nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of EEL spectrum of low-loss region using the C s -corrected STEM–EELS method and multivariate analysis
|
Yamazaki, Takashi |
|
2011 |
111 |
5 |
p. 303-308 6 p. |
artikel |
2 |
An improved method to identify grain boundary creep cavitation in 316H austenitic stainless steel
|
Chen, B. |
|
2011 |
111 |
5 |
p. 309-313 5 p. |
artikel |
3 |
A practical method to determine the effective resolution in incoherent experimental electron tomography
|
Heidari Mezerji, Hamed |
|
2011 |
111 |
5 |
p. 330-336 7 p. |
artikel |
4 |
Caustic imaging of gallium droplets using mirror electron microscopy
|
Kennedy, S.M. |
|
2011 |
111 |
5 |
p. 356-363 8 p. |
artikel |
5 |
Distinguishing crystallographic misorientations of lanthanum zirconate epilayers on nickel substrates by electron backscatter diffraction
|
Ji, Yuan |
|
2011 |
111 |
5 |
p. 314-319 6 p. |
artikel |
6 |
Energy-filtered transmission electron microscopy of biological samples on highly transparent carbon nanomembranes
|
Rhinow, Daniel |
|
2011 |
111 |
5 |
p. 342-349 8 p. |
artikel |
7 |
High accuracy FIONA–AFM hybrid imaging
|
Fronczek, D.N. |
|
2011 |
111 |
5 |
p. 350-355 6 p. |
artikel |
8 |
IFC (Editorial Board)
|
|
|
2011 |
111 |
5 |
p. IFC- 1 p. |
artikel |
9 |
Influence of Confocal Scanning Laser Microscopy specific acquisition parameters on the detection and matching of Speeded-Up Robust Features
|
Stanciu, Stefan G. |
|
2011 |
111 |
5 |
p. 364-374 11 p. |
artikel |
10 |
Simulation-aided design and fabrication of nanoprobes for scanning probe microscopy
|
Liu, Bernard Haochih |
|
2011 |
111 |
5 |
p. 337-341 5 p. |
artikel |
11 |
Towards high accuracy calibration of electron backscatter diffraction systems
|
Mingard, Ken |
|
2011 |
111 |
5 |
p. 320-329 10 p. |
artikel |