| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Absolute calibration of the 16O(α,α)16O elastic scattering resonance at 7.30–7.65 MeV and applications to oxygen depth profiling
|
Almeida, F.J.D.
|
|
1993
|
82 |
3 |
p. 393-398
6 p.
|
artikel
|
| 2 |
A mechanism of ion bombardment induced ripple topography
|
Protsenko, A.N.
|
|
1993
|
82 |
3 |
p. 417-420
4 p.
|
artikel
|
| 3 |
A new method to calculate the characteristics of radiation and pair production under high energies and arbitrary angles of particle incidence relative to the crystal planes
|
Tikhomirov, V.V.
|
|
1993
|
82 |
3 |
p. 409-416
8 p.
|
artikel
|
| 4 |
A new parameter in the electrochemical etching of polymer track detectors
|
Sohrabi, M.
|
|
1993
|
82 |
3 |
p. 442-446
5 p.
|
artikel
|
| 5 |
Calendar
|
|
|
1993
|
82 |
3 |
p. 489-491
3 p.
|
artikel
|
| 6 |
Irradiation induced texture of Ag and Fe grains in Ag/Fe multilayers
|
Liu, B.X.
|
|
1993
|
82 |
3 |
p. 435-441
7 p.
|
artikel
|
| 7 |
Multiple scattering and inelasticity distortions in neutron scattering from an infinite plane slab
|
Dawidowski, J.
|
|
1993
|
82 |
3 |
p. 459-464
6 p.
|
artikel
|
| 8 |
Nuclear microprobe analysis of 14N and 15N in soybean leaves
|
Massiot, P.
|
|
1993
|
82 |
3 |
p. 465-473
9 p.
|
artikel
|
| 9 |
On 10Be standards and the half-life of 10Be
|
Middleton, Roy
|
|
1993
|
82 |
3 |
p. 399-403
5 p.
|
artikel
|
| 10 |
On the effect of beam spatial broadening in ion microtomography (IMT) image quality
|
Bench, G.S.
|
|
1993
|
82 |
3 |
p. 447-458
12 p.
|
artikel
|
| 11 |
Penetration of high energy ions in semiconductors through tracks: simulation with transport equations
|
Zaitsev, A.M.
|
|
1993
|
82 |
3 |
p. 421-430
10 p.
|
artikel
|
| 12 |
Precise determination of H recoil cross sections for 1.5–3.0 MeV He ions
|
Kido, Y.
|
|
1993
|
82 |
3 |
p. 474-480
7 p.
|
artikel
|
| 13 |
Single electron capture in He+ on SF6, collisions at low keV energies
|
Martínez, H.
|
|
1993
|
82 |
3 |
p. 389-392
4 p.
|
artikel
|
| 14 |
Spatial localization of the buried ion-beam synthesized layer of silicon dioxide inclusions in silicon
|
Danilin, A.B.
|
|
1993
|
82 |
3 |
p. 431-434
4 p.
|
artikel
|
| 15 |
Systematics of scaling of heavy ion blocking in thin silicon crystals
|
Nanal, Vandana
|
|
1993
|
82 |
3 |
p. 404-408
5 p.
|
artikel
|
| 16 |
X-ray beam profile measurements with CCD detectors
|
Attaelmanan, A.
|
|
1993
|
82 |
3 |
p. 481-488
8 p.
|
artikel
|
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