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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
2 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | A compendium and critical review of neutral atom resonance line oscillator strengths for atomic absorption analysis |
Doidge, P.S. |
1995 |
50 | 3 |
p. 209-263 55 p. |
article |
|
| 2 | Depth profiling by means of the combination of glancing incidence X-ray fluorescence spectrometry with low energy ion beam etching technique |
Frank, W. |
1995 |
50 | 3 |
p. 265-270 6 p. |
article |
2 results found