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                             8 results found
no title author magazine year volume issue page(s) type
1 A critical investigation of XPS predicted proton affinities Nordfors, David
1991
56 3 p. 167-187
21 p.
article
2 Iodine incorporation into polymeric films investigated by angle-resolved XPS Baschenko, O.A.
1991
56 3 p. 203-209
7 p.
article
3 Methanol: A critical test of intensity models for molecular soft X-ray emission Ågren, Hans
1991
56 3 p. 259-271
13 p.
article
4 NEWDTP 2.2: A versatile system for routine XPS data acquisition and analysis Desimoni, E.
1991
56 3 p. 189-201
13 p.
article
5 Photoelectron attenuation lengths and thermal broadening in GaAs(110) Schabel, M.C.
1991
56 3 p. 211-216
6 p.
article
6 The high resolution inner-valence photoelectron spectrum of H2S induced by monochromatic A1 Kα X-rays Adam, M.Y.
1991
56 3 p. 241-257
17 p.
article
7 XPS core level spectra and Auger parameters for some silver compounds Kaushik, Vijay Kumar
1991
56 3 p. 273-277
5 p.
article
8 X-ray photoelectron spectroscopy study of Sr and Ba compounds Vasquez, R.P.
1991
56 3 p. 217-240
24 p.
article
                             8 results found
 
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