| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A study of shunt ESD protection for GMR recording heads
|
Wallash, Al
|
|
2002
|
56 |
3 |
p. 295-302
8 p.
|
artikel
|
| 2 |
Broadband measurement of ESD risetimes to distinguish between different discharge mechanisms
|
Bönisch, Sven
|
|
2002
|
56 |
3 |
p. 363-383
21 p.
|
artikel
|
| 3 |
Calendar
|
|
|
2002
|
56 |
3 |
p. 415-416
2 p.
|
artikel
|
| 4 |
Editorial Board
|
|
|
2002
|
56 |
3 |
p. IFC-
1 p.
|
artikel
|
| 5 |
ESD evaluation of a low voltage triggering SCR (LVTSCR) device submitted to transmission line pulse (TLP) test
|
Guilhaume, A
|
|
2002
|
56 |
3 |
p. 281-294
14 p.
|
artikel
|
| 6 |
Field emission noise caused by capacitance coupling ESD in AMR/GMR heads
|
Ohtsu, Takayoshi
|
|
2002
|
56 |
3 |
p. 303-309
7 p.
|
artikel
|
| 7 |
[No title]
|
Greason, W.D
|
|
2002
|
56 |
3 |
p. 279-
1 p.
|
artikel
|
| 8 |
Silicon germanium heterojunction bipolar transistor electrostatic discharge power clamps and the Johnson Limit in RF BICMOS SiGe technology
|
Voldman, Steven H
|
|
2002
|
56 |
3 |
p. 341-362
22 p.
|
artikel
|
| 9 |
Study of charge transfer effects using ballistic method
|
Greason, William D
|
|
2002
|
56 |
3 |
p. 385-398
14 p.
|
artikel
|
| 10 |
The application of transmission line pulse testing for the ESD analysis of integrated circuits
|
Smedes, T
|
|
2002
|
56 |
3 |
p. 399-414
16 p.
|
artikel
|
| 11 |
Transmission line pulse ESD testing of giant magnetoresistive recording heads
|
Wallash, Al
|
|
2002
|
56 |
3 |
p. 331-339
9 p.
|
artikel
|
| 12 |
Using thin emitters to control BVce0 effects in punch-through diodes for ESD protection
|
van Dalen, R
|
|
2002
|
56 |
3 |
p. 311-329
19 p.
|
artikel
|
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