| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A new X-ray tube for efficient excitation of low-Z-elements with total reflection X-ray fluorescence analysis
|
Streli, Christina
|
|
1991
|
46 |
10 |
p. 1351-1359
9 p.
|
artikel
|
| 2 |
A total reflection X-ray fluorescence spectrometer with monochromatic excitation
|
Schuster, M.
|
|
1991
|
46 |
10 |
p. 1341-1349
9 p.
|
artikel
|
| 3 |
Determination of the heavy-metal ion-dose after implantation in silicon-wafers by total reflection X-ray fluorescence analysis
|
Klockenkämper, R.
|
|
1991
|
46 |
10 |
p. 1379-1383
5 p.
|
artikel
|
| 4 |
Determination of trace element impurities in ultrapure reagents by total reflection X-ray spectrometry
|
Prange, Andreas
|
|
1991
|
46 |
10 |
p. 1385-1393
9 p.
|
artikel
|
| 5 |
Determination of trace elements in oils and greases with total reflection X-ray fluorescence: sample preparation methods
|
Reus, U.
|
|
1991
|
46 |
10 |
p. 1403-1411
9 p.
|
artikel
|
| 6 |
Direct determination of lead in whole human blood by total reflection X-ray fluorescence spectrometry
|
Ayala, R.E.
|
|
1991
|
46 |
10 |
p. 1429-1432
4 p.
|
artikel
|
| 7 |
Editorials: software survey section
|
|
|
1991
|
46 |
10 |
p. i-iii
nvt p.
|
artikel
|
| 8 |
Fundamentals of total reflection X-ray fluorescence
|
Kregsamer, Peter
|
|
1991
|
46 |
10 |
p. 1332-1340
9 p.
|
artikel
|
| 9 |
Historical development and principles of total reflection X-ray fluorescence analysis (TXRF)
|
Aiginger, Hannes
|
|
1991
|
46 |
10 |
p. 1313-1321
9 p.
|
artikel
|
| 10 |
Multielement determination in sediments from the German Wadden Sea—investigations on sample preparation techniques
|
Koopmann, Christiane
|
|
1991
|
46 |
10 |
p. 1395-1402
8 p.
|
artikel
|
| 11 |
Multielement speciation in vegetable foodstuffs by gel permeation chromatography (GPC) and total reflection X-ray fluorescence (TXRF)
|
Günther, Klaus
|
|
1991
|
46 |
10 |
p. 1413-1419
7 p.
|
artikel
|
| 12 |
Total reflection X-ray fluorescence analysis of the rare earth elements by K-shell excitation
|
Kregsamer, Peter
|
|
1991
|
46 |
10 |
p. 1361-1367
7 p.
|
artikel
|
| 13 |
Total reflection X-ray fluorescence analysis using an extended focus tube for the determination of dissolved elements in rain water
|
Muia, L.M.
|
|
1991
|
46 |
10 |
p. 1421-1427
7 p.
|
artikel
|
| 14 |
Total reflection X-ray fluorescence of single and multiple thin-layer samples
|
De Boer, D.K.G.
|
|
1991
|
46 |
10 |
p. 1323-1331
9 p.
|
artikel
|
| 15 |
Ultra-trace analysis of metallic contaminations on silicon wafer surfaces by vapour phase decomposition/total reflection X-ray fluorescence (VPD/TXRF)
|
Neumann, C.
|
|
1991
|
46 |
10 |
p. 1369-1377
9 p.
|
artikel
|
| 16 |
X-ray Standing Waves and the critical sample thickness for Total-reflection
|
de Boer, D.K.G.
|
|
1991
|
46 |
10 |
p. 1433-1436
4 p.
|
artikel
|
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