| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comparison of atom and ion induced SSIMS—Evidence for a charge induced damage effect in insulator materials
|
Brown, A.
|
|
1985
|
40 |
5-6 |
p. 871-877
7 p.
|
artikel
|
| 2 |
Adsorption of a simulated epoxy resin fragment: IETS and matrix isolation i.r. study of an adduct of n-propylamine and 1,2-epoxy butane
|
Brown, N.M.D.
|
|
1985
|
40 |
5-6 |
p. 847-851
5 p.
|
artikel
|
| 3 |
Analysis and chemical imaging of polymer surfaces by secondary ion mass spectroscopy
|
Briggs, D.
|
|
1985
|
40 |
5-6 |
p. 707-715
9 p.
|
artikel
|
| 4 |
Aspects of multidetector use in multitechnique surface analysis instrumentation
|
Drummond, I.W.
|
|
1985
|
40 |
5-6 |
p. 773-779
7 p.
|
artikel
|
| 5 |
Characterization of structural features in thin layers of GaAs, Al(x)Ga(1-x)As and AlAs by means of structure factor imaging and high resolution electron microscopy
|
Viegers, M.P.A.
|
|
1985
|
40 |
5-6 |
p. 835-845
11 p.
|
artikel
|
| 6 |
Combined high-resolution scanning Auger spectroscopy and energy dispersive X-ray analysis of soil samples
|
Bisdom, E.B.A.
|
|
1985
|
40 |
5-6 |
p. 879-884
6 p.
|
artikel
|
| 7 |
Determination of concentration depth profiles by spark source mass spectroscopy
|
Swenters, K.
|
|
1985
|
40 |
5-6 |
p. 769-772
4 p.
|
artikel
|
| 8 |
Editorial
|
Werner, H.W.
|
|
1985
|
40 |
5-6 |
p. 705-
1 p.
|
artikel
|
| 9 |
Four classes of selected area XPS (SAXPS): an examination of methodology and comparison with other techniques
|
Drummond, I.W.
|
|
1985
|
40 |
5-6 |
p. 801-810
10 p.
|
artikel
|
| 10 |
Hydrogen analysis in silicon and silicon nitride layers
|
Vandervorst, W.B.
|
|
1985
|
40 |
5-6 |
p. 781-785
5 p.
|
artikel
|
| 11 |
Laser microprobe mass analysis (LAMMA) of organo-silane coated chrysotile fibre surfaces
|
de Waele, J.K.
|
|
1985
|
40 |
5-6 |
p. 795-800
6 p.
|
artikel
|
| 12 |
Metal/oxide interface studies
|
Wild, R.K.
|
|
1985
|
40 |
5-6 |
p. 827-834
8 p.
|
artikel
|
| 13 |
Preface
|
|
|
1985
|
40 |
5-6 |
p. 706-
1 p.
|
artikel
|
| 14 |
Radiation damage during micro-PIXE measurements on biological materials
|
Lenglet, W.J.M.
|
|
1985
|
40 |
5-6 |
p. 763-767
5 p.
|
artikel
|
| 15 |
Radiation damage during surface analysis
|
Storp, S.
|
|
1985
|
40 |
5-6 |
p. 745-756
12 p.
|
artikel
|
| 16 |
Scanning Auger investigations of embrittlement phenomena in Cr-Ni and Cr-Mo steels
|
Goretzki, H.
|
|
1985
|
40 |
5-6 |
p. 853-858
6 p.
|
artikel
|
| 17 |
Soft X-ray spectroscopy for surface studies: surface hydrolysis and radiation decomposition of some boron compounds
|
Arber, J.M.
|
|
1985
|
40 |
5-6 |
p. 757-762
6 p.
|
artikel
|
| 18 |
Surface adsorption behaviour of amosite asbestos fibres as studied by SIMS and LAMMA
|
Verlinden, J.A.
|
|
1985
|
40 |
5-6 |
p. 859-864
6 p.
|
artikel
|
| 19 |
Temperature effects in sputter depth profile resolution
|
Seah, M.P.
|
|
1985
|
40 |
5-6 |
p. 811-816
6 p.
|
artikel
|
| 20 |
The application of liquid metal ion sources to ion-microprobe secondary ion mass spectroscopy
|
Bayly, A.R.
|
|
1985
|
40 |
5-6 |
p. 717-723
7 p.
|
artikel
|
| 21 |
Theoretical analysis of sputter profiling
|
Remmerie, J.
|
|
1985
|
40 |
5-6 |
p. 787-793
7 p.
|
artikel
|
| 22 |
The use of X-ray photoelectron take-off-angle experiments in the study of Langmuir-Blodgett films
|
Hazell, L.B.
|
|
1985
|
40 |
5-6 |
p. 739-744
6 p.
|
artikel
|
| 23 |
Thin film analysis of conversion layers on aluminium
|
Puderbach, H.
|
|
1985
|
40 |
5-6 |
p. 817-825
9 p.
|
artikel
|
| 24 |
Transient Auger analysis of silicon nitride
|
Remmerie, J.
|
|
1985
|
40 |
5-6 |
p. 865-870
6 p.
|
artikel
|
| 25 |
X-ray photoelectron spectroscopy study of the interaction of alcohols with oxide surfaces
|
Tobin, J.
|
|
1985
|
40 |
5-6 |
p. 725-737
13 p.
|
artikel
|
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