| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A new method for profiling boron
|
Xiting, Lu
|
|
1989
|
43 |
4 |
p. 565-569
5 p.
|
article
|
| 2 |
An exact treatment of secondary and tertiary fluorescence enhancement in PIXE
|
Campbell, J.L.
|
|
1989
|
43 |
4 |
p. 539-555
17 p.
|
article
|
| 3 |
A simple way to study secondary ion emission by heavy multicharged ions at medium energy (≃ 115 keV. Application to hydrogen ion emission
|
Brunelle, A.
|
|
1989
|
43 |
4 |
p. 586-588
3 p.
|
article
|
| 4 |
Author index
|
|
|
1989
|
43 |
4 |
p. 593-600
8 p.
|
article
|
| 5 |
Calendar
|
|
|
1989
|
43 |
4 |
p. 590-592
3 p.
|
article
|
| 6 |
Channeling and photoluminescence studies of heat-treated InP single crystals
|
Banerjee, S.
|
|
1989
|
43 |
4 |
p. 570-573
4 p.
|
article
|
| 7 |
Characterization of the response function of a Si(Li) detector using an absorber technique
|
Larsson, N.P.O.
|
|
1989
|
43 |
4 |
p. 574-580
7 p.
|
article
|
| 8 |
Compton scattering contribution to response function of Si(Li) X-ray detectors
|
Campbell, J.L.
|
|
1989
|
43 |
4 |
p. 490-496
7 p.
|
article
|
| 9 |
Cross section measurements of the 1H(4He, 4He)1H elastic recoil reaction for ERD analysis
|
Szilágyi, E.
|
|
1989
|
43 |
4 |
p. 502-506
5 p.
|
article
|
| 10 |
Electron and ion optics
|
Miller, Paul A.
|
|
1989
|
43 |
4 |
p. 589-
1 p.
|
article
|
| 11 |
Electron-excited optical emission from H2O adsorbed on potassium halides at low temperatures
|
Kamada, M.
|
|
1989
|
43 |
4 |
p. 525-528
4 p.
|
article
|
| 12 |
Emission of hydrogen clusters from insulating films under fast heavy ion bombardment
|
Riggi, F.
|
|
1989
|
43 |
4 |
p. 520-524
5 p.
|
article
|
| 13 |
Equilibrium charge state of fast heavy ions in solids measurements of post-ionizatton effects
|
Brunelle, A.
|
|
1989
|
43 |
4 |
p. 484-489
6 p.
|
article
|
| 14 |
High-temperature phosphorus ion doping of silicon
|
Kachurin, G.A.
|
|
1989
|
43 |
4 |
p. 535-538
4 p.
|
article
|
| 15 |
Limits of depth resolution for sputter sectioning: A secondary ion mass spectrometry investigation of 63Ni in nickel
|
Macht, M.-P.
|
|
1989
|
43 |
4 |
p. 507-512
6 p.
|
article
|
| 16 |
Limits of depth resolution for sputter sectioning: Moments of tracer depth distribution
|
Naundorf, V.
|
|
1989
|
43 |
4 |
p. 513-519
7 p.
|
article
|
| 17 |
Mechanisms of ion neutralization at surfaces in fast collisions
|
Thumm, U.
|
|
1989
|
43 |
4 |
p. 471-483
13 p.
|
article
|
| 18 |
Proton energy straggling measurements in aluminum, titanium, silver and tungsten foils
|
Bauer, G.H.
|
|
1989
|
43 |
4 |
p. 497-501
5 p.
|
article
|
| 19 |
Subject index
|
|
|
1989
|
43 |
4 |
p. 601-604
4 p.
|
article
|
| 20 |
The influence of a water/tissue phantom on the response of a cr-39-based thermal-neutron dosimeter
|
Matiullah,
|
|
1989
|
43 |
4 |
p. 581-585
5 p.
|
article
|
| 21 |
The microstructure of short-time-annealed Se+ -implanted GaAs
|
Bachmann, T.
|
|
1989
|
43 |
4 |
p. 529-534
6 p.
|
article
|
| 22 |
Trace element variability in kidney stones
|
Galassini, S.
|
|
1989
|
43 |
4 |
p. 556-559
4 p.
|
article
|
| 23 |
X-ray and Raman studies of MeV ion-bombarded GaInAs/GaAs
|
Wie, Chu R.
|
|
1989
|
43 |
4 |
p. 560-564
5 p.
|
article
|
Journal description