| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Aggregated nanoparticles: Sample preparation and analysis by atom probe tomography
|
Barroo, Cédric
|
|
|
218 |
C |
p.
|
artikel
|
| 2 |
A hyperspectral unmixing framework for energy-loss near-edge structure analysis
|
Lu, Sirong
|
|
|
218 |
C |
p.
|
artikel
|
| 3 |
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations
|
Dubosq, R.
|
|
|
218 |
C |
p.
|
artikel
|
| 4 |
Analyzing contrast in cryo-transmission electron microscopy: Comparison of electrostatic Zach phase plates and hole-free phase plates
|
Obermair, Martin
|
|
|
218 |
C |
p.
|
artikel
|
| 5 |
Approximant-based orientation determination of quasicrystals using electron backscatter diffraction
|
Cios, Grzegorz
|
|
|
218 |
C |
p.
|
artikel
|
| 6 |
Chemical kinetics for operando electron microscopy of catalysts: 3D modeling of gas and temperature distributions during catalytic reactions
|
Vincent, Joshua L.
|
|
|
218 |
C |
p.
|
artikel
|
| 7 |
Corrigendum to “A simple program for fast tilting electron-beam sensitive crystals to zone axes” [Ultramicroscopy 211 (2020) 112941]
|
Zhang, Yunhao
|
|
|
218 |
C |
p.
|
artikel
|
| 8 |
3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon
|
Zhang, Yu
|
|
|
218 |
C |
p.
|
artikel
|
| 9 |
Deformation and fracture of crystalline tungsten and fabrication of composite STM probes
|
Ionov, Andrei M.
|
|
|
218 |
C |
p.
|
artikel
|
| 10 |
3D electron backscatter diffraction study of α lath morphology in additively manufactured Ti-6Al-4V
|
DeMott, Ryan
|
|
|
218 |
C |
p.
|
artikel
|
| 11 |
EBSD pattern simulations for an interaction volume containing lattice defects
|
Zhu, Chaoyi
|
|
|
218 |
C |
p.
|
artikel
|
| 12 |
Editorial Board
|
|
|
|
218 |
C |
p.
|
artikel
|
| 13 |
Enhancement of low-spatial-frequency components by a new phase-contrast STEM using a probe formed with an amplitude Fresnel zone plate
|
Tomita, Masato
|
|
|
218 |
C |
p.
|
artikel
|
| 14 |
Micrograph contrast in low-voltage SEM and cryo-SEM
|
Liberman, Lucy
|
|
|
218 |
C |
p.
|
artikel
|
| 15 |
Nanoscale mobility mapping in semiconducting polymer films
|
Alekseev, A.
|
|
|
218 |
C |
p.
|
artikel
|
| 16 |
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons
|
Gureyev, T.E.
|
|
|
218 |
C |
p.
|
artikel
|
| 17 |
Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructures
|
Golyashov, V.A.
|
|
|
218 |
C |
p.
|
artikel
|
| 18 |
Spectral DQE of the Volta phase plate
|
Buijsse, Bart
|
|
|
218 |
C |
p.
|
artikel
|
| 19 |
Sub-pixel electron detection using a convolutional neural network
|
van Schayck, J. Paul
|
|
|
218 |
C |
p.
|
artikel
|
| 20 |
The behavior of Fowler-Nordheim plot from carbon nanotubes-based large area field emitters arrays
|
Al-Tabbakh, Ahmed A.
|
|
|
218 |
C |
p.
|
artikel
|
| 21 |
Transmission imaging on a scintillator in a scanning electron microscope
|
Zuidema, Wilco
|
|
|
218 |
C |
p.
|
artikel
|
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