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Journal description
All volumes of the corresponding journal
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All articles of the corresponding issues
10 results found
no
title
author
magazine
year
volume
issue
page(s)
type
1
Editorial
1999
47
4
p. 199-
1 p.
article
2
Electrostatic discharges from charged spheres approaching a grounded surface
Dascalescu, Lucian
1999
47
4
p. 249-259
11 p.
article
3
EOS analysis of soldering iron tip voltage
Baumgartner, G.
1999
47
4
p. 261-275
15 p.
article
4
How to safely apply the LVTSCR for CMOS whole-chip ESD protection without being accidentally triggered on
Ker, Ming-Dou
1999
47
4
p. 215-248
34 p.
article
5
Index
1999
47
4
p. 319-320
2 p.
article
6
Index
1999
47
4
p. 317-318
2 p.
article
7
Influence of the device package on the results of charged device model (CDM) tests — consequences for tester characterization and test procedure
Brodbeck, Tilo
1999
47
4
p. 277-289
13 p.
article
8
Ion milling-induced ESD damage during MR head fabrication
Olson, David H
1999
47
4
p. 291-304
14 p.
article
9
Measurement of the effects of ionizer imbalance and proximity to ground in MR head handling
Levit, Larry
1999
47
4
p. 305-313
9 p.
article
10
New injection moldable electrostatic dissipative (ESD) composites based on very low carbon black loadings
Narkis, Moshe
1999
47
4
p. 201-214
14 p.
article
10 results found
Koninklijke Bibliotheek -
National Library of the Netherlands