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                             11 results found
no title author magazine year volume issue page(s) type
1 Angular dynamics of small nanoparticles induced by non-vortex electron beams Castellanos-Reyes, José Ángel

225 C p.
article
2 Beam shaping and probe characterization in the scanning electron microscope Řiháček, T.

225 C p.
article
3 Editorial Board
225 C p.
article
4 Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM Karamched, Phani S.

225 C p.
article
5 Evaluation of electron radiation damage to green fluorescent protein Ikegami, H.

225 C p.
article
6 Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope Krysztof, M.

225 C p.
article
7 Factors affecting Confidence Index in EBSD analysis De Vincentis, N.S.

225 C p.
article
8 Gradient-based and wavelet-based compressed sensing approaches for highly undersampled tomographic datasets Jacob, Martin

225 C p.
article
9 High order phase contrast and source divergence in low energy electron microscopy Yu, Lei

225 C p.
article
10 Manganese Migration in Li1-xMn2O4 Cathode Materials Calderon V, S.

225 C p.
article
11 Tuneable in-situ nanoCT workflow using FIB/SEM Barabasová, Paulína

225 C p.
article
                             11 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands