nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A new sample preparation protocol for SEM and TEM particulate matter analysis
|
Sinha, Ankur |
|
|
230 |
C |
p. |
artikel |
2 |
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy
|
Wu, K.P. |
|
|
230 |
C |
p. |
artikel |
3 |
Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approach
|
Tkadletz, Michael |
|
|
230 |
C |
p. |
artikel |
4 |
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy
|
Mendis, B.G. |
|
|
230 |
C |
p. |
artikel |
5 |
A versatile sample fabrication method for ultrafast electron diffraction
|
Bie, Ya-Qing |
|
|
230 |
C |
p. |
artikel |
6 |
Bragg holography of nano-crystals
|
Latychevskaia, Tatiana |
|
|
230 |
C |
p. |
artikel |
7 |
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope
|
Morishita, Hideo |
|
|
230 |
C |
p. |
artikel |
8 |
3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods
|
DeMott, Ryan |
|
|
230 |
C |
p. |
artikel |
9 |
Demonstration of atomic force microscopy imaging using an integrated opto-electro-mechanical transducer
|
Galeotti, Federico |
|
|
230 |
C |
p. |
artikel |
10 |
Direct measurement of the PSF for Coulomb delocalization – a reconsideration
|
Egerton, R.F. |
|
|
230 |
C |
p. |
artikel |
11 |
Editorial Board
|
|
|
|
230 |
C |
p. |
artikel |
12 |
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy
|
Żak, Andrzej M. |
|
|
230 |
C |
p. |
artikel |
13 |
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy
|
Cortés, Henry A. |
|
|
230 |
C |
p. |
artikel |
14 |
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt
|
De wael, Annelies |
|
|
230 |
C |
p. |
artikel |
15 |
Numerical simulations of field emission characteristics of open CNT
|
Filippov, Sergey Vladimirovich |
|
|
230 |
C |
p. |
artikel |
16 |
Optimization of imaging conditions for composition determination by annular dark field STEM
|
Firoozabadi, S. |
|
|
230 |
C |
p. |
artikel |
17 |
Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation
|
Lai, Junqi |
|
|
230 |
C |
p. |
artikel |
18 |
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic Tomography
|
Gureyev, T.E. |
|
|
230 |
C |
p. |
artikel |
19 |
The effect of size distribution and degradation of carbon nanotubes on the Fowler–Nordheim plot behavior
|
Al-Heeti, Samah A. |
|
|
230 |
C |
p. |
artikel |
20 |
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy
|
Ortega, Eduardo |
|
|
230 |
C |
p. |
artikel |
21 |
The interaction of proanthocyanidins with DNA molecules studied by atomic force microscopy and spectroscopic method
|
Li, Jingchao |
|
|
230 |
C |
p. |
artikel |
22 |
Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio
|
Tokarski, Tomasz |
|
|
230 |
C |
p. |
artikel |