| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A combined environmental straining specimen holder for high-voltage electron microscopy
|
Takahashi, Yoshimasa
|
|
2010
|
|
11 |
p. 1420-1427
8 p.
|
artikel
|
| 2 |
Advanced thin film technology for ultrahigh resolution X-ray microscopy
|
Vila-Comamala, Joan
|
|
2009
|
|
11 |
p. 1360-1364
5 p.
|
artikel
|
| 3 |
Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching
|
Wu, Guilin
|
|
2009
|
|
11 |
p. 1317-1325
9 p.
|
artikel
|
| 4 |
Analysis of defects on BN nano-structures using high-resolution electron microscopy and density-functional calculations
|
Bengu, Erman
|
|
2008
|
|
11 |
p. 1484-1489
6 p.
|
artikel
|
| 5 |
Analysis of InAsN quantum dots by transmission electron microscopy and photoluminescence
|
Hsu, Chiung-Chih
|
|
2008
|
|
11 |
p. 1495-1499
5 p.
|
artikel
|
| 6 |
Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopes
|
Intaraprasonk, Varat
|
|
2008
|
|
11 |
p. 1454-1466
13 p.
|
artikel
|
| 7 |
A new model for investigating the flexural vibration of an atomic force microscope cantilever
|
Abbasi, Mohammad
|
|
2010
|
|
11 |
p. 1374-1379
6 p.
|
artikel
|
| 8 |
Annular electron energy-loss spectroscopy in the scanning transmission electron microscope
|
Ruben, Gary
|
|
2011
|
|
11 |
p. 1540-1546
7 p.
|
artikel
|
| 9 |
A quantitative procedure to probe for compositional inhomogeneities in In x Ga1− x N alloys
|
Bartel, T.P.
|
|
2008
|
|
11 |
p. 1420-1426
7 p.
|
artikel
|
| 10 |
Are electron tweezers possible?
|
Oleshko, Vladimir P.
|
|
2011
|
|
11 |
p. 1599-1606
8 p.
|
artikel
|
| 11 |
A systematic approach to choosing parameters for modelling fine structure in electron energy-loss spectroscopy
|
Seabourne, Che R.
|
|
2009
|
|
11 |
p. 1374-1388
15 p.
|
artikel
|
| 12 |
Automated monitoring to reduce electron microscope downtime
|
Brunner, Matthias J.
|
|
2009
|
|
11 |
p. 1389-1392
4 p.
|
artikel
|
| 13 |
Calculated loss function of C60: The effect of bond length
|
Nicholls, R.J.
|
|
2008
|
|
11 |
p. 1476-1477
2 p.
|
artikel
|
| 14 |
Calculation of aberration coefficients by ray tracing
|
Oral, M.
|
|
2009
|
|
11 |
p. 1365-1373
9 p.
|
artikel
|
| 15 |
Charge compensation by in-situ heating for insulating ceramics in scanning electron microscope
|
Wang, Li
|
|
2009
|
|
11 |
p. 1326-1332
7 p.
|
artikel
|
| 16 |
Coherent and incoherent effects on the imaging and scattering process in transmission electron microscopy and off-axis electron holography
|
Koch, Werner
|
|
2010
|
|
11 |
p. 1397-1403
7 p.
|
artikel
|
| 17 |
Coherent Bremsstrahlung effect observed during STEM analysis of dopant distribution in silicon devices using large area silicon drift EDX detectors and high brightness electron source
|
Pantel, R.
|
|
2011
|
|
11 |
p. 1607-1618
12 p.
|
artikel
|
| 18 |
Coherent microscopy by laser optical feedback imaging (LOFI) technique
|
Hugon, O.
|
|
2011
|
|
11 |
p. 1557-1563
7 p.
|
artikel
|
| 19 |
Contents
|
|
|
2008
|
|
11 |
p. vii-
1 p.
|
artikel
|
| 20 |
Deconvolution of core electron energy loss spectra
|
Verbeeck, J.
|
|
2009
|
|
11 |
p. 1343-1352
10 p.
|
artikel
|
| 21 |
Defocus estimation from stroboscopic cryo-electron microscopy data
|
Karimi Nejadasl, Fatemeh
|
|
2011
|
|
11 |
p. 1592-1598
7 p.
|
artikel
|
| 22 |
Design of an aberration corrected low-voltage SEM
|
van Aken, R.H.
|
|
2010
|
|
11 |
p. 1411-1419
9 p.
|
artikel
|
| 23 |
Double aberration correction in a low-energy electron microscope
|
Schmidt, Th.
|
|
2010
|
|
11 |
p. 1358-1361
4 p.
|
artikel
|
| 24 |
Dynamic reconstruction for atom probe tomography
|
Gault, Baptiste
|
|
2011
|
|
11 |
p. 1619-1624
6 p.
|
artikel
|
| 25 |
Extracting physically interpretable data from electron energy-loss spectra
|
Witte, C.
|
|
2010
|
|
11 |
p. 1390-1396
7 p.
|
artikel
|
| 26 |
Fast three-dimensional nanoscale metrology in dual-beam FIB–SEM instrumentation
|
Repetto, Luca
|
|
2009
|
|
11 |
p. 1338-1342
5 p.
|
artikel
|
| 27 |
FEMMS 2007
|
|
|
2008
|
|
11 |
p. iii-
1 p.
|
artikel
|
| 28 |
High-frequency electromagnetic dynamics properties of THP1 cells using scanning microwave microscopy
|
Oh, Yoo Jin
|
|
2011
|
|
11 |
p. 1625-1629
5 p.
|
artikel
|
| 29 |
IFC (Editorial Board)
|
|
|
2008
|
|
11 |
p. IFC-
1 p.
|
artikel
|
| 30 |
IFC (Editorial Board)
|
|
|
2010
|
|
11 |
p. IFC-
1 p.
|
artikel
|
| 31 |
IFC (Editorial Board)
|
|
|
2009
|
|
11 |
p. IFC-
1 p.
|
artikel
|
| 32 |
IFC (Editorial Board)
|
|
|
2011
|
|
11 |
p. IFC-
1 p.
|
artikel
|
| 33 |
Image simulations of kinked vortices for transmission electron microscopy
|
Beleggia, M.
|
|
2010
|
|
11 |
p. 1428-1433
6 p.
|
artikel
|
| 34 |
Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy
|
Hermann, Peter
|
|
2011
|
|
11 |
p. 1630-1635
6 p.
|
artikel
|
| 35 |
Immobilisation of living bacteria for AFM imaging under physiological conditions
|
Louise Meyer, Rikke
|
|
2010
|
|
11 |
p. 1349-1357
9 p.
|
artikel
|
| 36 |
In situ dynamic HR-TEM and EELS study on phase transitions of Ge2Sb2Te5 chalcogenides
|
Song, Se Ahn
|
|
2008
|
|
11 |
p. 1408-1419
12 p.
|
artikel
|
| 37 |
In situ environmental TEM studies of dynamic changes in cerium-based oxides nanoparticles during redox processes
|
Crozier, Peter A.
|
|
2008
|
|
11 |
p. 1432-1440
9 p.
|
artikel
|
| 38 |
Introducing measure-by-wire, the systematic use of systems and control theory in transmission electron microscopy
|
Tejada, Arturo
|
|
2011
|
|
11 |
p. 1581-1591
11 p.
|
artikel
|
| 39 |
KSpaceNavigator as a tool for computer-assisted sample tilting in high-resolution imaging, tomography and defect analysis
|
Duden, T.
|
|
2011
|
|
11 |
p. 1574-1580
7 p.
|
artikel
|
| 40 |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy
|
Van Aert, S.
|
|
2010
|
|
11 |
p. 1404-1410
7 p.
|
artikel
|
| 41 |
Measurement method of aberration from Ronchigram by autocorrelation function
|
Sawada, H.
|
|
2008
|
|
11 |
p. 1467-1475
9 p.
|
artikel
|
| 42 |
Micro-fabricated mechanical sensors for lateral molecular-force microscopy
|
Vicary, J.A.
|
|
2011
|
|
11 |
p. 1547-1552
6 p.
|
artikel
|
| 43 |
Multivariate statistical analysis of atom probe tomography data
|
Parish, Chad M.
|
|
2010
|
|
11 |
p. 1362-1373
12 p.
|
artikel
|
| 44 |
Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)
|
LaGrange, Thomas
|
|
2008
|
|
11 |
p. 1441-1449
9 p.
|
artikel
|
| 45 |
Nature's infinite books of secrecy
|
Hawkes, Peter
|
|
2009
|
|
11 |
p. 1393-1410
18 p.
|
artikel
|
| 46 |
Non-monotonic material contrast in scanning ion and scanning electron images
|
Giannuzzi, L.A.
|
|
2011
|
|
11 |
p. 1564-1573
10 p.
|
artikel
|
| 47 |
On the optimum probe in aberration corrected ADF-STEM
|
Kirkland, Earl J.
|
|
2011
|
|
11 |
p. 1523-1530
8 p.
|
artikel
|
| 48 |
Optimized Ar+-ion milling procedure for TEM cross-section sample preparation
|
Dieterle, Levin
|
|
2011
|
|
11 |
p. 1636-1644
9 p.
|
artikel
|
| 49 |
Preface
|
Bradley, Steven A.
|
|
2008
|
|
11 |
p. v-
1 p.
|
artikel
|
| 50 |
Probing non-dipole allowed excitations in highly correlated materials with nanoscale resolution
|
Gloter, Alexandre
|
|
2009
|
|
11 |
p. 1333-1337
5 p.
|
artikel
|
| 51 |
Quantitative electron holographic tomography for the 3D characterisation of semiconductor device structures
|
Twitchett-Harrison, Alison C.
|
|
2008
|
|
11 |
p. 1401-1407
7 p.
|
artikel
|
| 52 |
Reciprocal and real space maps for EMCD experiments
|
Lidbaum, Hans
|
|
2010
|
|
11 |
p. 1380-1389
10 p.
|
artikel
|
| 53 |
Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory
|
Musumeci, P.
|
|
2008
|
|
11 |
p. 1450-1453
4 p.
|
artikel
|
| 54 |
TEM analyses of synthetic anti-ferromagnetic (SAF) nanoparticles fabricated using different release layers
|
Koh, Ai Leen
|
|
2008
|
|
11 |
p. 1490-1494
5 p.
|
artikel
|
| 55 |
TEM sample preparation by FIB for carbon nanotube interconnects
|
Ke, Xiaoxing
|
|
2009
|
|
11 |
p. 1353-1359
7 p.
|
artikel
|
| 56 |
The development of a glove-box/Vitrobot combination: Air–water interface events visualized by cryo-TEM
|
Vos, Matthijn R.
|
|
2008
|
|
11 |
p. 1478-1483
6 p.
|
artikel
|
| 57 |
The effect of vacancies on the annular dark field image contrast of grain boundaries: A SrTiO3 case study
|
Lee, H.-S.
|
|
2011
|
|
11 |
p. 1531-1539
9 p.
|
artikel
|
| 58 |
The Manuscripts for these Proceedings were received by the Publisher: mid-June 2008
|
|
|
2008
|
|
11 |
p. iv-
1 p.
|
artikel
|
| 59 |
The role of Poisson's binomial distribution in the analysis of TEM images
|
Tejada, Arturo
|
|
2011
|
|
11 |
p. 1553-1556
4 p.
|
artikel
|
| 60 |
X-ray analysis and mapping by wavelength dispersive X-ray spectroscopy in an electron microscope
|
Tanaka, Miyoko
|
|
2008
|
|
11 |
p. 1427-1431
5 p.
|
artikel
|
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