| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
An approach to the numerical solution of the problem of electron scattering in thin crystals, based on the Galerkin method
|
Rukolaine, S.A.
|
|
1994
|
54 |
1 |
p. 75-82
8 p.
|
article
|
| 2 |
A versatile, software configurable multichannel STEM detector for angle-resolved imaging
|
Haider, M.
|
|
1994
|
54 |
1 |
p. 41-59
19 p.
|
article
|
| 3 |
Beyond the conventional information limit: the relevant coherence function
|
Nellist, P.D.
|
|
1994
|
54 |
1 |
p. 61-74
14 p.
|
article
|
| 4 |
Determination of structure factors, lattice strains and accelerating voltage by energy-filtered convergent beam electron diffraction
|
Deininger, C.
|
|
1994
|
54 |
1 |
p. 15-30
16 p.
|
article
|
| 5 |
Dynamic observation of magnetic domains by on-line real-time electron holography
|
Hirayama, T.
|
|
1994
|
54 |
1 |
p. 9-14
6 p.
|
article
|
| 6 |
Editorial Board
|
|
|
1994
|
54 |
1 |
p. IFC-
1 p.
|
article
|
| 7 |
Electron-beam-induced reduction of Mn4+ in manganese oxides as revealed by parallel EELS
|
Garvie, Laurence A.J.
|
|
1994
|
54 |
1 |
p. 83-92
10 p.
|
article
|
| 8 |
Erratum to “coherence and multiple scattering in ‘Z-contrast’ images” [ultramicroscopy 52 (1993) 31–53]
|
Treacy, M.M.J.
|
|
1994
|
54 |
1 |
p. 93-
1 p.
|
article
|
| 9 |
Erratum to “combination of high-resolution electron imaging and holography in the investigation of the modulated structure of Zr4ON3F5” [ultramicroscopy 53 (1994) 53–62]
|
Schweda, E.
|
|
1994
|
54 |
1 |
p. 94-95
2 p.
|
article
|
| 10 |
Force-displacement measurements in a beam-reflection scanning force microscope: calibration issues
|
Haugstad, G.
|
|
1994
|
54 |
1 |
p. 31-40
10 p.
|
article
|
| 11 |
Shadow imaging of surface topography in a conventional scanning electron microscope by forward scattered electrons
|
Baba-Kishi, K.Z.
|
|
1994
|
54 |
1 |
p. 1-7
7 p.
|
article
|
Journal description