| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Author Index Proceedings
|
|
|
2012
|
284 |
C |
p. 83-85
3 p.
|
artikel
|
| 2 |
A velocity map imaging apparatus for gas phase studies at FERMI@Elettra
|
O’Keeffe, P.
|
|
2012
|
284 |
C |
p. 69-73
5 p.
|
artikel
|
| 3 |
Contents
|
|
|
2012
|
284 |
C |
p. v-
1 p.
|
artikel
|
| 4 |
Diffraction Anomalous Fine Structure study and atomistic simulation of Ge/Si nanoislands
|
Katcho, N.A.
|
|
2012
|
284 |
C |
p. 58-63
6 p.
|
artikel
|
| 5 |
Diffuse X-ray scattering from partially transformed 3C–SiC single crystals
|
Dompoint, D.
|
|
2012
|
284 |
C |
p. 19-22
4 p.
|
artikel
|
| 6 |
Doped-CuCl2/Al2O3 catalysts for ethylene oxychlorination: Influence of additives on the nature of active phase and reducibility
|
Gianolio, D.
|
|
2012
|
284 |
C |
p. 53-57
5 p.
|
artikel
|
| 7 |
Editorial board
|
|
|
2012
|
284 |
C |
p. IFC-
1 p.
|
artikel
|
| 8 |
Effect of selective area growth mask width on multi-quantum-well electroabsorption modulated lasers investigated by synchrotron radiation X-ray microprobe
|
Mino, Lorenzo
|
|
2012
|
284 |
C |
p. 6-9
4 p.
|
artikel
|
| 9 |
In situ combined synchrotron X-ray diffraction and wafer curvature measurements during formation of thin palladium silicide film on Si(001) and Si (111)
|
Fouet, J.
|
|
2012
|
284 |
C |
p. 74-77
4 p.
|
artikel
|
| 10 |
Local strain induced in silicon by Si3N4 lines: Modeling and experimental investigation via X-ray diffraction
|
Ezzaidi, Y.
|
|
2012
|
284 |
C |
p. 23-28
6 p.
|
artikel
|
| 11 |
MPOD: A Material Property Open Database linked to structural information
|
Pepponi, Giancarlo
|
|
2012
|
284 |
C |
p. 10-14
5 p.
|
artikel
|
| 12 |
Resolution effect on the study of ductile damage using synchrotron X-ray tomography
|
Landron, C.
|
|
2012
|
284 |
C |
p. 15-18
4 p.
|
artikel
|
| 13 |
Spatially resolved X-ray excited optical luminescence
|
Martínez-Criado, G.
|
|
2012
|
284 |
C |
p. 36-39
4 p.
|
artikel
|
| 14 |
Special Issue Title Page
|
|
|
2012
|
284 |
C |
p. iii-
1 p.
|
artikel
|
| 15 |
Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction
|
Juraić, Krunoslav
|
|
2012
|
284 |
C |
p. 78-82
5 p.
|
artikel
|
| 16 |
Structural study of Ca doped barium titanate
|
Park, Jong-Seo
|
|
2012
|
284 |
C |
p. 44-48
5 p.
|
artikel
|
| 17 |
Synthesis and characterisation of copper doped Ca–Li hydroxyapatite
|
Pogosova, M.A.
|
|
2012
|
284 |
C |
p. 33-35
3 p.
|
artikel
|
| 18 |
The influence of Cr-composition on the local magnetic structure of FeCr alloys
|
Idhil, A.
|
|
2012
|
284 |
C |
p. 1-5
5 p.
|
artikel
|
| 19 |
X-ray analyses of thermally grown and reactively sputtered tantalum oxide films on NiTi alloy
|
McNamara, Karrina
|
|
2012
|
284 |
C |
p. 49-52
4 p.
|
artikel
|
| 20 |
X-ray imaging and spectroscopy using low cost COTS CMOS sensors
|
Lane, David W.
|
|
2012
|
284 |
C |
p. 29-32
4 p.
|
artikel
|
| 21 |
X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments
|
Neuhold, A.
|
|
2012
|
284 |
C |
p. 64-68
5 p.
|
artikel
|
| 22 |
XRD characterisation of composite Ni-based coatings prepared by electrodeposition
|
Tarkowski, L.
|
|
2012
|
284 |
C |
p. 40-43
4 p.
|
artikel
|
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