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                             22 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A new sample preparation protocol for SEM and TEM particulate matter analysis Sinha, Ankur

230 C p.
artikel
2 An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy Wu, K.P.

230 C p.
artikel
3 Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approach Tkadletz, Michael

230 C p.
artikel
4 A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy Mendis, B.G.

230 C p.
artikel
5 A versatile sample fabrication method for ultrafast electron diffraction Bie, Ya-Qing

230 C p.
artikel
6 Bragg holography of nano-crystals Latychevskaia, Tatiana

230 C p.
artikel
7 Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope Morishita, Hideo

230 C p.
artikel
8 3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods DeMott, Ryan

230 C p.
artikel
9 Demonstration of atomic force microscopy imaging using an integrated opto-electro-mechanical transducer Galeotti, Federico

230 C p.
artikel
10 Direct measurement of the PSF for Coulomb delocalization – a reconsideration Egerton, R.F.

230 C p.
artikel
11 Editorial Board
230 C p.
artikel
12 Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy Żak, Andrzej M.

230 C p.
artikel
13 In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy Cortés, Henry A.

230 C p.
artikel
14 Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt De wael, Annelies

230 C p.
artikel
15 Numerical simulations of field emission characteristics of open CNT Filippov, Sergey Vladimirovich

230 C p.
artikel
16 Optimization of imaging conditions for composition determination by annular dark field STEM Firoozabadi, S.

230 C p.
artikel
17 Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation Lai, Junqi

230 C p.
artikel
18 Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic Tomography Gureyev, T.E.

230 C p.
artikel
19 The effect of size distribution and degradation of carbon nanotubes on the Fowler–Nordheim plot behavior Al-Heeti, Samah A.

230 C p.
artikel
20 The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy Ortega, Eduardo

230 C p.
artikel
21 The interaction of proanthocyanidins with DNA molecules studied by atomic force microscopy and spectroscopic method Li, Jingchao

230 C p.
artikel
22 Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio Tokarski, Tomasz

230 C p.
artikel
                             22 gevonden resultaten
 
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