nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A low-temperature gas-flow total electron yield detector for XAFS measurements
|
Kemner, Kenneth |
|
1992 |
71 |
3 |
p. 345-350 6 p. |
artikel |
2 |
An improved “Keisch type” proportional counter for backscatter Mössbauer spectroscopy
|
Ruskov, Todor |
|
1992 |
71 |
3 |
p. 351-353 3 p. |
artikel |
3 |
An ion optical system for the detection of charged fragments with high acceptance in a time-of-flight mass spectrometer
|
Lork, Rainer |
|
1992 |
71 |
3 |
p. 330-338 9 p. |
artikel |
4 |
An RBS study on the annealing behaviour of Cu thin films on brominated Si(111) and Si(100) substrates
|
Sekar, K. |
|
1992 |
71 |
3 |
p. 308-313 6 p. |
artikel |
5 |
Calendar
|
|
|
1992 |
71 |
3 |
p. 357-360 4 p. |
artikel |
6 |
Computer simulation of ion-solid interactions
|
|
|
1992 |
71 |
3 |
p. 354-355 2 p. |
artikel |
7 |
Dechanneling cross-sections of α-particles by interstitial atoms in palladium
|
Chylinski, Z. |
|
1992 |
71 |
3 |
p. 255-263 9 p. |
artikel |
8 |
Dynamic Monte Carlo simulation for cascade interfacial mixing
|
Kim, J.H. |
|
1992 |
71 |
3 |
p. 271-277 7 p. |
artikel |
9 |
Effect of electron beam energy distribution on the wiggler-undulator brightness
|
Ciocci, F. |
|
1992 |
71 |
3 |
p. 339-344 6 p. |
artikel |
10 |
Energy spectroscopy studies of radiation-induced damaged surfaces and interfaces in SiO2/Si by light charged particles
|
Zhongquan, Ma |
|
1992 |
71 |
3 |
p. 278-290 13 p. |
artikel |
11 |
High energy resolution ion beam techniques for novel investigations in nuclear, atomic and applied physics using narrow nuclear resonances
|
Schulte, W.H. |
|
1992 |
71 |
3 |
p. 291-307 17 p. |
artikel |
12 |
Ion beam induced atomic mixing kinetics of Te/Cu and Te/Ag
|
Saleh, N.S. |
|
1992 |
71 |
3 |
p. 264-270 7 p. |
artikel |
13 |
Measurements of mass attenuation coefficients of yttrium with characteristic lines from elements excited by energetic protons
|
Dachun, Wang |
|
1992 |
71 |
3 |
p. 249-254 6 p. |
artikel |
14 |
Nitrogen detection by means of a broad resonance at 9.3 MeV in 14N(α, α)14 N elastic backscattering
|
Qui, Yuanxun |
|
1992 |
71 |
3 |
p. 324-329 6 p. |
artikel |
15 |
Simulation of ion backscattering from rough surfaces
|
Wüest, Martin |
|
1992 |
71 |
3 |
p. 314-323 10 p. |
artikel |
16 |
X-ray attenuation coefficients and photoelectric cross sections of Cu and Fe in the range 3 keV to 29 keV
|
Dachun, Wang |
|
1992 |
71 |
3 |
p. 241-248 8 p. |
artikel |