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                             67 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accelerator Mass Spectrometry (AMS) of heavy elements Allen, K.W.
 1988
 35 3-4 p. 273-283
11 p.
 artikel
2 A DLTS study of defects formed in silicon during ion beam mixing Auret, F.D.
 1988
 35 3-4 p. 234-237
4 p.
 artikel
3 A multisegment annular Si-detector system for RBS analysis Günzler, R.
 1988
 35 3-4 p. 522-529
8 p.
 artikel
4 An ion scattering study of the adsorption of water on stainless steel Van Wyk, G.N.
 1988
 35 3-4 p. 504-508
5 p.
 artikel
5 Application of quantitative SIMS to determine the influence of impurities on the electrical properties of mercury cadmium telluride Botha, A.P.
 1988
 35 3-4 p. 420-422
3 p.
 artikel
6 Applications of ion beam analysis in biology and medicine, a review Maenhaut, Willy
 1988
 35 3-4 p. 388-403
16 p.
 artikel
7 A quantum chemical investigation of fluorine in diamond Verwoerd, W.S.
 1988
 35 3-4 p. 509-512
4 p.
 artikel
8 A sputtered neutral mass spectrometer with high current, low energy ion bombardment Kato, S.
 1988
 35 3-4 p. 550-554
5 p.
 artikel
9 A third generation 14C accelerator mass spectrometer Purser, K.H.
 1988
 35 3-4 p. 284-291
8 p.
 artikel
10 Author index 1988
 35 3-4 p. 569-575
7 p.
 artikel
11 Backscattering spectrometry with 4He, 14C, 14N, 40Ar and 84Kr analysis beams with energies 1.5–5.0 MeV Leavitt, J.A.
 1988
 35 3-4 p. 333-338
6 p.
 artikel
12 Basic physical aspects of high energy implantation Biersack, J.P.
 1988
 35 3-4 p. 205-214
10 p.
 artikel
13 Boron determination by thermal neutron capture prompt gamma analysis Hofmeyr, C.
 1988
 35 3-4 p. 435-441
7 p.
 artikel
14 Cation-ratio dating of petroglyphs using PIXE Whitley, David S.
 1988
 35 3-4 p. 410-414
5 p.
 artikel
15 Channeling analysis of intrinsic and radiation-induced disorder in single crystalline high-T c YBa2Cu3O7 thin films Meyer, O.
 1988
 35 3-4 p. 292-300
9 p.
 artikel
16 Characteristics of ion beam mixed and alloyed AuGe/Ni ohmic contacts to n-GaAs Barnard, W.O.
 1988
 35 3-4 p. 238-243
6 p.
 artikel
17 Charged particle induced delayed X-rays (DEX) for the analysis of intermediate and heavy elements Pillay, A.E.
 1988
 35 3-4 p. 555-560
6 p.
 artikel
18 Committees 1988
 35 3-4 p. ix-
1 p.
 artikel
19 Concentration levels of air particulates in a road tunnel Mingay, D.W.
 1988
 35 3-4 p. 451-456
6 p.
 artikel
20 Concepts for automated Rutherford backscattering measurement systems Revesz, P.
 1988
 35 3-4 p. 530-534
5 p.
 artikel
21 Conference photographs 1988
 35 3-4 p. xi-xii
nvt p.
 artikel
22 Correction of proton ranges in unknown samples by spiking Olivier, C.
 1988
 35 3-4 p. 263-267
5 p.
 artikel
23 Depth analysis of oxygen and gold in thin film semiconductor structures using RBS, AES, SIMS and resonant scattering Ras, H.A.
 1988
 35 3-4 p. 488-494
7 p.
 artikel
24 Depth profiling of element concentration using low energy proton induced X-ray emission Shaanan, M.
 1988
 35 3-4 p. 319-325
7 p.
 artikel
25 Depth profiling of phosphorus using resonances in the 31 P(α, p)34 S reaction McIntyre Jr., L.C.
 1988
 35 3-4 p. 446-450
5 p.
 artikel
26 Electrochemical behaviour of nitrogen-implanted 4145 steel Singh, Amarjit
 1988
 35 3-4 p. 495-499
5 p.
 artikel
27 Elemental analysis by IBA and NAA — A critical comparison Watterson, J.I.W.
 1988
 35 3-4 p. 370-377
8 p.
 artikel
28 Element distributions at depth from an iterative analysis of RBS spectra Edge, R.D.
 1988
 35 3-4 p. 309-314
6 p.
 artikel
29 Extract from the conference opening speech Venter, William P
 1988
 35 3-4 p. vii-viii
nvt p.
 artikel
30 Financial support 1988
 35 3-4 p. x-
1 p.
 artikel
31 Fission fragment response characteristics of thin film plastic scintillators Franklyn, C.B.
 1988
 35 3-4 p. 315-318
4 p.
 artikel
32 Fragments from fission: The forgotten ions Chadderton, Lewis T.
 1988
 35 3-4 p. 513-517
5 p.
 artikel
33 Heavy-ion induced K-shell ionization for elements 22 ≤ Z ≤ 28 Kotze, P.B.
 1988
 35 3-4 p. 329-332
4 p.
 artikel
34 Hydrogen and deuterium depth profiling by elastic recoil detection analysis Pretorius, R.
 1988
 35 3-4 p. 478-483
6 p.
 artikel
35 Implantation at energies above 150 keV Rose, Peter H.
 1988
 35 3-4 p. 535-540
6 p.
 artikel
36 Improved activation of boron-dopant atoms implanted into diamond Prins, Johan F.
 1988
 35 3-4 p. 484-487
4 p.
 artikel
37 Ion beam analysis for the determination of cation ratios as a means of dating Southern African rock varnishes Pineda, C.A.
 1988
 35 3-4 p. 463-466
4 p.
 artikel
38 Ion beam analysis VIII: State of the nation in 1988 Sellschop, J.P.F.
 1988
 35 3-4 p. 561-567
7 p.
 artikel
39 Ion beams for the production of neutrons and their use in selective activation analysis Watterson, J.I.W.
 1988
 35 3-4 p. 349-357
9 p.
 artikel
40 Ion bombardment of nickel contacts on silicon Myburg, G.
 1988
 35 3-4 p. 457-462
6 p.
 artikel
41 Light volatiles in synthetic diamond analysed by ion probes Madiba, C.C.P.
 1988
 35 3-4 p. 442-445
4 p.
 artikel
42 Mass spectrometry in geochemistry: An established tool in the earth sciences Smith, Craig B.
 1988
 35 3-4 p. 364-369
6 p.
 artikel
43 Matrix corrections for the determination of trace elements in thick biological samples by PIXE Pineda, C.A.
 1988
 35 3-4 p. 344-348
5 p.
 artikel
44 Modification of metal Schottky contacts on silicon by ion implantation Malherbe, J.B.
 1988
 35 3-4 p. 247-252
6 p.
 artikel
45 Nuclear reaction profiling of implanted interstitial redistribution in diamond Derry, T.E.
 1988
 35 3-4 p. 431-434
4 p.
 artikel
46 PIXE analysis of mineral matter in thin sections of human lung Annegarn, H.J.
 1988
 35 3-4 p. 415-419
5 p.
 artikel
47 Preface Sellschop, Friedel
 1988
 35 3-4 p. v-vi
nvt p.
 artikel
48 Prompt ion beam analysis by pulsed beams Mingay, D.W.
 1988
 35 3-4 p. 339-343
5 p.
 artikel
49 Pulsed electron beam annealing of Be-implanted InSb Alberts, H.W.
 1988
 35 3-4 p. 229-233
5 p.
 artikel
50 Radiation damage in InSb by alpha particle implantation Van Tonder, B.J.E.
 1988
 35 3-4 p. 268-272
5 p.
 artikel
51 Radiation damage in nickel and iron after ion implantation Friedland, E.
 1988
 35 3-4 p. 244-246
3 p.
 artikel
52 Recent developments in the applications of ion scattering spectroscopy Taglauer, E.
 1988
 35 3-4 p. 404-409
6 p.
 artikel
53 Routine SIMS microanalysis: Trace Au and Pt in sulphides Lindsay, N.M.
 1988
 35 3-4 p. 358-363
6 p.
 artikel
54 Scattering recoil coincidence spectrometry Wei-Kan, Chu
 1988
 35 3-4 p. 518-521
4 p.
 artikel
55 SIMS analysis for detection of contaminants in thin film photovoltaics Morris, G.C.
 1988
 35 3-4 p. 257-262
6 p.
 artikel
56 Simultaneous energy and angle resolved ion scattering spectroscopy Ackermans, P.A.J.
 1988
 35 3-4 p. 541-543
3 p.
 artikel
57 Subject index 1988
 35 3-4 p. 576-579
4 p.
 artikel
58 Subshell ionization of elements around Z = 50 by light-ion bombardment Kotzé, P.B.
 1988
 35 3-4 p. 326-328
3 p.
 artikel
59 The analysis of elastic recoil detection data Doyle, B.L.
 1988
 35 3-4 p. 301-308
8 p.
 artikel
60 The application of a combined PIXE and XRD approach to the analysis of human stones Pougnet, M.A.B.
 1988
 35 3-4 p. 472-477
6 p.
 artikel
61 The checkerboard technique: An essential progress in SIMS data acquisition and evaluation Daiser, S.M.
 1988
 35 3-4 p. 544-549
6 p.
 artikel
62 The determination of nitrogen in titanium nitride coatings using the nuclear reaction 15N (p, αγ)12C Pietersen, D.
 1988
 35 3-4 p. 467-471
5 p.
 artikel
63 The lattice site of 10F implanted into diamond by TDPAD Connell, S.
 1988
 35 3-4 p. 423-430
8 p.
 artikel
64 The search for molecular effects in range corrections: Phosphorus determination by proton bombardment Morland, H.J.
 1988
 35 3-4 p. 253-256
4 p.
 artikel
65 The stopping of ions in compounds Ziegler, J.F.
 1988
 35 3-4 p. 215-228
14 p.
 artikel
66 The surface of tungsten/silicon compounds studied by low-energy ion scattering Van Leerdam, G.C.
 1988
 35 3-4 p. 500-503
4 p.
 artikel
67 XRFS and PIXE: Are they complementary or competitive techniques? Willis, J.P.
 1988
 35 3-4 p. 378-387
10 p.
 artikel
                             67 gevonden resultaten
 
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