| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An evaluation of ion-atom emission intensity ratios and local thermodynamic equilibrium in an argon inductively coupled plasma
|
Caughlin, B.L.
|
|
1984
|
39 |
12 |
p. 1583-1602
20 p.
|
artikel
|
| 2 |
An iterative procedure for the correction of secondary fluorescence effects in electron-probe microanalysis near phase boundaries
|
Bastin, G.F.
|
|
1984
|
39 |
12 |
p. 1517-1522
6 p.
|
artikel
|
| 3 |
Anwendungsbeispiele der Raman mikroanalyse
|
Boyer, H.
|
|
1984
|
39 |
12 |
p. 1527-1532
6 p.
|
artikel
|
| 4 |
Calibration and curve fitting for extended range AAS
|
Miller-Ihli, N.J.
|
|
1984
|
39 |
12 |
p. 1603-1614
12 p.
|
artikel
|
| 5 |
Characterization of phosphate conversion layers by combined Auger electron spectroscopy and X-ray microanalysis
|
van Ooij, W.J.
|
|
1984
|
39 |
12 |
p. 1541-1545
5 p.
|
artikel
|
| 6 |
Determination of the hydrogen concentration in silicon nitride films with the resonant nuclear reaction 1H(15N, αγ)12C
|
Evers, E.J.
|
|
1984
|
39 |
12 |
p. 1553-1556
4 p.
|
artikel
|
| 7 |
Diffusion of beryllium in copper as determined by ion and spark probe mass spectrometry
|
Swenters, K.
|
|
1984
|
39 |
12 |
p. 1577-1578
2 p.
|
artikel
|
| 8 |
Editorial
|
Werner, H.W.
|
|
1984
|
39 |
12 |
p. 1503-1504
2 p.
|
artikel
|
| 9 |
Editorial: Software survey section
|
|
|
1984
|
39 |
12 |
p. I-III
nvt p.
|
artikel
|
| 10 |
Einfuehrung zur Raman Mikroanalyse
|
Boyer, H.
|
|
1984
|
39 |
12 |
p. 1523-1525
3 p.
|
artikel
|
| 11 |
Investigation on anodized aluminium
|
Puderbach, Herbert
|
|
1984
|
39 |
12 |
p. 1547-1551
5 p.
|
artikel
|
| 12 |
Laser mass spectroscopy
|
van Doveren, H.
|
|
1984
|
39 |
12 |
p. 1513-1516
4 p.
|
artikel
|
| 13 |
Measurements on thin sections of soils with the Eindhoven proton microprobe
|
Prins, M.
|
|
1984
|
39 |
12 |
p. 1557-1561
5 p.
|
artikel
|
| 14 |
Modification in the surface composition of sparked aluminium electrodes and its relation to relative sensitivity factors in spark-source mass spectrometry
|
Verlinden, J.
|
|
1984
|
39 |
12 |
p. 1573-1575
3 p.
|
artikel
|
| 15 |
Phase analysis of surface layers by Mössbauer spectroscopy
|
Meisel, W.
|
|
1984
|
39 |
12 |
p. 1505-1511
7 p.
|
artikel
|
| 16 |
Profile distortion in SIMS
|
Boudewijn, P.R.
|
|
1984
|
39 |
12 |
p. 1567-1571
5 p.
|
artikel
|
| 17 |
Reactions of dental enamel with superficially applied fluorides: electron spectroscopic investigations
|
Uchtmann, H.
|
|
1984
|
39 |
12 |
p. 1537-1540
4 p.
|
artikel
|
| 18 |
Study of fission product loaded aerosols from core melting experiments
|
Moers, H.
|
|
1984
|
39 |
12 |
p. 1563-1566
4 p.
|
artikel
|
| 19 |
Surface- and microanalysis as a tool for studying the corrosion of aluminium
|
Van craen, M.J.A.
|
|
1984
|
39 |
12 |
p. 1579-1581
3 p.
|
artikel
|
| 20 |
X-ray and electron induced Auger processes for I2 adsorption on uranium
|
Dillard, J.G.
|
|
1984
|
39 |
12 |
p. 1533-1536
4 p.
|
artikel
|
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