|
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
7 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data |
Machida, Atsushi |
|
273 | C |
p. |
article |
|
| 2 | Corrigendum to “An extreme ultraviolet 2e-ARPES setup based on dual time-of-flight analyzers”[J. Electron Spectrosc. Relat. Phenom. 270 (2024) 147417] |
Zwettler, Jack |
|
273 | C |
p. |
article |
|
| 3 | Corrigendum to “Dissociative electron attachment to 1- and 9-chloroanthracene in the gas phase” [J. Electron Spectrosc. Relat. Phenom. 267 (2023) 147383] |
Asfandiarov, N.L. |
|
273 | C |
p. |
article |
|
| 4 | Editorial Board |
|
273 | C |
p. |
article |
||
| 5 | Electron screening length identifying circular dichroism of photoemission |
Jeon, Jiwon |
|
273 | C |
p. |
article |
|
| 6 | Introduction to special issue on X-ray spectromicroscopy |
Hitchcock, Adam P. |
|
273 | C |
p. |
article |
|
| 7 | Photoelectron angular distribution of benzene: Can the asymmetry parameter be considered a benchmark? |
Ribas, M.H. |
|
273 | C |
p. |
article |
7 results found