| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accelerator-driven transmutation technology for incinerating radioactive waste and for advanced application to power production
|
Jameson, R.A.
|
|
1992
|
68 |
1-4 |
p. 474-480
7 p.
|
artikel
|
| 2 |
Accelerator mass spectrometry with a gas-filled magnetic spectrograph
|
Müller, D.
|
|
1992
|
68 |
1-4 |
p. 313-318
6 p.
|
artikel
|
| 3 |
A channeling goniometer with a wide temperature range sample holder
|
Fischer, U.S.
|
|
1992
|
68 |
1-4 |
p. 249-252
4 p.
|
artikel
|
| 4 |
A cold cathode ion source with a magnetic hollow cathode
|
Kerkow, H.
|
|
1992
|
68 |
1-4 |
p. 41-44
4 p.
|
artikel
|
| 5 |
A continuous time-tagged positron beam and its application to materials research
|
Wesolowski, P.
|
|
1992
|
68 |
1-4 |
p. 468-473
6 p.
|
artikel
|
| 6 |
A multipurpose implanter with various target chambers for basic studies on the influence of ion bombardment on material properties
|
Frech, G.
|
|
1992
|
68 |
1-4 |
p. 402-407
6 p.
|
artikel
|
| 7 |
Analysis of tungsten oxide films using MeV ion beams
|
Wagner, W.
|
|
1992
|
68 |
1-4 |
p. 262-265
4 p.
|
artikel
|
| 8 |
An operating method to reduce damping time of betatron oscillations at beam injection in an electron storage ring
|
Hiramoto, Kazuo
|
|
1992
|
68 |
1-4 |
p. 79-82
4 p.
|
artikel
|
| 9 |
Application of free-electron lasers
|
Grill, Wolfgang
|
|
1992
|
68 |
1-4 |
p. 61-67
7 p.
|
artikel
|
| 10 |
Applications of electron accelerators in radioactive waste inspection and assay
|
Sené, M.R.
|
|
1992
|
68 |
1-4 |
p. 53-60
8 p.
|
artikel
|
| 11 |
Applied research and technology with accelerators state of the art, 1991
|
Duggan, Jerome L.
|
|
1992
|
68 |
1-4 |
p. 495-499
5 p.
|
artikel
|
| 12 |
A study of the effects of 15N ion beam irradiation on organic compounds
|
Pilakouta, M.
|
|
1992
|
68 |
1-4 |
p. 141-144
4 p.
|
artikel
|
| 13 |
Characterization by Rutherford backscattering, elastic recoil and nuclear reaction analysis of near-surface modifications of glasses submitted to a DC potential
|
Freire Jr., F.L.
|
|
1992
|
68 |
1-4 |
p. 227-230
4 p.
|
artikel
|
| 14 |
Characterization of thin Si1O n surface layers on Si by proton and alpha particle backscattering
|
Havránek, V.
|
|
1992
|
68 |
1-4 |
p. 223-226
4 p.
|
artikel
|
| 15 |
Crystalline order and disorder in epitaxial GaN
|
Lindén, M.
|
|
1992
|
68 |
1-4 |
p. 170-174
5 p.
|
artikel
|
| 16 |
DATTPIXE, a computer package for TTPIXE data analysis
|
Reis, M.A.
|
|
1992
|
68 |
1-4 |
p. 300-304
5 p.
|
artikel
|
| 17 |
Design of a compact ECRIPAC device for 1–400 MeV/amu heavy ion bunches production
|
Geller, Richard
|
|
1992
|
68 |
1-4 |
p. 7-16
10 p.
|
artikel
|
| 18 |
Design study of the storage ring EUTERPE
|
Xi, Boling
|
|
1992
|
68 |
1-4 |
p. 101-104
4 p.
|
artikel
|
| 19 |
Determination of Hg concentration in gases by PIXE
|
Dutkiewicz, E.
|
|
1992
|
68 |
1-4 |
p. 305-308
4 p.
|
artikel
|
| 20 |
Determination of oxygen in high purity gallium by using charged particle activation analysis
|
Ditrói, F.
|
|
1992
|
68 |
1-4 |
p. 166-169
4 p.
|
artikel
|
| 21 |
Determination of polymerization particle morphology using synchrotron computed microtomography
|
Jones, K.W.
|
|
1992
|
68 |
1-4 |
p. 105-110
6 p.
|
artikel
|
| 22 |
Development of 26Al accelerator mass spectrometry for aluminium absorption experiments in humans
|
Barker, J.
|
|
1992
|
68 |
1-4 |
p. 319-322
4 p.
|
artikel
|
| 23 |
Development of the fluorescent materials test chamber
|
Hollerman, W.A.
|
|
1992
|
68 |
1-4 |
p. 28-31
4 p.
|
artikel
|
| 24 |
Developments in low-energy ion scattering from surfaces
|
Brongersma, H.H.
|
|
1992
|
68 |
1-4 |
p. 207-212
6 p.
|
artikel
|
| 25 |
Editorial
|
|
|
1992
|
68 |
1-4 |
p. vii-
1 p.
|
artikel
|
| 26 |
Editorial Board
|
|
|
1992
|
68 |
1-4 |
p. ii-
1 p.
|
artikel
|
| 27 |
Electron beam focusing in a racetrack microtron by means of rotated two-sector dipole magnets
|
Delhez, J.L.
|
|
1992
|
68 |
1-4 |
p. 96-100
5 p.
|
artikel
|
| 28 |
Electron emission and desorption from frozen gases under fast (MeV) ion bombardment
|
Schosnig, Markus
|
|
1992
|
68 |
1-4 |
p. 394-397
4 p.
|
artikel
|
| 29 |
Elemental analysis of mineral grains by means of simultaneous use of PIXE, PIGE and proton backscattering
|
Vogt, J.
|
|
1992
|
68 |
1-4 |
p. 285-288
4 p.
|
artikel
|
| 30 |
Elemental analysis with external-beam PIXE
|
Lin, E.K.
|
|
1992
|
68 |
1-4 |
p. 281-284
4 p.
|
artikel
|
| 31 |
Examination of sea freight containers using modern electron linear accelerators
|
Dönges, G.
|
|
1992
|
68 |
1-4 |
p. 68-72
5 p.
|
artikel
|
| 32 |
Excitation functions for 107Ag(d, 2n)107Cd, 109Ag(d, 2n)109Cd and 109Ag(d, p) 110mAg reactions
|
Peng, Xiufeng
|
|
1992
|
68 |
1-4 |
p. 145-148
4 p.
|
artikel
|
| 33 |
Film thickness determination with PIXE
|
Klatt, C.
|
|
1992
|
68 |
1-4 |
p. 277-280
4 p.
|
artikel
|
| 34 |
Fringe field calculations for the inhomogeneous Twente Eindhoven microtron magnets
|
Webers, G.A.
|
|
1992
|
68 |
1-4 |
p. 83-86
4 p.
|
artikel
|
| 35 |
Heavy element distribution profiles in archaeological samples of human tooth enamel and dentine using the proton-induced X-ray emission technique
|
Buoso, M.C.
|
|
1992
|
68 |
1-4 |
p. 269-272
4 p.
|
artikel
|
| 36 |
HEIRD analysis of the low-Z deposits on probes from the vessel walls of fusion experiments
|
Behrisch, R.
|
|
1992
|
68 |
1-4 |
p. 245-248
4 p.
|
artikel
|
| 37 |
High energy ERDA with very heavy ions using mass and energy dispersive spectrometry
|
Goppelt, P.
|
|
1992
|
68 |
1-4 |
p. 235-240
6 p.
|
artikel
|
| 38 |
High resolution PIXE using different orders of reflection
|
Török, I.
|
|
1992
|
68 |
1-4 |
p. 289-291
3 p.
|
artikel
|
| 39 |
High-temperature ion implantation in silicon
|
Kachurin, G.A.
|
|
1992
|
68 |
1-4 |
p. 323-330
8 p.
|
artikel
|
| 40 |
Hydrogen in and on natural and synthetic diamond
|
Sellschop, J.P.F.
|
|
1992
|
68 |
1-4 |
p. 133-140
8 p.
|
artikel
|
| 41 |
Hydrogen profiles of thin PVD silicon nitride films using elastic recoil detection analysis
|
Markwitz, A.
|
|
1992
|
68 |
1-4 |
p. 218-222
5 p.
|
artikel
|
| 42 |
Influence of implantation defects on the nucleation and growth of CoSi2 precipitates
|
Witzmann, A.
|
|
1992
|
68 |
1-4 |
p. 430-434
5 p.
|
artikel
|
| 43 |
Internal standardization in charged particle activation analysis
|
Casteleyn, K.
|
|
1992
|
68 |
1-4 |
p. 161-165
5 p.
|
artikel
|
| 44 |
Investigation of ion beam synthesized iron silicide by RBS, XRD, and Mössbauer spectroscopy (CEMS)
|
Reuther, H.
|
|
1992
|
68 |
1-4 |
p. 241-244
4 p.
|
artikel
|
| 45 |
Investigation of the deuterium distribution in a JET limiter using the nuclear microprobe and ion beam slope cutting
|
Grambole, D.
|
|
1992
|
68 |
1-4 |
p. 154-157
4 p.
|
artikel
|
| 46 |
Ion beam mixing of Cu/Ti bilayers
|
Rauschenbach, B.
|
|
1992
|
68 |
1-4 |
p. 438-442
5 p.
|
artikel
|
| 47 |
Ion beam synthesis of epitaxial CoSi2 layers and the redistribution of dopants within them
|
Reeson, Karen J.
|
|
1992
|
68 |
1-4 |
p. 369-379
11 p.
|
artikel
|
| 48 |
Ion implantation as an efficient surface treatment
|
Straede, Chr.A.
|
|
1992
|
68 |
1-4 |
p. 380-388
9 p.
|
artikel
|
| 49 |
Ion implantation effects in Na β″-alumina crystals
|
Freire Jr., F.L.
|
|
1992
|
68 |
1-4 |
p. 422-425
4 p.
|
artikel
|
| 50 |
Ion implantation in III–V compounds
|
Wesch, W.
|
|
1992
|
68 |
1-4 |
p. 342-354
13 p.
|
artikel
|
| 51 |
Ion implantation of optical devices
|
Buchal, Ch.
|
|
1992
|
68 |
1-4 |
p. 355-360
6 p.
|
artikel
|
| 52 |
Laser cooling of stored ions in ASTRID: a storage ring for ions and electrons
|
Hangst, J.S.
|
|
1992
|
68 |
1-4 |
p. 17-22
6 p.
|
artikel
|
| 53 |
Lattice location of implanted carbon in GaAs
|
Mader, A.
|
|
1992
|
68 |
1-4 |
p. 149-153
5 p.
|
artikel
|
| 54 |
LEA electron accelerators for radiation processing
|
Mehnert, R.
|
|
1992
|
68 |
1-4 |
p. 73-78
6 p.
|
artikel
|
| 55 |
Light element analysis using PIXE and PIGE spectroscopy
|
Fazinić, S.
|
|
1992
|
68 |
1-4 |
p. 273-276
4 p.
|
artikel
|
| 56 |
Light element depth profiling using elastic recoil detection
|
Habraken, F.H.P.M.
|
|
1992
|
68 |
1-4 |
p. 181-189
9 p.
|
artikel
|
| 57 |
L-shell ionization in Au/Ag foils by electron and positron impact
|
Schneider, Hans
|
|
1992
|
68 |
1-4 |
p. 491-494
4 p.
|
artikel
|
| 58 |
Measurements of 14C from nuclear power plants with the AMS technique
|
Erlandsson, Bengt
|
|
1992
|
68 |
1-4 |
p. 309-312
4 p.
|
artikel
|
| 59 |
MeV carbon implantation into silicon: microstructure and electrical properties
|
Skorupa, W.
|
|
1992
|
68 |
1-4 |
p. 408-412
5 p.
|
artikel
|
| 60 |
Microanalysis using synchrotron radiation
|
Kwiatek, Wojciech M.
|
|
1992
|
68 |
1-4 |
p. 122-124
3 p.
|
artikel
|
| 61 |
Modification of the mechanical properties of ceramic surfaces by energetic ion irradiation
|
Bolse, Wolfgang
|
|
1992
|
68 |
1-4 |
p. 331-341
11 p.
|
artikel
|
| 62 |
Muons as a probe in solid state and surface physics and in materials research
|
Daniel, H.
|
|
1992
|
68 |
1-4 |
p. 459-467
9 p.
|
artikel
|
| 63 |
Numerical design and model measurements for a 1.3 GHz microtron accelerating cavity
|
Kleeven, W.J.G.M.
|
|
1992
|
68 |
1-4 |
p. 87-91
5 p.
|
artikel
|
| 64 |
Oxidation and corrosion studies of Al-implanted stainless steel AISI 321 using nuclear reaction and electrochemical techniques
|
Noli, F.
|
|
1992
|
68 |
1-4 |
p. 398-401
4 p.
|
artikel
|
| 65 |
Oxygen dependence of light emission from sputtered atoms and ions following ion bombardment of polycrystalline aluminum targets
|
Hippler, Rainer
|
|
1992
|
68 |
1-4 |
p. 413-416
4 p.
|
artikel
|
| 66 |
PDMS and surface analysis with fast heavy ion beams
|
Riggi, F.
|
|
1992
|
68 |
1-4 |
p. 213-217
5 p.
|
artikel
|
| 67 |
Phase diagram of implanted FeN system
|
Kopcewicz, M.
|
|
1992
|
68 |
1-4 |
p. 417-421
5 p.
|
artikel
|
| 68 |
Possibilities of the DAW structure for application to industrial linacs
|
Esin, S.K.
|
|
1992
|
68 |
1-4 |
p. 32-35
4 p.
|
artikel
|
| 69 |
Properties of RFQ accelerators for ion implantation
|
Schempp, A.
|
|
1992
|
68 |
1-4 |
p. 36-40
5 p.
|
artikel
|
| 70 |
Prospects of analytical models for accelerator technology in industry (past, present, future)
|
Hagedoorn, H.L.
|
|
1992
|
68 |
1-4 |
p. 23-27
5 p.
|
artikel
|
| 71 |
Quantitative depth-dependent structural and strain analysis in superlattices by ion channeling
|
Lenkeit, K.
|
|
1992
|
68 |
1-4 |
p. 253-257
5 p.
|
artikel
|
| 72 |
Radiation damage in a CdF2 ionic crystal by a channeled proton beam
|
Rajchel, Boguslaw
|
|
1992
|
68 |
1-4 |
p. 435-437
3 p.
|
artikel
|
| 73 |
Radiation-induced diffusion during ion implantation
|
Kerkow, H.
|
|
1992
|
68 |
1-4 |
p. 389-393
5 p.
|
artikel
|
| 74 |
RBS analysis of heteroepitaxial layered structures
|
Flagmeyer, R.
|
|
1992
|
68 |
1-4 |
p. 190-201
12 p.
|
artikel
|
| 75 |
RF ion linacs for applied research and industrial applications
|
Hamm, Robert W.
|
|
1992
|
68 |
1-4 |
p. 1-6
6 p.
|
artikel
|
| 76 |
Rhodotron: an accelerator for industrial irradiation
|
Bassaler, J.M.
|
|
1992
|
68 |
1-4 |
p. 92-95
4 p.
|
artikel
|
| 77 |
Simultaneous analysis of Li and B in amorphous thin film glasses using ERDA
|
Neelmeijer, C.
|
|
1992
|
68 |
1-4 |
p. 231-234
4 p.
|
artikel
|
| 78 |
Sodium diffusion in metals observed by the 23Na(p,γ) reaction
|
Uhrmacher, M.
|
|
1992
|
68 |
1-4 |
p. 175-179
5 p.
|
artikel
|
| 79 |
Sputtering and RBS investigations of ordered and disordered Ni4Mo
|
Sarholt-Kristensen, L.
|
|
1992
|
68 |
1-4 |
p. 258-261
4 p.
|
artikel
|
| 80 |
STIM tomography: a three-dimensional high resolution imaging tool
|
Bench, G.
|
|
1992
|
68 |
1-4 |
p. 481-490
10 p.
|
artikel
|
| 81 |
Stoichiometry and profiling of surface layers by means of TOF-E ERDA and RBS
|
Arai, E.
|
|
1992
|
68 |
1-4 |
p. 202-206
5 p.
|
artikel
|
| 82 |
Study of proton-bombardment-induced radiation damage in elemental and compound semiconductors by RBS channeling
|
Ascheron, C.
|
|
1992
|
68 |
1-4 |
p. 443-449
7 p.
|
artikel
|
| 83 |
Superconducting synchrotron radiation sources for industrial applications
|
Weihreter, E.
|
|
1992
|
68 |
1-4 |
p. 45-52
8 p.
|
artikel
|
| 84 |
Surface modification by ion implantation and ion beam mixing
|
Rivière, J.P.
|
|
1992
|
68 |
1-4 |
p. 361-368
8 p.
|
artikel
|
| 85 |
Test of a new standard for fluorine determination with PIGE
|
Zschau, H.-E.
|
|
1992
|
68 |
1-4 |
p. 158-160
3 p.
|
artikel
|
| 86 |
The fundamental parameter method applied to X-ray fluorescence analysis with synchrotron radiation
|
Pantenburg, F.J.
|
|
1992
|
68 |
1-4 |
p. 125-132
8 p.
|
artikel
|
| 87 |
The hydrogen concentration of diamondlike amorphous carbon films by elastic recoil detection analysis
|
Long, Xianguan
|
|
1992
|
68 |
1-4 |
p. 266-268
3 p.
|
artikel
|
| 88 |
The use of pulsed spallation neutrons in applied condensed matter research
|
Finney, J.L.
|
|
1992
|
68 |
1-4 |
p. 451-458
8 p.
|
artikel
|
| 89 |
Trace element determinations in selected geological samples using a 15 keV synchrotron microprobe at the SRS, Daresbury, UK
|
Przybylowicz, W.
|
|
1992
|
68 |
1-4 |
p. 115-121
7 p.
|
artikel
|
| 90 |
XAFS-analysis of materials
|
Dobson, B.R.
|
|
1992
|
68 |
1-4 |
p. 111-114
4 p.
|
artikel
|
| 91 |
Xenon ion beam mixing in Ni3N/Al bilayers
|
Milosavljevic, M.
|
|
1992
|
68 |
1-4 |
p. 426-429
4 p.
|
artikel
|
| 92 |
X-ray intensity ratios for microprobes and PIXE
|
Sieber, K.
|
|
1992
|
68 |
1-4 |
p. 292-299
8 p.
|
artikel
|
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