 p.
artikel
14 Grazing-angle incidence X-ray diffraction by Si1−α(x)Geα(x) thin layer if the composition coefficient α(x) is varying harmonically along the flat entrance surface Bezirganyan Jr., P.A.
2003
58 4 p. 745-757
13 p.
artikel
15 Historical pigments: a collection analyzed with X-ray diffraction analysis and X-ray fluorescence analysis in order to create a database Hochleitner, B.
2003
58 4 p. 641-649
9 p.
artikel
16 Investigation of high-resolution superconducting tunnel junction detectors for low-energy X-ray fluorescence analysis Beckhoff, B.
2003
58 4 p. 615-626
12 p.
artikel
17 Large area quantitative X-ray mapping of (U,Pu)O2 nuclear fuel pellets using wavelength dispersive electron probe microanalysis Brémier, S.
2003
58 4 p. 651-658
8 p.
artikel
18 Preface Mantler, Michael
2003
58 4 p. 585-587
3 p.
artikel
19 Quantification procedures in micro X-ray fluorescence analysis Kanngießer, Birgit
2003
58 4 p. 609-614
6 p.
artikel
20 Results of quantitative analysis of Celtic glass artefacts by energy dispersive X-ray fluorescence spectrometry Jokubonis, C.
2003
58 4 p. 627-633
7 p.
artikel
21 The identification of soft X-ray lines Aßmann, Andrea
2003
58 4 p. 711-716
6 p.
artikel
                             21 gevonden resultaten
 
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