| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Calendar
|
|
|
2006
|
64 |
2 |
p. 164-
1 p.
|
artikel
|
| 2 |
Dynamic temperature rise of shielded MR sensors during simulated electrostatic discharge pulses of variable pulse width
|
Iben, Icko Eric Timothy
|
|
2006
|
64 |
2 |
p. 151-163
13 p.
|
artikel
|
| 3 |
Editorial Board
|
|
|
2006
|
64 |
2 |
p. CO2-
1 p.
|
artikel
|
| 4 |
Effects of ESD transients on noise in tunneling recording heads
|
Baril, Lydia
|
|
2006
|
64 |
2 |
p. 147-150
4 p.
|
artikel
|
| 5 |
Electrostatic field limits and charge threshold for field-induced damage to voltage susceptible devices
|
Paasi, Jaakko
|
|
2006
|
64 |
2 |
p. 128-136
9 p.
|
artikel
|
| 6 |
ESD design automation & methodology to prevent CDM failures in 130 & 90nm ASIC design systems
|
Brennan, Ciaran J.
|
|
2006
|
64 |
2 |
p. 112-127
16 p.
|
artikel
|
| 7 |
ESD protection of single output buffers in advanced CMOS technologies
|
Khazhinsky, Michael G.
|
|
2006
|
64 |
2 |
p. 137-146
10 p.
|
artikel
|
| 8 |
Evaluation of ESD hardness of fingerprint sensor LSIs
|
Shimoyama, Nobuhiro
|
|
2006
|
64 |
2 |
p. 96-103
8 p.
|
artikel
|
| 9 |
High voltage tolerant on-chip ESD protection in low-voltage BiCMOS process
|
Vashchenko, V.A.
|
|
2006
|
64 |
2 |
p. 104-111
8 p.
|
artikel
|
| 10 |
InGaP/GaAs HBT DC-20GHz distributed amplifier with compact ESD protection circuits
|
Ma, Yintat
|
|
2006
|
64 |
2 |
p. 88-95
8 p.
|
artikel
|
| 11 |
[No title]
|
Greason, William D.
|
|
2006
|
64 |
2 |
p. 71-
1 p.
|
artikel
|
| 12 |
Optimization of broadband RF performance and ESD robustness by π -model distributed ESD protection scheme
|
Ker, Ming-Dou
|
|
2006
|
64 |
2 |
p. 80-87
8 p.
|
artikel
|
| 13 |
Soft ESD phenomena in GMR heads in the HDD manufacturing process
|
Mizoh, Yoshiaki
|
|
2006
|
64 |
2 |
p. 72-79
8 p.
|
artikel
|
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