| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A formula for the background in TXRF as a function of the incidence angle and substrate material
|
Knoth, J.
|
|
1999
|
54 |
10 |
p. 1513-1515
3 p.
|
artikel
|
| 2 |
Analysis of human blood serum and human brain samples by total reflection X-ray fluorescence spectrometry applying Compton peak standardization
|
Marcó, L.M.
|
|
1999
|
54 |
10 |
p. 1469-1480
12 p.
|
artikel
|
| 3 |
An electrochemical enrichment procedure for the determination of heavy metals by total-reflection X-ray fluorescence spectroscopy
|
Ritschel, A
|
|
1999
|
54 |
10 |
p. 1449-1454
6 p.
|
artikel
|
| 4 |
A new method for depth-profiling of shallow layers in silicon wafers by repeated chemical etching and total-reflection X-ray fluorescence analysis
|
Klockenkämper, R
|
|
1999
|
54 |
10 |
p. 1385-1392
8 p.
|
artikel
|
| 5 |
Application of total reflection X-ray fluorescence in angle scan mode to establish the location of arsenic contamination in silicon and silicon oxide, respectively
|
Rink, Ingrid
|
|
1999
|
54 |
10 |
p. 1427-1431
5 p.
|
artikel
|
| 6 |
Application of vapor phase decomposition/total reflection X-ray fluorescence in the silicon semiconductor manufacturing environment
|
Buhrer, Gayle
|
|
1999
|
54 |
10 |
p. 1399-1407
9 p.
|
artikel
|
| 7 |
Determination of copper, iron and zinc in spirituous beverages by total reflection X-ray fluorescence spectrometry
|
Capote, T
|
|
1999
|
54 |
10 |
p. 1463-1468
6 p.
|
artikel
|
| 8 |
Determination of silicon in organic matrices with grazing-emission X-ray fluorescence spectrometry
|
Claes, M.
|
|
1999
|
54 |
10 |
p. 1517-1524
8 p.
|
artikel
|
| 9 |
Enhanced analysis of particles and vapor phase decomposition droplets by total-reflection X-ray fluorescence
|
Funahashi, M
|
|
1999
|
54 |
10 |
p. 1409-1426
18 p.
|
artikel
|
| 10 |
Future in-fab applications of total reflection X-ray fluorescence spectrometry for the semiconductor industry
|
Iltgen, K.
|
|
1999
|
54 |
10 |
p. 1393-1398
6 p.
|
artikel
|
| 11 |
Grazing incidence X-ray photoemission spectroscopy of SiO2 on Si
|
Jach, Terrence
|
|
1999
|
54 |
10 |
p. 1539-1544
6 p.
|
artikel
|
| 12 |
Investigation of effects of cadmium, lead, nickel and vanadium contamination on the uptake and transport processes in cucumber plants by TXRF spectrometry
|
Varga, Anita
|
|
1999
|
54 |
10 |
p. 1455-1462
8 p.
|
artikel
|
| 13 |
Low Z total reflection X-ray fluorescence analysis — challenges and answers
|
Streli, C.
|
|
1999
|
54 |
10 |
p. 1433-1441
9 p.
|
artikel
|
| 14 |
Measurement of trace element concentration in a metal matrix using total reflection X-ray fluorescence spectrometry
|
van Aarle, J.
|
|
1999
|
54 |
10 |
p. 1443-1447
5 p.
|
artikel
|
| 15 |
Optimization of TXRF measurements by variable incident angles
|
Prange, A
|
|
1999
|
54 |
10 |
p. 1505-1511
7 p.
|
artikel
|
| 16 |
Quantification in grazing-emission X-ray fluorescence spectrometry
|
Spolnik, Z.M.
|
|
1999
|
54 |
10 |
p. 1525-1537
13 p.
|
artikel
|
| 17 |
7th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
|
Wobrauschek, Peter
|
|
1999
|
54 |
10 |
p. 1383-1384
2 p.
|
artikel
|
| 18 |
The application of resonantly enhanced X-ray standing waves in fluorescence and waveguide experiments
|
Jark, W.
|
|
1999
|
54 |
10 |
p. 1487-1495
9 p.
|
artikel
|
| 19 |
The use of total-reflection X-ray fluorescence to track the metabolism and excretion of selenium in humans
|
Bellisola, G.
|
|
1999
|
54 |
10 |
p. 1481-1485
5 p.
|
artikel
|
| 20 |
Total-reflection X-ray fluorescence imaging
|
Sakurai, Kenji
|
|
1999
|
54 |
10 |
p. 1497-1503
7 p.
|
artikel
|
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