| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A method for constrained optimisation of the design of a scanning helium microscope
|
Bergin, M.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 2 |
Analysis of depth-sectioning STEM for thick samples and 3D imaging
|
Bosch, Eric G.T.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 3 |
A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point
|
Crouzier, Loïc
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 4 |
A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns
|
Lenthe, W.C.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 5 |
Design for a high resolution electron energy loss microscope
|
Mankos, Marian
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 6 |
Design for a 10 keV multi-pass transmission electron microscope
|
Koppell, Stewart A.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 7 |
Differential electron scattering cross-sections at low electron energies: The influence of screening parameter
|
Čalkovský, M.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 8 |
3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithm
|
Borzunov, A.A.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 9 |
Dynamical diffraction effects on the geometric phase of inhomogeneous strain fields
|
Meißner, L.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 10 |
Editorial Board
|
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 11 |
Electron beam-induced current imaging with two-angstrom resolution
|
Mecklenburg, Matthew
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 12 |
Electron spill-out effects in plasmon excitations by fast electrons
|
Rivacoba, Alberto
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 13 |
Extremely low count detection for EELS spectrum imaging by reducing CCD read-out noise
|
Haruta, Mitsutaka
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 14 |
Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross correlation on the sphere
|
Hielscher, Ralf
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 15 |
Indexing electron backscatter diffraction patterns with a refined template matching approach
|
Foden, A.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 16 |
Influence of pixelization on height measurement in atomic force microscopy
|
Tolstova, Anna P.
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 17 |
Lattice strain mapping using circular Hough transform for electron diffraction disk detection
|
Yuan, Renliang
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 18 |
On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium
|
Tripathi, Abhishek
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 19 |
Plan-view sample preparation of a buried nanodots array by FIB with accurate EDS positioning in thickness direction
|
Zhong, Chaorong
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 20 |
Significance of electrostatic interactions due to surface potential in piezoresponse force microscopy
|
Seol, Daehee
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 21 |
Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing
|
Zhang, Weijie
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 22 |
Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes
|
Jing, Chunguang
|
|
2019
|
207 |
C |
p.
|
artikel
|
| 23 |
Understanding amorphization mechanisms using ion irradiation in situ a TEM and 3D damage reconstruction
|
Camara, Osmane
|
|
2019
|
207 |
C |
p.
|
artikel
|
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