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                             172 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A Bloch wave analysis of optical sectioning in aberration-corrected STEM Cosgriff, E.C.
2007
8 p. 626-634
9 p.
artikel
2 Accuracy and precision in model based EELS quantification Bertoni, G.
2008
8 p. 782-790
9 p.
artikel
3 A distributed multi-GPU system for high speed electron microscopic tomographic reconstruction Zheng, Shawn Q.
2011
8 p. 1137-1143
7 p.
artikel
4 A fast algorithm for computing and correcting the CTF for tilted, thick specimens in TEM Voortman, Lenard M.
2011
8 p. 1029-1036
8 p.
artikel
5 AFM imaging of functionalized double-walled carbon nanotubes Lamprecht, C.
2009
8 p. 899-906
8 p.
artikel
6 A high signal-to-noise ratio toroidal electron spectrometer for the SEM Hoang, H.Q.
2011
8 p. 1093-1100
8 p.
artikel
7 A method for fabricating protein patterns on the octadecyltrichlorosialne(OTS) surface through paper swabbing Gao, Pei
2009
8 p. 1023-1028
6 p.
artikel
8 A method to determine the local surface profile from reconstructed exit waves Wang, A.
2011
8 p. 1352-1359
8 p.
artikel
9 An alternative approach to carbon nanotube sample preparation for TEM investigation Caplovicova, M.
2007
8 p. 692-697
6 p.
artikel
10 Analysis of computational EELS modelling results for MgO-based systems Seabourne, Che R.
2010
8 p. 1059-1069
11 p.
artikel
11 A new method based on image analysis for determining cyanobacterial biomass by CLSM in stratified benthic sediments Solé, A.
2007
8 p. 669-673
5 p.
artikel
12 An inverse problem of estimating the heat source in tapered optical fibers for scanning near-field optical microscopy Lee, Haw-Long
2007
8 p. 656-662
7 p.
artikel
13 A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite Stratton, W.G.
2008
8 p. 727-736
10 p.
artikel
14 A pitfall in the calculation of higher order aberrations Lencová, Bohumila
2008
8 p. 737-740
4 p.
artikel
15 Assessment of local deformation using EBSD: Quantification of accuracy of measurement and definition of local gradient Kamaya, Masayuki
2011
8 p. 1189-1199
11 p.
artikel
16 Assessment of waveguiding properties of gallium oxide nanostructures by angle resolved cathodoluminescence in a scanning electron microscope Nogales, Emilio
2011
8 p. 1037-1042
6 p.
artikel
17 Astigmatic intensity equation for electron microscopy based phase retrieval Petersen, Tim C.
2007
8 p. 635-643
9 p.
artikel
18 A study of phase separated Ni66Nb17Y17 metallic glass using atom probe tomography Shariq, A.
2011
8 p. 1370-1374
5 p.
artikel
19 Atomic force microscopy-based antibody recognition imaging of proteins in the pathological deposits in Pseudoexfoliation Syndrome Creasey, Rhiannon
2011
8 p. 1055-1061
7 p.
artikel
20 Atomic force microscopy: Unraveling the fundamental principles governing secretion and membrane fusion in cells Jena, Bhanu P.
2009
8 p. 1094-1104
11 p.
artikel
21 Automated three-dimensional X-ray analysis using a dual-beam FIB Schaffer, Miroslava
2007
8 p. 587-597
11 p.
artikel
22 Basic questions related to electron-induced sputtering in the TEM Egerton, R.F.
2010
8 p. 991-997
7 p.
artikel
23 Breakdown of the dipole approximation in core losses Löffler, S.
2011
8 p. 1163-1167
5 p.
artikel
24 Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM) Schwartz, G.A.
2011
8 p. 1366-1369
4 p.
artikel
25 Calculation of phase changes of electron waves near excited nanoparticles Anstis, Geoffrey R.
2010
8 p. 1070-1074
5 p.
artikel
26 Cleaning AFM colloidal probes by mechanically scrubbing with supersharp “brushes” Gan, Yang
2009
8 p. 1061-1065
5 p.
artikel
27 Committees 2010
8 p. v-
1 p.
artikel
28 Comparison of EFTEM and STEM EELS plasmon imaging of gold nanoparticles in a monochromated TEM Schaffer, Bernhard
2010
8 p. 1087-1093
7 p.
artikel
29 Composition mapping in InGaN by scanning transmission electron microscopy Rosenauer, Andreas
2011
8 p. 1316-1327
12 p.
artikel
30 Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imaging Stan, G.
2009
8 p. 929-936
8 p.
artikel
31 Contents 2009
8 p. vii-ix
nvt p.
artikel
32 Contents 2010
8 p. vi-vii
nvt p.
artikel
33 Contribution to the elucidation of the structure of the bacterial flagellum nano-motor through AFM imaging of the M-Ring Chalmeau, Jerome
2009
8 p. 845-853
9 p.
artikel
34 Coupled lateral bending–torsional vibration sensitivity of atomic force microscope cantilever Lee, Haw-Long
2008
8 p. 707-711
5 p.
artikel
35 Cs corrected STEM EELS: Analysing beam sensitive carbon nanomaterials in cellular structures Gass, Mhairi H.
2010
8 p. 946-951
6 p.
artikel
36 Dark-field electron holography for the measurement of geometric phase Hÿtch, M.J.
2011
8 p. 1328-1337
10 p.
artikel
37 Defocus and twofold astigmatism correction in HAADF-STEM Rudnaya, M.E.
2011
8 p. 1043-1054
12 p.
artikel
38 Detection of buried reference structures by use of atomic force acoustic microscopy Striegler, Andre
2011
8 p. 1405-1416
12 p.
artikel
39 Digital in-line X-ray holography with zone plates Heine, R.
2011
8 p. 1131-1136
6 p.
artikel
40 Direct deformation study of AFM probe tips modified by hydrophobic alkylsilane self-assembled monolayers Haochih Liu, Bernard
2011
8 p. 1124-1130
7 p.
artikel
41 Direct electron imaging in electron microscopy with monolithic active pixel sensors Deptuch, G.
2007
8 p. 674-684
11 p.
artikel
42 EDGE 2009 2010
8 p. iii-
1 p.
artikel
43 EELS and optical response of a noble metal nanoparticle in the frame of a discrete dipole approximation Geuquet, Nicolas
2010
8 p. 1075-1080
6 p.
artikel
44 EELS detection limits revisited: Ruby — a case study Riegler, Katharina
2010
8 p. 1004-1013
10 p.
artikel
45 Effect of ambient humidity on the strength of the adhesion force of single yeast cell inside environmental-SEM Shen, Yajing
2011
8 p. 1176-1183
8 p.
artikel
46 Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experiments Yi, Feng
2011
8 p. 1375-1380
6 p.
artikel
47 Effect of spatial and energy distortions on energy-loss magnetic chiral dichroism measurements: Application to an iron thin film Warot-Fonrose, B.
2010
8 p. 1033-1037
5 p.
artikel
48 Effect of SP-C on surface potential distribution in pulmonary surfactant: Atomic force microscopy and Kelvin probe force microscopy study Hane, Francis
2009
8 p. 968-973
6 p.
artikel
49 Effects of amorphous layers on ADF-STEM imaging Mkhoyan, K.A.
2008
8 p. 791-803
13 p.
artikel
50 Effects of dopamine concentration on energy transfer between dendrimer–QD and dye-labeled antibody Lee, Ki Rahm
2009
8 p. 894-898
5 p.
artikel
51 Effects of substrates on biofilm formation observed by atomic force microscopy Oh, Y.J.
2009
8 p. 874-880
7 p.
artikel
52 Effects of tilt on high-resolution ADF-STEM imaging Maccagnano-Zacher, S.E.
2008
8 p. 718-726
9 p.
artikel
53 EFTEM study of surface plasmon resonances in silver nanoholes Sigle, W.
2010
8 p. 1094-1100
7 p.
artikel
54 Electrical detection of β-amyloid (1-40) using scanning tunneling microscopy Lee, Jin-Ho
2009
8 p. 923-928
6 p.
artikel
55 Electrochemical immunosensor for prostate-specific antigen using self-assembled oligophenylethynylenethiol monolayer containing dendrimer Namgung, Mi-Ok
2009
8 p. 907-910
4 p.
artikel
56 Electron-beam-induced reduction of Fe3+ in iron phosphate dihydrate, ferrihydrite, haemosiderin and ferritin as revealed by electron energy-loss spectroscopy Pan, Ying-Hsi
2010
8 p. 1020-1032
13 p.
artikel
57 Electron tomography combining ESEM and STEM: A new 3D imaging technique Jornsanoh, P.
2011
8 p. 1247-1254
8 p.
artikel
58 Elemental mapping at the atomic scale using low accelerating voltages Botton, Gianluigi A.
2010
8 p. 926-934
9 p.
artikel
59 Energy-filtered transmission electron microscopy based on inner-shell ionization Lugg, N.R.
2010
8 p. 981-990
10 p.
artikel
60 Energy resolution of an Omega-type monochromator and imaging properties of the MANDOLINE filter Essers, Erik
2010
8 p. 971-980
10 p.
artikel
61 Erratum to: “First-principles study on incident direction, individual site character, and atomic projection dependences of ELNES for perovskite compounds” Mizoguchi, Teruyasu
2007
8 p. 703-704
2 p.
artikel
62 Evaluation of two-dimensional strain distribution by STEM/NBD Uesugi, Fumihiko
2011
8 p. 995-998
4 p.
artikel
63 Exploring different inelastic projection mechanisms for electron tomography Goris, B.
2011
8 p. 1262-1267
6 p.
artikel
64 Extended ptychography in the transmission electron microscope: Possibilities and limitations Hüe, F.
2011
8 p. 1117-1123
7 p.
artikel
65 Fabrication and analysis of cylindrical resin AFM microcantilevers Cheneler, D.
2011
8 p. 1214-1223
10 p.
artikel
66 Fabrication and characterization of the hierarchical structure for superhydrophobicity and self-cleaning Bhushan, Bharat
2009
8 p. 1029-1034
6 p.
artikel
67 Fabrication of Au nanodots with 60nm diameter on ITO glass: Towards nanobiochip using nanoporous alumina mask Jung, Mi
2009
8 p. 1006-1010
5 p.
artikel
68 Fabrication of self-assembled oligophenylethynylenethiol monolayer for electrochemical glucose biosensor Jung, Seul-Ki
2009
8 p. 911-915
5 p.
artikel
69 Field-induced cathodic oxidation of low-energy Ar-ion-bombarded silicon by AFM Kim, Hyunsook
2009
8 p. 1085-1088
4 p.
artikel
70 Force spectroscopy of hepatocytic extracellular matrix components Yongsunthon, R.
2009
8 p. 942-947
6 p.
artikel
71 Foreword Kothleitner, Gerald
2010
8 p. 925-
1 p.
artikel
72 Formation of large ordered domains in benzenethiol self-assembled monolayers on Au(111) observed by scanning tunneling microscopy Kang, Hungu
2009
8 p. 1011-1014
4 p.
artikel
73 Gallium-enhanced phase contrast in atom probe tomography of nanocrystalline and amorphous Al–Mn alloys Ruan, Shiyun
2011
8 p. 1062-1072
11 p.
artikel
74 Gentle STEM: ADF imaging and EELS at low primary energies Krivanek, Ondrej L.
2010
8 p. 935-945
11 p.
artikel
75 High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopy Hata, S.
2011
8 p. 1168-1175
8 p.
artikel
76 High energy-resolution electron energy-loss spectroscopy study of the dielectric properties of bulk and nanoparticle LaB6 in the near-infrared region Sato, Yohei
2011
8 p. 1381-1387
7 p.
artikel
77 Higher-order aberration corrector for an image-forming system in a transmission electron microscope Sawada, H.
2010
8 p. 958-961
4 p.
artikel
78 High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM Vaudin, M.D.
2011
8 p. 1206-1213
8 p.
artikel
79 High-sensitivity detection of proteins using gel electrophoresis and atomic force microscopy Sekiguchi, Hiroshi
2009
8 p. 916-922
7 p.
artikel
80 High-speed atomic force microscope lithography using a piezo tube scanner driven by a sinusoidal waveform Kwon, Gwangmin
2009
8 p. 1052-1055
4 p.
artikel
81 Holey carbon micro-arrays for transmission electron microscopy: A microcontact printing approach Chester, David W.
2007
8 p. 685-691
7 p.
artikel
82 Hydrophobic corn starch thermoplastic films produced by plasma treatment Bastos, Daniele C.
2009
8 p. 1089-1093
5 p.
artikel
83 IFC (Editorial Board) 2009
8 p. IFC-
1 p.
artikel
84 IFC (Editorial Board) 2008
8 p. IFC-
1 p.
artikel
85 IFC (Editorial Board) 2007
8 p. IFC-
1 p.
artikel
86 IFC (Editorial Board) 2010
8 p. IFC-
1 p.
artikel
87 IFC (Editorial Board) 2011
8 p. IFC-
1 p.
artikel
88 Image blur and energy broadening effects in XPEEM Locatelli, Andrea
2011
8 p. 1447-1454
8 p.
artikel
89 Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis Felisari, L.
2011
8 p. 1018-1028
11 p.
artikel
90 Immobilization and characterization of ferritin on gold electrode Park, Chul Wan
2009
8 p. 1001-1005
5 p.
artikel
91 Improvement of KFM performance by intermittent bias application method and by sampling detection of cantilever deflection Takahashi, Takuji
2009
8 p. 963-967
5 p.
artikel
92 Inelastic electron holography as a variant of the Feynman thought experiment Potapov, P.L.
2007
8 p. 559-567
9 p.
artikel
93 Influence of the tip mass on the tip–sample interactions in TM-AFM Pishkenari, Hossein Nejat
2011
8 p. 1423-1436
14 p.
artikel
94 Intrinsic dissipation in atomic force microscopy cantilevers Zypman, Fredy
2011
8 p. 1014-1017
4 p.
artikel
95 Intrinsic friction analysis—Novel nanoscopic access to molecular mobility in constrained organic systems Knorr Jr., Daniel B.
2009
8 p. 991-1000
10 p.
artikel
96 Investigation of morphological and functional changes during neuronal differentiation of PC12 cells by combined Hopping Probe Ion Conductance Microscopy and patch-clamp technique Yang, Xi
2011
8 p. 1417-1422
6 p.
artikel
97 Investigation of photoconductivity of silicon solar cells by a near-field scanning microwave microscope Kim, Jongchel
2009
8 p. 958-962
5 p.
artikel
98 Ion beam nanopatterning and micro-Raman spectroscopy analysis on HOPG for testing FIB performances Archanjo, B.S.
2011
8 p. 1338-1342
5 p.
artikel
99 Kelvin force microscopy at the second cantilever resonance: An out-of-vacuum crosstalk compensation setup Diesinger, H.
2008
8 p. 773-781
9 p.
artikel
100 Limits in detecting an individual dopant atom embedded in a crystal Mittal, Anudha
2011
8 p. 1101-1110
10 p.
artikel
101 Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy Egerton, R.F.
2007
8 p. 575-586
12 p.
artikel
102 Local estimation of lattice constants in HRTEM images Niermann, T.
2011
8 p. 1083-1092
10 p.
artikel
103 Local work function control of indium tin oxide by micro-contact printing for electroluminescent devices Watanabe, T.
2009
8 p. 1035-1039
5 p.
artikel
104 Low adhesion, non-wetting phosphonate self-assembled monolayer films formed on copper oxide surfaces Hoque, E.
2009
8 p. 1015-1022
8 p.
artikel
105 Mapping granular structure in the biological adhesive of Phragmatopoma californica using phase diverse coherent diffractive imaging Putkunz, Corey T.
2011
8 p. 1184-1188
5 p.
artikel
106 Measurement and estimation of temperature rise in TEM sample during ion milling Park, Young Min
2007
8 p. 663-668
6 p.
artikel
107 Measurement of effective source distribution and its importance for quantitative interpretation of STEM images Dwyer, C.
2010
8 p. 952-957
6 p.
artikel
108 Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction Britton, T.B.
2011
8 p. 1395-1404
10 p.
artikel
109 Mechanisms of cell–cell adhesion identified by immunofluorescent labelling with quantum dots: A scanning near-field optical microscopy approach Walker, K.-A.D.
2011
8 p. 1200-1205
6 p.
artikel
110 MEGACELL: A nanocrystal model construction software for HRTEM multislice simulation Stroppa, Daniel G.
2011
8 p. 1077-1082
6 p.
artikel
111 MFM studies of interlayer exchange coupling in Co/Ru/Co films: Effect of Ru layer thickness Yue, Lanping
2009
8 p. 1040-1043
4 p.
artikel
112 Microelectrical characterizations of junctions in solar cell devices by scanning Kelvin probe force microscopy Jiang, C.-S.
2009
8 p. 952-957
6 p.
artikel
113 Minimization of amorphous layer in Ar+ ion milling for UHR-EM Süess, M.J.
2011
8 p. 1224-1232
9 p.
artikel
114 Molecular order affecting electron transport through ssDNA Ehlich, Rudolf
2009
8 p. 1074-1079
6 p.
artikel
115 Momentum-resolved EELS and EMCD spectra from the atomic multiplet theory: Application to magnetite Calmels, L.
2010
8 p. 1042-1045
4 p.
artikel
116 Morphological investigations of cells that adhered to the irregular patterned polydimethylsiloxane (PDMS) surface without reagents Chung, Sung Hee
2009
8 p. 861-867
7 p.
artikel
117 Nanoscale film formation of ferritin and its application to biomemory device Kim, Sang-Uk
2009
8 p. 974-979
6 p.
artikel
118 Nanotribological properties of novel lubricants for magnetic tapes Palacio, Manuel
2009
8 p. 980-990
11 p.
artikel
119 New fine structures resolved at the ELNES Ti-L 2,3 edge spectra of anatase and rutile: Comparison between experiment and calculation Cheynet, M.
2010
8 p. 1046-1053
8 p.
artikel
120 On-tip sub-micrometer Hall probes for magnetic microscopy prepared by AFM lithography Gregušová, D.
2009
8 p. 1080-1084
5 p.
artikel
121 Optimized hand fabricated AFM probes for simultaneous topographical and electrochemical tapping mode imaging Rodriguez, Raul D.
2011
8 p. 973-981
9 p.
artikel
122 Optimizing the driving scheme of a self-actuated atomic force microscope probe for high-speed applications Balantekin, M.
2011
8 p. 1388-1394
7 p.
artikel
123 Optimizing the phase shift and the cut-on periodicity of phase plates for TEM Danev, Radostin
2011
8 p. 1305-1315
11 p.
artikel
124 Organic compounds inhibiting S. epidermidis adhesion and biofilm formation Qin, Zhiqiang
2009
8 p. 881-888
8 p.
artikel
125 Orientation dependence of electron energy loss spectra and dielectric functions of Ti3SiC2 and Ti3AlC2 Hug, G.
2010
8 p. 1054-1058
5 p.
artikel
126 Pawley and Rietveld refinements using electron diffraction from L12-type intermetallic Au3Fe1−x nanocrystals during their in-situ order–disorder transition Luo, Zhiping
2011
8 p. 1295-1304
10 p.
artikel
127 Position-sensitive diffractive imaging in STEM by an automated chaining diffraction algorithm Volkov, V.V.
2008
8 p. 741-749
9 p.
artikel
128 Practical methods for the measurement of spatial coherence—A comparative study Maunders, C.
2011
8 p. 1437-1446
10 p.
artikel
129 Pragmatic reconstruction methods in atom probe tomography Vurpillot, F.
2011
8 p. 1286-1294
9 p.
artikel
130 Preface Doktycz, Mitchel J.
2009
8 p. xi-
1 p.
artikel
131 Proceedings of the 10th International Scanning Probe Microscopy (ISPM) Conference Seattle, Wa, USA, June 22–24, 2008 2009
8 p. iii-
1 p.
artikel
132 Projected thickness reconstruction from a single defocused transmission electron microscope image of an amorphous object Liu, A.C.Y.
2011
8 p. 959-968
10 p.
artikel
133 Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study Findlay, S.D.
2011
8 p. 1144-1154
11 p.
artikel
134 Quantification of small, convex particles by TEM Andersen, Sigmund J.
2008
8 p. 750-762
13 p.
artikel
135 Quantification of the Ti oxidation state in BaTi1−x Nb x O3 compounds Shao, Y.
2010
8 p. 1014-1019
6 p.
artikel
136 Quantifying surface modification events from scanning force microscopy images Roe, G.
2009
8 p. 1044-1051
8 p.
artikel
137 Quantitative amplitude and phase contrast imaging in a scanning transmission X-ray microscope Hornberger, Benjamin
2007
8 p. 644-655
12 p.
artikel
138 Quantitative analysis of carbon content in cementite in steel by atom probe tomography Takahashi, J.
2011
8 p. 1233-1238
6 p.
artikel
139 Quantitative magnetic force microscopy on permalloy dots using an iron filled carbon nanotube probe Wolny, F.
2011
8 p. 1360-1365
6 p.
artikel
140 Real space maps of magnetic moments on the atomic scale: Theory and feasibility Schattschneider, P.
2010
8 p. 1038-1041
4 p.
artikel
141 Removal of histone tails from nucleosome dissects the physical mechanisms of salt-induced aggregation, linker histone H1-induced compaction, and 30-nm fiber formation of the nucleosome array Hizume, Kohji
2009
8 p. 868-873
6 p.
artikel
142 Response analysis for identifying the origin of photo-modulated current contrasts in scanning tunneling microscopic imaging semiconductor surfaces Naruse, Nobuyasu
2007
8 p. 568-574
7 p.
artikel
143 Scanning transmission electron microscopy imaging dynamics at low accelerating voltages Lugg, N.R.
2011
8 p. 999-1013
15 p.
artikel
144 Second harmonic atomic force microscopy imaging of live and fixed mammalian cells Dulebo, Alexander
2009
8 p. 1056-1060
5 p.
artikel
145 Sensitivity of surface roughness parameters to changes in the density of scanning points in multi-scale AFM studies. Application to a biomaterial surface Méndez-Vilas, A.
2007
8 p. 617-625
9 p.
artikel
146 Shape dependence of the capacitance of scanning capacitance microscope probes Lányi, Š.
2008
8 p. 712-717
6 p.
artikel
147 Simulation of ion imaging: Sputtering, contrast, noise Castaldo, V.
2011
8 p. 982-994
13 p.
artikel
148 Simulation of partially coherent image formation in a compact soft X-ray microscope von Hofsten, Olov
2007
8 p. 604-609
6 p.
artikel
149 Site-specific fracture plane determination using the FIB/TEM Hackenberg, Robert E.
2007
8 p. 698-702
5 p.
artikel
150 Smart acquisition EELS Sader, Kasim
2010
8 p. 998-1003
6 p.
artikel
151 Spatially resolved diffractometry with atomic-column resolution Kimoto, Koji
2011
8 p. 1111-1116
6 p.
artikel
152 Spin–charge separation and electron pairing instabilities in Hubbard nanoclusters Kocharian, A.N.
2009
8 p. 1066-1073
8 p.
artikel
153 Study of the antibacterial effects of chitosans on Bacillus cereus (and its spores) by atomic force microscopy imaging and nanoindentation Fernandes, João C.
2009
8 p. 854-860
7 p.
artikel
154 Study of the crystallographic architecture of corals at the nanoscale by scanning transmission X-ray microscopy and transmission electron microscopy Benzerara, Karim
2011
8 p. 1268-1275
8 p.
artikel
155 Surface effects in the energy loss near edge structure of different cobalt oxides Zhang, Zaoli
2007
8 p. 598-603
6 p.
artikel
156 The beam divergence of an indium LMIS at a distance of 50μm as determined by plasma diagnostic measurements Vasiljevich, I.
2011
8 p. 969-972
4 p.
artikel
157 The effect of electron range on electron beam induced current collection and a simple method to extract an electron range for any generation function Lahreche, A.
2011
8 p. 1343-1351
9 p.
artikel
158 The GIF Quantum, a next generation post-column imaging energy filter Gubbens, Alexander
2010
8 p. 962-970
9 p.
artikel
159 The Manuscripts for these Proceedings were received by the Publisher: beginning of March 2009 2009
8 p. iv-
1 p.
artikel
160 The Manuscripts for these Proceedings were received by the Publisher: 17 July 2009 2010
8 p. iv-
1 p.
artikel
161 The number distribution of complex shear modulus of single cells measured by atomic force microscopy Hiratsuka, Shinichiro
2009
8 p. 937-941
5 p.
artikel
162 Theoretical analysis of the momentum-dependent loss function of bulk Ag Alkauskas, A.
2010
8 p. 1081-1086
6 p.
artikel
163 10th International Scanning Probe Microscopy Conference Seattle, Washington, USA June 22–24, 2008 2009
8 p. v-
1 p.
artikel
164 Three dimensional atom probe imaging of GaAsSb quantum rings Beltrán, A.M.
2011
8 p. 1073-1076
4 p.
artikel
165 Toward quantitative core-loss EFTEM tomography Jin-Phillipp, N.Y.
2011
8 p. 1255-1261
7 p.
artikel
166 Towards automated diffraction tomography. Part II—Cell parameter determination Kolb, U.
2008
8 p. 763-772
10 p.
artikel
167 Transmission electron microscopy at 20kV for imaging and spectroscopy Kaiser, U.
2011
8 p. 1239-1246
8 p.
artikel
168 Uncooled IR imaging using optomechanical detectors Miao, Zhengyu
2007
8 p. 610-616
7 p.
artikel
169 Unfolding study of native bacteriorhodopsin under acidic condition Kodama, Takashi
2009
8 p. 948-951
4 p.
artikel
170 Using carbon nanotube probes for high-resolution three-dimensional imaging of cells Koehne, J.E.
2011
8 p. 1155-1162
8 p.
artikel
171 Visualization of magnetic domains by near-field scanning microwave microscope Lee, Kiejin
2009
8 p. 889-893
5 p.
artikel
172 Visualization of vortex core polarity in NiFe nanodots by tilted Fresnel images Ngo, Duc-The
2011
8 p. 1276-1285
10 p.
artikel
                             172 gevonden resultaten
 
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