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                             20 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer Greif, Michael
2014
197 C p. 30-36
7 p.
artikel
2 Comparison of the equivalent width, the autocorrelation width, and the variance as figures of merit for XPS narrow scans Singh, Bhupinder
2014
197 C p. 112-117
6 p.
artikel
3 Developing soft X-ray spectroscopy for in situ characterization of nanocatalysts in catalytic reactions Zhang, Hui
2014
197 C p. 118-123
6 p.
artikel
4 Electrostatic afocal-zoom lens design using computer optimization technique Sise, Omer
2014
197 C p. 7-12
6 p.
artikel
5 Femtosecond photoelectron and photoion spectrometer with vacuum ultraviolet probe pulses Koch, Markus
2014
197 C p. 22-29
8 p.
artikel
6 Fully differential cross sections for low to intermediate energy perpendicular plane ionization of xenon atoms Purohit, G.
2014
197 C p. 50-55
6 p.
artikel
7 IFC Editorial Board 2014
197 C p. IFC-
1 p.
artikel
8 Influence of host matrices on krypton electron binding energies and KLL Auger transition energies Inoyatov, А.Kh.
2014
197 C p. 64-71
8 p.
artikel
9 Inverse photoemission and photoemission spectroscopic studies on sputter-annealed Ni–Mn–Sn and Ni–Mn–In surfaces Maniraj, M.
2014
197 C p. 106-111
6 p.
artikel
10 Investigation of luminescent properties of Ca0.3Sr0.7Al2O4:Tb3+,Eu3+ excited using different excitation sources Shaat, Samy K.K.
2014
197 C p. 72-79
8 p.
artikel
11 L subshell and total L shell photoeffect cross-sections of Sn, Sb, Te and I elements at 5.96keV Aylikci, V.
2014
197 C p. 88-92
5 p.
artikel
12 Maximum probing depth of low-energy photoelectrons in an amorphous organic semiconductor film Ozawa, Yusuke
2014
197 C p. 17-21
5 p.
artikel
13 New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron images Mahjoub, Mohamed Aymen
2014
197 C p. 80-87
8 p.
artikel
14 On the choice of tuning parameters for use with Robust GCV, Modified GCV and the Discrepancy Principle in the inversion of ARXPS data Peykov, D.
2014
197 C p. 93-101
9 p.
artikel
15 Photoelectron spectra and electronic structure of some spiroborate complexes Vovna, V.I.
2014
197 C p. 43-49
7 p.
artikel
16 Predicting the electronic structure and magnetic properties of UO 2 + , UO2(CO) 5 + and UO2(Ar) 5 + using wavefunction based methods Páez-Hernández, Dayán
2014
197 C p. 1-6
6 p.
artikel
17 Temperature and polarization dependence of Fe L3-edge X-ray absorption spectra of LuFe2O4 Agui, A.
2014
197 C p. 13-16
4 p.
artikel
18 The equivalent width as a figure of merit for XPS narrow scans Singh, Bhupinder
2014
197 C p. 56-63
8 p.
artikel
19 Thermal evolution of the band edges of 6H-SiC: X-ray methods compared to the optical band gap Miedema, P.S.
2014
197 C p. 37-42
6 p.
artikel
20 X-ray photoelectron spectroscopy study of BaWO4 and Ba2CaWO6 Capece, Angela M.
2014
197 C p. 102-105
4 p.
artikel
                             20 gevonden resultaten
 
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