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                             92 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Apertureless scanning near-field fluorescence microscopy in liquids Fragola, A.
 2004
 2-4 p. 47-54
8 p.
 artikel
2 APFIM investigations on site occupancies of the ternary alloying elements Cr, Fe, and Re in NiAl Frommeyer, G.
 2004
 2-4 p. 139-148
10 p.
 artikel
3 Atomic and electronic Z-contrast effects in high-resolution imaging Bleloch, A.L.
 1994
 2-4 p. 107-115
9 p.
 artikel
4 Atomic imaging in aberration-corrected high-resolution transmission electron microscopy Chen, J.H
 2004
 2-4 p. 81-97
17 p.
 artikel
5 Atomic resolution electron microscope images formed by SiL3-ionization electrons Endoh, H.
 1994
 2-4 p. 351-356
6 p.
 artikel
6 A unique determination of boundary condition in quantitative electron diffraction: Application to accurate measurements of mean inner potentials Wu, L
 2004
 2-4 p. 135-143
9 p.
 artikel
7 Author index 2004
 2-4 p. 335-337
3 p.
 artikel
8 Author index 2004
 2-4 p. 277-278
2 p.
 artikel
9 Author index to volume 54 1994
 2-4 p. 357-359
3 p.
 artikel
10 Coherence and sampling requirements for diffractive imaging Spence, J.C.H.
 2004
 2-4 p. 149-152
4 p.
 artikel
11 Coherent inelastic scattering in Si and TiAl Moodie, Alexander F.
 2004
 2-4 p. 247-255
9 p.
 artikel
12 Comment on “Experimental and theoretical evidence for the magic angle in transmission electron energy loss spectroscopy” by H. Daniels, A. Brown, A. Scott, T. Nichells, B. Rand and R. Brydson Hébert, C.
 2004
 2-4 p. 271-273
3 p.
 artikel
13 Computer simulation of light emission by high-energy electrons in YAG single crystals Kotera, Masatoshi
 1994
 2-4 p. 293-300
8 p.
 artikel
14 Contents 2004
 2-4 p. vii-viii
nvt p.
 artikel
15 Cross-section analysis of organic light-emitting diodes Schaffer, Bernhard
 2004
 2-4 p. 123-128
6 p.
 artikel
16 Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM Wang, D
 2004
 2-4 p. 259-264
6 p.
 artikel
17 Development of real-time defocus-modulation-type active image processing (DMAIP) for spherical-aberration-free TEM observation Ando, Toshiyuki
 1994
 2-4 p. 261-267
7 p.
 artikel
18 Digital atomic force microscope Moiré method Liu, Chia-Ming
 2004
 2-4 p. 173-181
9 p.
 artikel
19 Dynamical diffraction effect on HOLZ-pattern geometry in Si-Ge alloys and determination of local lattice parameter Tomokiyo, Y.
 1994
 2-4 p. 276-285
10 p.
 artikel
20 Dynamic observation of a microelectric field in an oxide superconducting material by electron interference microscopy Ogai, Keiko
 1994
 2-4 p. 345-350
6 p.
 artikel
21 Elastic constants of Si crystal determined by thermal diffuse electron scattering Wang, Renhui
 2004
 2-4 p. 159-163
5 p.
 artikel
22 Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples Wong, W.K.
 2004
 2-4 p. 183-195
13 p.
 artikel
23 Electron beam irradiation of natural zeolites at low and room temperatures Yokota, Y.
 1994
 2-4 p. 207-214
8 p.
 artikel
24 Electron holography study on the microstructure of magnetic tunnelling junctions Xu, Q.Y
 2004
 2-4 p. 297-303
7 p.
 artikel
25 Electron microscope studies of nano-domain structures in Ru-based magneto-superconductors: RuSr2Gd1.5Ce0.5Cu2O10−δ (Ru-1222) and RuSr2GdCu2O8 (Ru-1212) Yokosawa, Tadahiro
 2004
 2-4 p. 283-295
13 p.
 artikel
26 Electron microscopy study on a new phase in β-titanium alloys aged at a high temperature Sukedai, E
 2004
 2-4 p. 209-218
10 p.
 artikel
27 Elemental mapping using the Ga 3d and In 4d transitions in the ε 2 absorption spectra derived from EELS Gass, M.H.
 2004
 2-4 p. 257-264
8 p.
 artikel
28 Erratum to: “Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy” Suzuki, Yasumasa
 2004
 2-4 p. 275-
1 p.
 artikel
29 Field emission ultrahigh-resolution analytical electron microscope Honda, T.
 1994
 2-4 p. 132-144
13 p.
 artikel
30 Growth of compound single- and multi-walled carbon nanotubes Peng, L.-M.
 2004
 2-4 p. 195-200
6 p.
 artikel
31 Growth of dendritic and needle tungsten oxide crystals studied by high-resolution electron microscopy Kumao, Akihiro
 1994
 2-4 p. 201-206
6 p.
 artikel
32 High-resolution electron holography with the CM30FEG-special Tübingen Lichte, H.
 1994
 2-4 p. 310-316
7 p.
 artikel
33 High-resolution electron microscopy of Cu/MgO and Pd/MgO interfaces Chen, F.R.
 1994
 2-4 p. 179-191
13 p.
 artikel
34 High-resolution scanning tunneling microscopy for molecules Li, Bin
 2004
 2-4 p. 317-334
18 p.
 artikel
35 High-resolution transmission electron microscopy investigation of interfaces in metal-silicon systems Chen, L.J.
 1994
 2-4 p. 156-165
10 p.
 artikel
36 HREM, FIM and tomographic atom probe investigation of Guinier–Preston zones in an Al–1.54at% Cu alloy Karlı́k, M.
 2004
 2-4 p. 219-230
12 p.
 artikel
37 HRTEM analysis of nanocrystallization during uniaxial compression of a bulk metallic glass at room temperature Deng, Y.F
 2004
 2-4 p. 201-208
8 p.
 artikel
38 Hunting the Stobbs factor Howie, A
 2004
 2-4 p. 73-79
7 p.
 artikel
39 IFC (Editorial Board) 2004
 2-4 p. IFC-
1 p.
 artikel
40 IFC (Editorial Board) 2004
 2-4 p. IFC-
1 p.
 artikel
41 Incommensurate modulation in minute crystals revealed by combining high-resolution electron microscopy and electron diffraction Fu, Z.Q.
 1994
 2-4 p. 229-236
8 p.
 artikel
42 In honor of professor Fang-Hua Li Zou, Jin
 2004
 2-4 p. iii-
1 p.
 artikel
43 In-situ dynamic high-resolution transmission electron microscopy: application to Pt/GaAs interfacial reactions Ko, Dae-Hong
 1994
 2-4 p. 166-178
13 p.
 artikel
44 Intensity distribution of scintillation produced by high-energy electrons Kamiya, Yoshihiro
 1994
 2-4 p. 286-292
7 p.
 artikel
45 Investigation of atomic structure of ω-phase crystals in Ti-Mo alloys using high-resolution electron microscopy Sukedai, E.
 1994
 2-4 p. 192-200
9 p.
 artikel
46 Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theory Lazar, S.
 2004
 2-4 p. 249-257
9 p.
 artikel
47 Investigation of oxide tunnel barriers by atom probe tomography (TAP) Kuduz, Mario
 2004
 2-4 p. 197-205
9 p.
 artikel
48 Lorentz phase microscopy of magnetic materials Volkov, V.V
 2004
 2-4 p. 271-281
11 p.
 artikel
49 Low-energy (<50 eV) secondary electron separator for nm-scale SE spectroscopy and imaging in STEM Tomita, M.
 1994
 2-4 p. 125-131
7 p.
 artikel
50 Microscopy, mathematics, measurements and Moses Hawkes, P.W.
 2004
 2-4 p. 73-103
31 p.
 artikel
51 Microstructural analyses of advanced inorganic materials Thomas, Gareth
 1994
 2-4 p. 145-155
11 p.
 artikel
52 Model based quantification of EELS spectra Verbeeck, J.
 2004
 2-4 p. 207-224
18 p.
 artikel
53 Multi-slice calculation for InP crystals using different slices Nishio, Koji
 1994
 2-4 p. 301-309
9 p.
 artikel
54 Nanofabrication of cylindrical STEM specimen of InGaAs/GaAs quantum dots for 3D-STEM observation Ozasa, Kazunari
 2004
 2-4 p. 55-61
7 p.
 artikel
55 Nanosurgery: observation of peptidoglycan strands in Lactobacillus helveticus cell walls Firtel, Max
 2004
 2-4 p. 105-109
5 p.
 artikel
56 Normalizing projection images: a study of image normalizing procedures for single particle three-dimensional electron microscopy Sorzano, C.O.S.
 2004
 2-4 p. 129-138
10 p.
 artikel
57 [No title] Hashimoto, Hatsujiro
 2004
 2-4 p. v-vi
nvt p.
 artikel
58 Observation of lattice fringes in convergent-beam electron diffraction patterns Terauchi, Masami
 1994
 2-4 p. 268-275
8 p.
 artikel
59 Off-axis electron holography with a dual-lens imaging system and its usefulness in 2-D potential mapping of semiconductor devices Wang, Y.Y.
 2004
 2-4 p. 63-72
10 p.
 artikel
60 Off-axis electron holography without Fresnel fringes Yamamoto, Kazuo
 2004
 2-4 p. 265-269
5 p.
 artikel
61 Phase-contrast visualization of an undecagold cluster by in-line electron holography Matsumoto, Takao
 1994
 2-4 p. 317-334
18 p.
 artikel
62 Photograph of Prof. Fang-Hua Li 2004
 2-4 p. iv-
1 p.
 artikel
63 Preface Whelan, M.J.
 1994
 2-4 p. 99-104
6 p.
 artikel
64 Quantitative evaluation of phasons in octagonal quasicrystals by high-resolution electron microscopy Jiang, J.C.
 1994
 2-4 p. 215-220
6 p.
 artikel
65 Quantitative high-resolution electron microscopy of a high-T c superconductor Tl2Ba2Cu1O y with the imaging plate Shindo, D.
 1994
 2-4 p. 221-228
8 p.
 artikel
66 Quantitative high-resolution HAADF–STEM analysis of inversion boundaries in Sb2O3-doped zinc oxide Yamazaki, T
 2004
 2-4 p. 305-316
12 p.
 artikel
67 Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200kev Li, P.
 2004
 2-4 p. 161-172
12 p.
 artikel
68 Randomization of heavily damaged regions in annealed low energy Ge+-implanted (001)Si Lin, H.H.
 2004
 2-4 p. 265-269
5 p.
 artikel
69 Reconstruction of electron off-axis holograms: a new and fast alternative method Lehmann, Michael
 1994
 2-4 p. 335-344
10 p.
 artikel
70 Refinement in quantitative convergent beam electron diffraction (QCBED) Feng, F.
 2004
 2-4 p. 173-185
13 p.
 artikel
71 Resolution extension and exit wave reconstruction in complex HREM Hsieh, Wen-Kuo
 2004
 2-4 p. 99-114
16 p.
 artikel
72 Role of multipole moment of the probe in apertureless near-field optical microscopy Sukhov, S.V.
 2004
 2-4 p. 111-122
12 p.
 artikel
73 Scanning tunneling microscopic studies of surface reconstructed structures for metal/Si(100) systems Ichinokawa, T.
 1994
 2-4 p. 116-124
9 p.
 artikel
74 Spherical-aberration-free observation of profile images of the Au(011) surface by defocus-modulation image processing Takai, Yoshizo
 1994
 2-4 p. 250-260
11 p.
 artikel
75 Structural study of new hydrocarbon nano-crystals by energy-filtered electron diffraction Wu, J.S
 2004
 2-4 p. 145-150
6 p.
 artikel
76 Subject guide 2004
 2-4 p. 339-340
2 p.
 artikel
77 Subject guide 2004
 2-4 p. 279-280
2 p.
 artikel
78 Subject guide to volume 54 1994
 2-4 p. 360-
1 p.
 artikel
79 Subject index 2004
 2-4 p. 341-343
3 p.
 artikel
80 Subject index 2004
 2-4 p. 281-283
3 p.
 artikel
81 Subject index to volume 54 1994
 2-4 p. 361-363
3 p.
 artikel
82 Surface charge compensation for a highly charged ion emission microscope McDonald, J.W.
 2004
 2-4 p. 225-229
5 p.
 artikel
83 Surface crystallography via electron microscopy Subramanian, A.
 2004
 2-4 p. 151-157
7 p.
 artikel
84 TEM study of the structural dependence of the epitaxial passive oxide films on crystal facets in polyhedral nanoparticles of chromium Rao, J.C
 2004
 2-4 p. 231-238
8 p.
 artikel
85 The contribution of phonon scattering to high-resolution images measured by off-axis electron holography Boothroyd, C.B
 2004
 2-4 p. 115-133
19 p.
 artikel
86 The effect of inelastic scattering on crystal structure refinement from electron diffraction patterns recorded under almost parallel illumination Jansen, J.
 2004
 2-4 p. 165-172
8 p.
 artikel
87 The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects Zhang, X.B.
 1994
 2-4 p. 237-249
13 p.
 artikel
88 Thermal AFM: a thermopile case study Fonseca, L.
 2004
 2-4 p. 153-159
7 p.
 artikel
89 Tip to substrate distances in STM imaging of biomolecules Alliata, Dario
 2004
 2-4 p. 231-240
10 p.
 artikel
90 TRICE – A program for reconstructing 3D reciprocal space and determining unit-cell parameters Zou, Xiaodong
 2004
 2-4 p. 187-193
7 p.
 artikel
91 Ultimate performance of objective magnetic lens Alamir, A.S.A.
 2004
 2-4 p. 241-246
6 p.
 artikel
92 [001] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(001) Liao, X.Z
 2004
 2-4 p. 239-247
9 p.
 artikel
                             92 gevonden resultaten
 
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