| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Acquisition of the dopant contrast in semiconductors with slow electrons
|
Frank, L.
|
|
|
241 |
C |
p.
|
artikel
|
| 2 |
Analysis and detection of low-energy electrons in scanning electron microscopes using a Bessel box electron energy analyser
|
Suri, Ashish
|
|
|
241 |
C |
p.
|
artikel
|
| 3 |
Editorial Board
|
|
|
|
241 |
C |
p.
|
artikel
|
| 4 |
Electron optical characterization of a graphene coated nickel electron source
|
Shao, Xiuyuan
|
|
|
241 |
C |
p.
|
artikel
|
| 5 |
Entanglement and entropy in electron–electron scattering
|
Schattschneider, P.
|
|
|
241 |
C |
p.
|
artikel
|
| 6 |
Field emission from a nanometric paraboloidal emitter
|
Chatziafratis, A.
|
|
|
241 |
C |
p.
|
artikel
|
| 7 |
Field emission properties of single crystalline W5O14 and W18O49 nanowires
|
Saqib, Muhammad
|
|
|
241 |
C |
p.
|
artikel
|
| 8 |
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
|
Materna Mikmeková, E.
|
|
|
241 |
C |
p.
|
artikel
|
| 9 |
Low energy (1–100 eV) electron inelastic mean free path (IMFP) values determined from analysis of secondary electron yields (SEY) in the incident energy range of 0.1–10 keV
|
Ridzel, Olga Yu.
|
|
|
241 |
C |
p.
|
artikel
|
| 10 |
Low-secondary electron emission yield under electron bombardment of microstructured surfaces, looking for multipactor effect suppression
|
Montero, Isabel
|
|
|
241 |
C |
p.
|
artikel
|
| 11 |
Measurement of charge density in nanoscale materials using off-axis electron holography
|
Zheng, Fengshan
|
|
|
241 |
C |
p.
|
artikel
|
| 12 |
Modelling a capped carbon nanotube by linear-scaling density-functional theory
|
Masur, S.M.
|
|
|
241 |
C |
p.
|
artikel
|
| 13 |
On the timescales of correlated electron dynamics
|
Schumann, F.O.
|
|
|
241 |
C |
p.
|
artikel
|
| 14 |
Optical and electronic properties of amorphous silicon dioxide by single and double electron spectroscopy
|
Astašauskas, Vytautas
|
|
|
241 |
C |
p.
|
artikel
|
| 15 |
Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)
|
Bertolini, G.
|
|
|
241 |
C |
p.
|
artikel
|
| 16 |
Secondary electron generation mechanisms in carbon allotropes at low impact electron energies
|
Bellissimo, Alessandra
|
|
|
241 |
C |
p.
|
artikel
|
| 17 |
SEY and low-energy SEY of conductive surfaces
|
Cimino, R.
|
|
|
241 |
C |
p.
|
artikel
|
| 18 |
Sources Interaction with Matter, Detection and Analysis of Low Energy Electrons
|
Werner, Wolfgang S.M.
|
|
|
241 |
C |
p.
|
artikel
|
| 19 |
Spectra of correlated many-electron systems: From a one- to a two-particle description
|
Rohringer, Georg
|
|
|
241 |
C |
p.
|
artikel
|
| 20 |
Spin-orbit coupling in scattering of very low-energy spin-polarized electrons from Co film by (e,2e) spectroscopy
|
Williams, J.F.
|
|
|
241 |
C |
p.
|
artikel
|
| 21 |
Surface microscopy with low energy electrons: LEEM
|
Bauer, Ernst
|
|
|
241 |
C |
p.
|
artikel
|
| 22 |
Time-of-flight spectrometer for efficient coincidence detection of low-energy electrons from surfaces with 2π solid angle, pair recognition and unlimited band path (2e2πCS)
|
Voss, S.
|
|
|
241 |
C |
p.
|
artikel
|
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