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nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A direct comparison between sem (ebic) and hvem images of crystal defects in semiconductors Blumtritt, H.
 1976
 2 C p. 405-408
4 p.
 artikel
2 Advantages of megavolt electron microscopy in biological research Dupouy, Gaston
 1976
 2 C p. 199-203
5 p.
 artikel
3 A method for producing hollow cone illumination electronically in the conventional transmission microscope Krakow, William
 1976
 2 C p. 53-67
15 p.
 artikel
4 Announcement 1976
 2 C p. 2-
1 p.
 artikel
5 Announcements of coming meetings 1976
 2 C p. 141-146
6 p.
 artikel
6 A reflection on partial coherence in electron microscopy Fertig, J.
 1976
 2 C p. 269-279
11 p.
 artikel
7 Asymmetrical dark field detectors in the stem Beck, V.
 1976
 2 C p. 351-360
10 p.
 artikel
8 Author index to volume 2 1976
 2 C p. 414-415
2 p.
 artikel
9 Bragg diffraction imaging of defects at crystal surfaces Shuman, H.
 1976
 2 C p. 361-369
9 p.
 artikel
10 Calculation of the cross sections of electron interaction with matter Arnal, F.
 1976
 2 C p. 305-310
6 p.
 artikel
11 Cd-metallothionein-a test object for dark-field studies of protein structure Fiskin, A. Max
 1976
 2 C p. 389-395
7 p.
 artikel
12 Computer algebra and the study of unconventional electron lenses Hawkes, P.W.
 1976
 2 C p. 179-183
5 p.
 artikel
13 Design features of a photographic film optimized for the high-voltage electron microscope Vernon King, Murray
 1976
 2 C p. 371-384
14 p.
 artikel
14 Determination of the wave aberration of electron lenses from superposition diffractograms of images with differently tilted illumination Typke, D.
 1976
 2 C p. 285-295
11 p.
 artikel
15 Editorial Zeitler, Elmar
 1976
 2 C p. 1-
1 p.
 artikel
16 Editorial Zeitler, Elmar
 1976
 2 C p. 303-
1 p.
 artikel
17 Electron microscopy conference 1976
 2 C p. 113-140
28 p.
 artikel
18 Factors affecting high resolution fixed-beam transmission electron microscopy Chiu, Wah
 1976
 2 C p. 207-217
11 p.
 artikel
19 Fresnel fringes in stem Colliex, C.
 1976
 2 C p. 327-335
9 p.
 artikel
20 High resolution bright field electron microscopy of biological specimens Johansen, B.V.
 1976
 2 C p. 229-239
11 p.
 artikel
21 High resolution shadowing for electron microscopy by sputter deposition Adachi, Koichi
 1976
 2 C p. 17-29
13 p.
 artikel
22 Ideal lenses and the scherzer theorem Crewe, A.V.
 1976
 2 C p. 281-284
4 p.
 artikel
23 Improvements in electron microscopy by application of superconductivity Dietrich, I.
 1976
 2 C p. 241-249
9 p.
 artikel
24 Indirect measurements of relative humidity in a side entry environmental stage Cantino, Marie E.
 1976
 2 C p. 409-412
4 p.
 artikel
25 Influence of detector geometry on image properties of the stem for thick objects Rose, H.
 1976
 2 C p. 77-87
11 p.
 artikel
26 Is the electron wavelength an observable? Rang, O.
 1976
 2 C p. 149-151
3 p.
 artikel
27 Kodirex for high resolution electron microscopy Dorignac, D.
 1976
 2 C p. 49-52
4 p.
 artikel
28 Letter to the editor Lea, Peter
 1976
 2 C p. 413-
1 p.
 artikel
29 Magnetic spectrometers: approximate and ideal designs Fields, John R.
 1976
 2 C p. 311-325
15 p.
 artikel
30 Measurement of focus and spherical aberration of an electron microscope objective lens Budinger, T.F.
 1976
 2 C p. 31-41
11 p.
 artikel
31 Microanalytical techniques in the electron microscope Mulvey, T.
 1976
 2 C p. 109-111
3 p.
 artikel
32 Minimization of dose as a criterion for the selection of imaging modes in electron microscopy of amorphous specimens Lamvik, M.K.
 1976
 2 C p. 69-75
7 p.
 artikel
33 Motif detection in quantum noise-limited electron micrographs by cross-correlation Saxton, W.O.
 1976
 2 C p. 219-227
9 p.
 artikel
34 Nonstandard imaging methods in electron microscopy Rose, H.
 1976
 2 C p. 251-267
17 p.
 artikel
35 Optical and digital image processing in high-resolution electron microscopy Burge, R.E.
 1976
 2 C p. 169-178
10 p.
 artikel
36 Partial fraction expansion of electron optical cardinal Schiske, Elements P.
 1976
 2 C p. 193-198
6 p.
 artikel
37 Prospects of three-dimensional high resolution electron microscopy of non-periodic structures Hoppe, W.
 1976
 2 C p. 153-168
16 p.
 artikel
38 Real-space filtering of electron images from optical autocorrelation patterns Fiskin, A.Max.
 1976
 2 C p. 397-404
8 p.
 artikel
39 Recording of mass thickness in scanning transmission electron microscopy Reimer, L.
 1976
 2 C p. 297-301
5 p.
 artikel
40 Report of a workshop on analytical electron microscopy held at Cornell University, Ithaca, New York, USA, August 3–6, 1976 Isaacson, M.S.
 1976
 2 C p. 89-104
16 p.
 artikel
41 Scanning transmission electron microscopy of thin specimens Cowley, J.M.
 1976
 2 C p. 3-16
14 p.
 artikel
42 Scherzer's formula and the correction of spiral distortion in the electron microscope Marai, F.Z.
 1976
 2 C p. 187-192
6 p.
 artikel
43 Selective radiation damage in the long period ordered Au4Zn alloy Van Tendeloo, G.
 1976
 2 C p. 385-387
3 p.
 artikel
44 Subject index to volume 2 1976
 2 C p. 416-417
2 p.
 artikel
45 The bright and shadow images of an atom in the transmission electron microscope Uyeda, Ryozi
 1976
 2 C p. 205-206
2 p.
 artikel
46 The continuing importance of theoretical electron optics in the development of biomedical electron microscopy Parsons, Donald F.
 1976
 2 C p. 185-
1 p.
 artikel
47 The modification of the electron microscope for special crystallographic applications Dowell, W.C.T.
 1976
 2 C p. 43-48
6 p.
 artikel
48 Transmission microscopy of unmodified biological materials. Comparative radiation dosages with electrons and ultrasoft X-ray photons Sayre, D.
 1976
 2 C p. 337-349
13 p.
 artikel
49 Use of pure carbon specimen holders for analytical electron microscopy of thin sections Liljesvan, Björn
 1976
 2 C p. 105-107
3 p.
 artikel
50 Young's experiment with electrons Ohtsuki, M.
 1976
 2 C p. 147-148
2 p.
 artikel
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