| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Angle-resolved ultraviolet photoelectron microspectroscopy
|
Meister, G
|
|
1997
|
84 |
1-3 |
p. 1-7
7 p.
|
artikel
|
| 2 |
A photoemission microscope with a hemispherical capacitor energy filter
|
Tonner, B.P
|
|
1997
|
84 |
1-3 |
p. 211-229
19 p.
|
artikel
|
| 3 |
Applications for small photoelectron emission microscopes
|
Montei, E.L
|
|
1997
|
84 |
1-3 |
p. 129-136
8 p.
|
artikel
|
| 4 |
Comparative magnetic-field imaging, electric-field imaging, and scanning Auger microscopy study of metal–matrix composites
|
Ma, Qing
|
|
1997
|
84 |
1-3 |
p. 99-107
9 p.
|
artikel
|
| 5 |
ESCA Microscopy at ELETTRA: what it is like to perform spectromicroscopy experiments on a third generation synchrotron radiation source
|
Marsi, M
|
|
1997
|
84 |
1-3 |
p. 73-83
11 p.
|
artikel
|
| 6 |
High-resolution X-ray absorption microspectroscopy of lamellar phases in natural ilmenite
|
Droubay, T
|
|
1997
|
84 |
1-3 |
p. 159-169
11 p.
|
artikel
|
| 7 |
Imaging of magnetic domains by photoemission microscopy
|
Hillebrecht, F.U
|
|
1997
|
84 |
1-3 |
p. 189-200
12 p.
|
artikel
|
| 8 |
Multipole WIEN-filter for a high-resolution X-PEEM
|
Marx, G.K.L
|
|
1997
|
84 |
1-3 |
p. 251-261
11 p.
|
artikel
|
| 9 |
Photoelectron spectromicroscopy as a microchemical probe of high temperature superconductors
|
Hwu, Y
|
|
1997
|
84 |
1-3 |
p. 149-158
10 p.
|
artikel
|
| 10 |
Photoelectron spectromicroscopy with synchrotron radiation: applications to neurobiology
|
De Stasio, Gelsomina
|
|
1997
|
84 |
1-3 |
p. 137-147
11 p.
|
artikel
|
| 11 |
PISAM: a photon-induced scanning Auger microscope
|
Weiss, M.R
|
|
1997
|
84 |
1-3 |
p. 9-28
20 p.
|
artikel
|
| 12 |
Recent progress in photoemission microscopy with emphasis on chemical and magnetic sensitivity
|
Swiech, W
|
|
1997
|
84 |
1-3 |
p. 171-188
18 p.
|
artikel
|
| 13 |
SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II
|
Fink, R.
|
|
1997
|
84 |
1-3 |
p. 231-250
20 p.
|
artikel
|
| 14 |
Soft X-ray spectromicroscopy development for materials science at the Advanced Light Source
|
Warwick, Tony
|
|
1997
|
84 |
1-3 |
p. 85-98
14 p.
|
artikel
|
| 15 |
Spectromicroscopy and chemical imaging by laterally-resolved ESCA
|
Coluzza, C
|
|
1997
|
84 |
1-3 |
p. 109-127
19 p.
|
artikel
|
| 16 |
Spectromicroscopy in a low energy electron microscope
|
Bauer, E
|
|
1997
|
84 |
1-3 |
p. 201-209
9 p.
|
artikel
|
| 17 |
Thermal desorption of oxides on Si(100): a case study for the scanning photoelectron microscope at MAX-LAB
|
Johansson, U
|
|
1997
|
84 |
1-3 |
p. 45-52
8 p.
|
artikel
|
| 18 |
The scanning soft X-ray microscope at Hasylab: imaging and spectroscopy of photoelectrons, photoluminescence, desorbed ions, reflected, scattered and transmitted light
|
Voss, J
|
|
1997
|
84 |
1-3 |
p. 29-44
16 p.
|
artikel
|
| 19 |
X-ray spectromicroscopy of polymers and tribological surfaces at beamline X1A at the NSLS
|
Ade, H
|
|
1997
|
84 |
1-3 |
p. 53-72
20 p.
|
artikel
|
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