nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A high-temperature photoelectron spectrometer
|
Allen Jr., John D. |
|
1973 |
2 |
3 |
p. 289-294 6 p. |
artikel |
2 |
Alkene ionization potentials
|
Masclet, P. |
|
1973 |
2 |
3 |
p. 225-237 13 p. |
artikel |
3 |
Calibration of electron spectra
|
Johansson, G. |
|
1973 |
2 |
3 |
p. 295-317 23 p. |
artikel |
4 |
Complete valence shell electronic structure of adamantane from He I and He II photoelectron spectroscopy
|
Boschi, R. |
|
1973 |
2 |
3 |
p. 377-380 4 p. |
artikel |
5 |
Devaluation of the gold standard in x-ray photoelectron spectroscopy
|
Betteridge, D. |
|
1973 |
2 |
3 |
p. 327-334 8 p. |
artikel |
6 |
Electronic properties of fluorenone in the excited states
|
Favini, G. |
|
1973 |
2 |
3 |
p. 239-246 8 p. |
artikel |
7 |
ESCA applied to liquids
|
Siegbahn, Hans |
|
1973 |
2 |
3 |
p. 319-325 7 p. |
artikel |
8 |
ESCA study of Ni(II) dithiocarbazato complexes
|
Battistoni, C. |
|
1973 |
2 |
3 |
p. 355-361 7 p. |
artikel |
9 |
International Conference on Electron Spectroscopy
|
|
|
1973 |
2 |
3 |
p. 381-382 2 p. |
artikel |
10 |
On the influence of surface-roughness on X-ray photoelectron intensities
|
Ebel, H. |
|
1973 |
2 |
3 |
p. 277-287 11 p. |
artikel |
11 |
On the origin of the additional bands observed in the photoelectron spectra obtained with Ne or Ar resonance lines
|
Sluse-Goffart, C. |
|
1973 |
2 |
3 |
p. 215-223 9 p. |
artikel |
12 |
Photoelectron branching ratios with a cylindrical mirror energy analyzer
|
Gardner, J.L. |
|
1973 |
2 |
3 |
p. 267-275 9 p. |
artikel |
13 |
Photoelectron spectra and orbital assignments by sum rule consideration: Ethyl and n-propyl fluorides
|
Yamazaki, Tomoko |
|
1973 |
2 |
3 |
p. 335-340 6 p. |
artikel |
14 |
304 Å photoelectron spectra of CO, N2, O2 and CO2
|
Gardner, J.L. |
|
1973 |
2 |
3 |
p. 259-266 8 p. |
artikel |
15 |
Photoelectron spectra of some fluorine substituted diazanaphthalenes
|
Van Den Ham, D.M.W. |
|
1973 |
2 |
3 |
p. 247-258 12 p. |
artikel |
16 |
Photoelektronenspektren organischer verbindungen
|
Bruckmann, P. |
|
1973 |
2 |
3 |
p. 341-354 14 p. |
artikel |
17 |
Silicon diffusion through thin tungsten films on silicon, studied with Auger spectroscopy
|
Chang, Chuan C. |
|
1973 |
2 |
3 |
p. 363-376 14 p. |
artikel |