| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Absorption and fluorescence corrections for X-ray analysis with large-solid-angle detectors: Thin films and spheres
|
Zreiba, Nuri A.
|
|
1990
|
33 |
3 |
p. 187-197
11 p.
|
artikel
|
| 2 |
Convergent-beam electron diffraction characterization of dislocations in GaS single crystals
|
De Blasi, C.
|
|
1990
|
33 |
3 |
p. 143-149
7 p.
|
artikel
|
| 3 |
Electron diffraction and lattice image simulations with the inclusion of HOLZ reflections
|
Qin, L.C.
|
|
1990
|
33 |
3 |
p. 159-166
8 p.
|
artikel
|
| 4 |
Experimental determination of the efficiency function of an X-ray detector using submicron spheres
|
Zreiba, Nuri A.
|
|
1990
|
33 |
3 |
p. 199-207
9 p.
|
artikel
|
| 5 |
Multiple scattering correction by a direct convolution method for electron energy loss spectrum
|
Wang, Yun-Yu
|
|
1990
|
33 |
3 |
p. 151-157
7 p.
|
artikel
|
| 6 |
New books, special issues …
|
Hawkes, P.W.
|
|
1990
|
33 |
3 |
p. 215-225
11 p.
|
artikel
|
| 7 |
Representation of rotations by unit quaternions
|
Harauz, George
|
|
1990
|
33 |
3 |
p. 209-213
5 p.
|
artikel
|
| 8 |
Surface roughness studies in small particles using HREM
|
Yacamán, M.José
|
|
1990
|
33 |
3 |
p. 133-141
9 p.
|
artikel
|
| 9 |
The inelastic contribution to high resolution images of defects
|
Krivanek, O.L.
|
|
1990
|
33 |
3 |
p. 177-185
9 p.
|
artikel
|
| 10 |
7th Oxford conference on the microscopy of semiconducting materials Oxford, England, 25–28 March 1991
|
|
|
1990
|
33 |
3 |
p. 226-
1 p.
|
artikel
|
| 11 |
Three-dimensional interactive graphics for displaying and modelling microscopic data
|
Basinski, Mark
|
|
1990
|
33 |
3 |
p. 167-175
9 p.
|
artikel
|
Tijdschrift beschrijving