nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accelerator methods for the determination of beryllium
|
McMillan, J.W. |
|
1992 |
66 |
1-2 |
p. 118-125 8 p. |
artikel |
2 |
Analysis for hydrogen by nuclear reaction and energy recoil detection
|
Lanford, W.A. |
|
1992 |
66 |
1-2 |
p. 65-82 18 p. |
artikel |
3 |
Analysis of boron by charged particle bombardment
|
Moncoffre, N. |
|
1992 |
66 |
1-2 |
p. 126-138 13 p. |
artikel |
4 |
Analysis of lithium by ion beam methods
|
Räisänen, J. |
|
1992 |
66 |
1-2 |
p. 107-117 11 p. |
artikel |
5 |
Analysis of neon by particle accelerators
|
Banse-Lefebvre, A. |
|
1992 |
66 |
1-2 |
p. 205-208 4 p. |
artikel |
6 |
Analysis of oxygen by charged particle bombardment
|
Cohen, David D. |
|
1992 |
66 |
1-2 |
p. 158-190 33 p. |
artikel |
7 |
A very narrow resonance in 18O(p, α)15N near 150 keV: Application to isotopic tracing. II. High resolution depth profiling of 18O
|
Battistig, G. |
|
1992 |
66 |
1-2 |
p. 1-10 10 p. |
artikel |
8 |
A workshop on cross-section data bases for IBA
|
Vickridge, I.C. |
|
1992 |
66 |
1-2 |
p. 303-305 3 p. |
artikel |
9 |
Characterisation of thin layers in processed silicon
|
Earwaker, L.G. |
|
1992 |
66 |
1-2 |
p. 23-30 8 p. |
artikel |
10 |
Conference photographs
|
|
|
1992 |
66 |
1-2 |
p. x-xi nvt p. |
artikel |
11 |
Depth profiling of hydrogen isotopes in thin, low-Z films by scattering recoil coincidence spectrometry
|
Forster, J.S. |
|
1992 |
66 |
1-2 |
p. 215-220 6 p. |
artikel |
12 |
Depth profiling of light-Z elements with elastic resonances: Oxygen profiling with the 3.045 MeV 16 O(α, α)16 O resonance
|
De Coster, W. |
|
1992 |
66 |
1-2 |
p. 283-291 9 p. |
artikel |
13 |
Determination of boron using the B(α,p)C nuclear reaction at incident energies near 3 MeV
|
McIntyre Jr., L.C. |
|
1992 |
66 |
1-2 |
p. 221-225 5 p. |
artikel |
14 |
Editorial Board
|
|
|
1992 |
66 |
1-2 |
p. ii-iii nvt p. |
artikel |
15 |
Fluorine enrichment phenomena in coal combustion cycle
|
Caridi, A. |
|
1992 |
66 |
1-2 |
p. 298-301 4 p. |
artikel |
16 |
High resolution depth profiling of nitrogen in A1N layers
|
Terwagne, G. |
|
1992 |
66 |
1-2 |
p. 262-266 5 p. |
artikel |
17 |
Hydrogen decoration of defects produced by Na implantation into polycrystalline Cr and Ta
|
Keinonen, J. |
|
1992 |
66 |
1-2 |
p. 209-214 6 p. |
artikel |
18 |
Ion beam analysis of fluorine: Its principles and applications
|
Coote, G.E. |
|
1992 |
66 |
1-2 |
p. 191-204 14 p. |
artikel |
19 |
Ion beam analysis of nitrogen
|
Bethge, K. |
|
1992 |
66 |
1-2 |
p. 146-157 12 p. |
artikel |
20 |
Ion beam analysis of steel surfaces modified by nitrogen ion implantation
|
Neelmeijer, C. |
|
1992 |
66 |
1-2 |
p. 242-249 8 p. |
artikel |
21 |
Ion microbeam analysis with superconducting AMS minicyclotron as the analyzing instrument
|
Subotic, K.M. |
|
1992 |
66 |
1-2 |
p. 48-50 3 p. |
artikel |
22 |
Location of oxygen in leached UO2 single crystals by resonant scattering of He ions
|
Turos, A. |
|
1992 |
66 |
1-2 |
p. 280-282 3 p. |
artikel |
23 |
Location of protein bands in cellulose acetate electrophoretograms measuring nitrogen distributions by the 14N(p,p′γ)14N nuclear reaction
|
Szõkefalvi-Nagy, Zoltán |
|
1992 |
66 |
1-2 |
p. 258-261 4 p. |
artikel |
24 |
Microanalysis of He using charged particle accelerators
|
Pászti, F. |
|
1992 |
66 |
1-2 |
p. 83-106 24 p. |
artikel |
25 |
Nitrogen profiling in nitride films and nitrogen-implanted samples using the 14 N(α, α) and 14 N(α, p) reactions at 6 MeV incident energy
|
Artigalas, H. |
|
1992 |
66 |
1-2 |
p. 237-241 5 p. |
artikel |
26 |
Non-Rutherford scattering of protons by light elements
|
Knox, J.M. |
|
1992 |
66 |
1-2 |
p. 31-37 7 p. |
artikel |
27 |
Novel applications of high-energy resolution ion beams
|
Schulte, W.H. |
|
1992 |
66 |
1-2 |
p. 11-16 6 p. |
artikel |
28 |
Nuclear microanalysis by means of 350 keV Van de Graaf accelerator
|
Ross, G.G. |
|
1992 |
66 |
1-2 |
p. 17-22 6 p. |
artikel |
29 |
On the determination of carbon using charged particle accelerators
|
Vis, R.D. |
|
1992 |
66 |
1-2 |
p. 139-145 7 p. |
artikel |
30 |
Oxygen measurements by elastic backscattering
|
Bourdelle, K.K. |
|
1992 |
66 |
1-2 |
p. 274-279 6 p. |
artikel |
31 |
PIGE - Resonance profiling applied to a clinical test of flouride varnishes
|
Zschau, H.E. |
|
1992 |
66 |
1-2 |
p. 292-294 3 p. |
artikel |
32 |
Polarized nitrogen beams at LISOL
|
Vanderpoorten, W. |
|
1992 |
66 |
1-2 |
p. 267-273 7 p. |
artikel |
33 |
Preface
|
|
|
1992 |
66 |
1-2 |
p. vii-ix nvt p. |
artikel |
34 |
Simultaneous determination of 14N and 15N by elastic backscattering and nuclear reaction: application to biology
|
Massiot, Ph. |
|
1992 |
66 |
1-2 |
p. 250-257 8 p. |
artikel |
35 |
Some studies on nuclear methods for boron determination
|
Pillay, A.E. |
|
1992 |
66 |
1-2 |
p. 226-229 4 p. |
artikel |
36 |
The application of high energy prompt gamma-ray spectrometry to 3He activation analysis of light elements
|
Pillay, A.E. |
|
1992 |
66 |
1-2 |
p. 43-47 5 p. |
artikel |
37 |
The influence of surface topography on the depth resolution of the PIGE depth profiling technique
|
Plier, F. |
|
1992 |
66 |
1-2 |
p. 38-42 5 p. |
artikel |
38 |
The investigation of the fluorine uptake in tooth enamel after the application of a NaF containing varnish
|
Plier, F. |
|
1992 |
66 |
1-2 |
p. 295-297 3 p. |
artikel |
39 |
The structure and composition of plasma nitrided coatings on titanium
|
Brading, H.J. |
|
1992 |
66 |
1-2 |
p. 230-236 7 p. |
artikel |
40 |
Twenty years of analysis of light elements at the LARN
|
Demortier, Guy |
|
1992 |
66 |
1-2 |
p. 51-64 14 p. |
artikel |