| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Accelerator mass spectrometry: New trends and applications
|
Tuniz, C.
|
|
2008
|
266 |
8 |
p. 1837-1845
9 p.
|
article
|
| 2 |
A detailed ray-tracing simulation of the high resolution microbeam at the AIFIRA facility
|
Andersson, F.
|
|
2008
|
266 |
8 |
p. 1653-1658
6 p.
|
article
|
| 3 |
Advanced physics and algorithms in the IBA DataFurnace
|
Barradas, N.P.
|
|
2008
|
266 |
8 |
p. 1875-1879
5 p.
|
article
|
| 4 |
Age-related elemental change in bones
|
Wang, C.
|
|
2008
|
266 |
8 |
p. 1619-1622
4 p.
|
article
|
| 5 |
Angular dependence of electronic sputtering from HOPG
|
Tripathi, A.
|
|
2008
|
266 |
8 |
p. 1265-1268
4 p.
|
article
|
| 6 |
An ion track based approach to nano- and micro-electronics
|
Hoppe, K.
|
|
2008
|
266 |
8 |
p. 1642-1646
5 p.
|
article
|
| 7 |
Application of mass-separated focused ion beams in nano-technology
|
Bischoff, L.
|
|
2008
|
266 |
8 |
p. 1846-1851
6 p.
|
article
|
| 8 |
Application of PIXE to study ancient Iranian silver coins
|
Hajivaliei, M.
|
|
2008
|
266 |
8 |
p. 1578-1582
5 p.
|
article
|
| 9 |
Atomic scale characterization of ion-induced amorphization of GaAs and InAs using perturbed angular correlation spectroscopy
|
Dogra, R.
|
|
2008
|
266 |
8 |
p. 1460-1463
4 p.
|
article
|
| 10 |
Au2+ ion-beam irradiation effects on optical properties of CdSe and CdS quantum dots
|
Venkatram, N.
|
|
2008
|
266 |
8 |
p. 1816-1819
4 p.
|
article
|
| 11 |
Author Index Proceedings
|
|
|
2008
|
266 |
8 |
p. 1918-1932
15 p.
|
article
|
| 12 |
Channeling study of thermal decomposition of III-N compound semiconductors
|
Stonert, A.
|
|
2008
|
266 |
8 |
p. 1224-1228
5 p.
|
article
|
| 13 |
Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing
|
Beck, L.
|
|
2008
|
266 |
8 |
p. 1871-1874
4 p.
|
article
|
| 14 |
Combined grazing incidence RBS and TEM analysis of luminescent nano-SiGe/SiO2 multilayers
|
Kling, A.
|
|
2008
|
266 |
8 |
p. 1397-1401
5 p.
|
article
|
| 15 |
Complementary use of ion beam elastic backscattering and recoil detection analysis for the precise determination of the composition of thin films made of light elements
|
Climent-Font, A.
|
|
2008
|
266 |
8 |
p. 1498-1501
4 p.
|
article
|
| 16 |
Compositional analysis of atom beam co-sputtered metal–silica nanocomposites by Rutherford backscattering spectrometry
|
Kumar, Hardeep
|
|
2008
|
266 |
8 |
p. 1511-1516
6 p.
|
article
|
| 17 |
Conference Sponsors and Exhibitors
|
|
|
2008
|
266 |
8 |
p. vii-
1 p.
|
article
|
| 18 |
Contents
|
|
|
2008
|
266 |
8 |
p. xix-xxv
nvt p.
|
article
|
| 19 |
Controlled reduction of size of Ag nanoparticles embedded in teflon matrix by MeV ion irradiation
|
Mishra, Y.K.
|
|
2008
|
266 |
8 |
p. 1804-1809
6 p.
|
article
|
| 20 |
Correlation between ion beam parameters and physical characteristics of nanostructures fabricated by focused ion beam
|
Tripathi, Sarvesh K.
|
|
2008
|
266 |
8 |
p. 1468-1474
7 p.
|
article
|
| 21 |
Creation mechanism of pores by ion beam modification of fluoropolymer film membranes
|
Minamisawa, Renato Amaral
|
|
2008
|
266 |
8 |
p. 1273-1275
3 p.
|
article
|
| 22 |
Depth profiling of carbon in silicon using the 12C(p,p′γ) reaction
|
Yasuda, K.
|
|
2008
|
266 |
8 |
p. 1416-1420
5 p.
|
article
|
| 23 |
Detection of trace deuterium in depleted protium by MeV ion beam techniques
|
Döbeli, M.
|
|
2008
|
266 |
8 |
p. 1820-1823
4 p.
|
article
|
| 24 |
Determination of migration of ion-implanted helium in silica by proton backscattering spectrometry
|
Szakács, G.
|
|
2008
|
266 |
8 |
p. 1382-1385
4 p.
|
article
|
| 25 |
Determination of non-Rutherford cross-sections from simple RBS spectra using Bayesian inference data analysis
|
Barradas, N.P.
|
|
2008
|
266 |
8 |
p. 1180-1184
5 p.
|
article
|
| 26 |
Deuterium inventory in plasma facing materials by means of NRA: A microbeam probe approach
|
Khodja, H.
|
|
2008
|
266 |
8 |
p. 1425-1429
5 p.
|
article
|
| 27 |
Development of a position sensitive detector telescope for ERDA based on-line monitoring of swift heavy ions induced modifications
|
Khan, S.A.
|
|
2008
|
266 |
8 |
p. 1912-1917
6 p.
|
article
|
| 28 |
Development of a time-of-flight spectrometer at the Ruder Bošković Institute in Zagreb
|
Siketić, Zdravko
|
|
2008
|
266 |
8 |
p. 1328-1332
5 p.
|
article
|
| 29 |
Dielectric and structural modification of proton beam irradiated polymer composite
|
Shah, Sejal
|
|
2008
|
266 |
8 |
p. 1768-1774
7 p.
|
article
|
| 30 |
Editorial
|
Pathak, Anand P.
|
|
2008
|
266 |
8 |
p. v-vi
nvt p.
|
article
|
| 31 |
Editorial board
|
|
|
2008
|
266 |
8 |
p. IFC-
1 p.
|
article
|
| 32 |
Effect of ion beam irradiation on magnetic and structural properties of Pt/Cr/Co multilayers
|
Tripathi, J.K.
|
|
2008
|
266 |
8 |
p. 1247-1251
5 p.
|
article
|
| 33 |
Effect of 200MeV Ag15+ ion irradiation on structural and electrical transport properties of Fe3O4 thin films
|
Prakash, Ram
|
|
2008
|
266 |
8 |
p. 1242-1246
5 p.
|
article
|
| 34 |
Effect of 50MeV Li3+ ion irradiation on electrical characteristics of high speed NPN power transistor
|
Dinesh, C.M.
|
|
2008
|
266 |
8 |
p. 1713-1718
6 p.
|
article
|
| 35 |
Effects of 60MeV C5+ ion irradiation on PmT–PVC and p-TSA doped PoT–PVC blends
|
Lakshmi, G.B.V.S.
|
|
2008
|
266 |
8 |
p. 1685-1691
7 p.
|
article
|
| 36 |
Elastic recoil detection (ERD) analysis of GeO x thin films
|
Batra, Y.
|
|
2008
|
266 |
8 |
p. 1697-1700
4 p.
|
article
|
| 37 |
Electron ionization cross-section calculations for liquid water at high impact energies
|
Bousis, C.
|
|
2008
|
266 |
8 |
p. 1185-1192
8 p.
|
article
|
| 38 |
Energy dependence of proton-induced L X-ray production cross-section for W
|
Mohan, Harsh
|
|
2008
|
266 |
8 |
p. 1203-1205
3 p.
|
article
|
| 39 |
Energy loss and straggling of 7Li ions in the polymer foils
|
Yu, Y.C.
|
|
2008
|
266 |
8 |
p. 1166-1169
4 p.
|
article
|
| 40 |
Energy loss straggling in carbon foils by 1–2MeV/atom lithium and carbon cluster-ions
|
Hsu, J.Y.
|
|
2008
|
266 |
8 |
p. 1170-1172
3 p.
|
article
|
| 41 |
μ-Erda developments in order to improve the water content determination in hydrous and nominally anhydrous mantle phases
|
Raepsaet, C.
|
|
2008
|
266 |
8 |
p. 1333-1337
5 p.
|
article
|
| 42 |
Estimation of essential and trace elements in some medicinal plants by PIXE and PIGE techniques
|
Devi, K. Nomita
|
|
2008
|
266 |
8 |
p. 1605-1610
6 p.
|
article
|
| 43 |
Evaluation of non-Rutherford proton elastic scattering cross section for nitrogen
|
Gurbich, A.
|
|
2008
|
266 |
8 |
p. 1193-1197
5 p.
|
article
|
| 44 |
Evaluation of specimen preparation techniques for micro-PIXE localisation of elements in hyperaccumulating plants
|
Kachenko, Anthony G.
|
|
2008
|
266 |
8 |
p. 1598-1604
7 p.
|
article
|
| 45 |
Evolution of magnetic pillars using 200MeV Ag15+ ion irradiation
|
Kumar, Shalendra
|
|
2008
|
266 |
8 |
p. 1741-1748
8 p.
|
article
|
| 46 |
Evolution of nano-crystalline phases with post-annealing of nitrogen irradiated Fe/Co bilayers
|
Gupta, Ratnesh
|
|
2008
|
266 |
8 |
p. 1705-1708
4 p.
|
article
|
| 47 |
Experimental bremsstrahlung yields for MeV proton bombardment of beryllium and carbon
|
Cohen, David D.
|
|
2008
|
266 |
8 |
p. 1149-1153
5 p.
|
article
|
| 48 |
Exposure parameters in proton beam writing for hydrogen silsesquioxane
|
van Kan, J.A.
|
|
2008
|
266 |
8 |
p. 1676-1679
4 p.
|
article
|
| 49 |
Fast Monte Carlo for ion beam analysis simulations
|
Schiettekatte, François
|
|
2008
|
266 |
8 |
p. 1880-1885
6 p.
|
article
|
| 50 |
Flux dependent MeV ion induced modification of nano-Ag/Si system
|
Ghatak, J.
|
|
2008
|
266 |
8 |
p. 1282-1286
5 p.
|
article
|
| 51 |
1/f noise studies of swift heavy ion irradiated magnetite thin films
|
Wasi Khan, M.
|
|
2008
|
266 |
8 |
p. 1719-1722
4 p.
|
article
|
| 52 |
Focused ion beam implantation of Ga in nanocrystalline diamond: Fluence-dependent retention and sputtering
|
Gnaser, Hubert
|
|
2008
|
266 |
8 |
p. 1666-1670
5 p.
|
article
|
| 53 |
Formation of Au nanoparticles in silica by post-irradiation and thermal annealing
|
Budak, S.
|
|
2008
|
266 |
8 |
p. 1574-1577
4 p.
|
article
|
| 54 |
FTIR and RBS study of ion-beam synthesized buried silicon oxide layers
|
Patel, A.P.
|
|
2008
|
266 |
8 |
p. 1443-1446
4 p.
|
article
|
| 55 |
Group Photo
|
|
|
2008
|
266 |
8 |
p. viii-
1 p.
|
article
|
| 56 |
Growth and surface morphology of ion-beam sputtered Ti–Ni thin films
|
Rao, Ambati Pulla
|
|
2008
|
266 |
8 |
p. 1517-1521
5 p.
|
article
|
| 57 |
Growth of nanoscale cobalt clusters formed during implantation of 2MeV Co2+ ions in a silica matrix
|
Gangopadhyay, P.
|
|
2008
|
266 |
8 |
p. 1647-1652
6 p.
|
article
|
| 58 |
Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films
|
Ionescu, M.
|
|
2008
|
266 |
8 |
p. 1701-1704
4 p.
|
article
|
| 59 |
HRBS/channeling studies of ultra-thin ITO films on Si
|
Malar, P.
|
|
2008
|
266 |
8 |
p. 1464-1467
4 p.
|
article
|
| 60 |
Hydrogen diffusion in high temperature proton conducting ceramics
|
Sorieul, S.
|
|
2008
|
266 |
8 |
p. 1430-1433
4 p.
|
article
|
| 61 |
IBA characterisation of glasses from the archaeological site of “La Alcazaba”, Almería (Spain)
|
Respaldiza, M.A.
|
|
2008
|
266 |
8 |
p. 1587-1590
4 p.
|
article
|
| 62 |
Incident-angle dependence of ion-induced electron emission from Al & Co films using swift heavy ion
|
Chauhan, R.S.
|
|
2008
|
266 |
8 |
p. 1780-1782
3 p.
|
article
|
| 63 |
Influence of Cr-ions on the magnetic behaviour of FeCo film
|
Gupta, Ratnesh
|
|
2008
|
266 |
8 |
p. 1407-1410
4 p.
|
article
|
| 64 |
Influence of post-annealing time on blistering evolution in Si ‹100› implanted with high-fluence H ions
|
Liang, J.H.
|
|
2008
|
266 |
8 |
p. 1562-1568
7 p.
|
article
|
| 65 |
In situ ERDA measurements of hydrogen isotope concentrations in palladium at atmospheric pressure
|
Ishigami, Ryoya
|
|
2008
|
266 |
8 |
p. 1319-1323
5 p.
|
article
|
| 66 |
Interface strain study of thin Lu2O3/Si using HRBS
|
Chan, T.K.
|
|
2008
|
266 |
8 |
p. 1486-1489
4 p.
|
article
|
| 67 |
Introducing routine pulse height defect corrections in IBA
|
Pascual-Izarra, C.
|
|
2008
|
266 |
8 |
p. 1866-1870
5 p.
|
article
|
| 68 |
Investigations on 40MeV Li3+ ions irradiated GaN epilayers
|
Suresh Kumar, V.
|
|
2008
|
266 |
8 |
p. 1799-1803
5 p.
|
article
|
| 69 |
Ion beam analysis
|
Pathak, Anand P.
|
|
2008
|
266 |
8 |
p. iii-
1 p.
|
article
|
| 70 |
Ion beam analysis of materials in the PBMR reactor
|
Malherbe, Johan B.
|
|
2008
|
266 |
8 |
p. 1373-1377
5 p.
|
article
|
| 71 |
Ion beam analysis of rare earth nitride thin films
|
Kennedy, J.
|
|
2008
|
266 |
8 |
p. 1558-1561
4 p.
|
article
|
| 72 |
Ion beam cancer therapy: Fundamental aspects of the problem
|
Obolensky, O.I.
|
|
2008
|
266 |
8 |
p. 1623-1628
6 p.
|
article
|
| 73 |
Ion beam characterization of rf-sputter deposited AlN films on Si(111)
|
Matsunami, N.
|
|
2008
|
266 |
8 |
p. 1522-1526
5 p.
|
article
|
| 74 |
Ion beam induced charge imaging of charge transport in CdTe and CdZnTe
|
Sellin, P.J.
|
|
2008
|
266 |
8 |
p. 1300-1306
7 p.
|
article
|
| 75 |
Ion beam induced modifications in electron beam evaporated aluminum oxide thin films
|
Nagabhushana, K.R.
|
|
2008
|
266 |
8 |
p. 1475-1479
5 p.
|
article
|
| 76 |
Ion beam modification studies of InP based multi quantum wells
|
Dhamodaran, S.
|
|
2008
|
266 |
8 |
p. 1810-1815
6 p.
|
article
|
| 77 |
Ion beam sputtered ultra-thin and nanostructured Ag films for surface plasmon applications
|
Brahma, Rajeeb
|
|
2008
|
266 |
8 |
p. 1493-1497
5 p.
|
article
|
| 78 |
Ion beam studies of InAs/GaAs quantum dots after annealing
|
Niu, H.
|
|
2008
|
266 |
8 |
p. 1235-1237
3 p.
|
article
|
| 79 |
Ion beam studies of InAs/GaAs self assembled quantum dots
|
Alves, E.
|
|
2008
|
266 |
8 |
p. 1439-1442
4 p.
|
article
|
| 80 |
Ion beam studies on reactive DC sputtered manganese doped indium tin oxide thin films
|
Sarath Kumar, S.R.
|
|
2008
|
266 |
8 |
p. 1421-1424
4 p.
|
article
|
| 81 |
Ion beam synthesis and doping of photonic nanostructures
|
Elliman, R.G.
|
|
2008
|
266 |
8 |
p. 1362-1366
5 p.
|
article
|
| 82 |
Ion implantation in 4H–SiC
|
Wong-Leung, J.
|
|
2008
|
266 |
8 |
p. 1367-1372
6 p.
|
article
|
| 83 |
Ion-luminescence properties of GaN films being developed for IPEM
|
Rossi, P.
|
|
2008
|
266 |
8 |
p. 1294-1299
6 p.
|
article
|
| 84 |
Ion track enabled multiple wire microvia interconnects in printed circuit boards
|
Yousef, H.
|
|
2008
|
266 |
8 |
p. 1659-1665
7 p.
|
article
|
| 85 |
Irradiation effects on sodium sulphanilate dihydrate single crystals
|
Mythili, P.
|
|
2008
|
266 |
8 |
p. 1754-1758
5 p.
|
article
|
| 86 |
Light ion induced L X-ray production cross-sections in Au and Pb
|
Ouziane, S.
|
|
2008
|
266 |
8 |
p. 1209-1211
3 p.
|
article
|
| 87 |
Low energy ion and atom scattering spectroscopy for surface structural analysis of single metal and insulator crystals
|
Umezawa, K.
|
|
2008
|
266 |
8 |
p. 1892-1896
5 p.
|
article
|
| 88 |
Mass transport in ion–nanostructure interactions
|
Ghatak, J.
|
|
2008
|
266 |
8 |
p. 1671-1675
5 p.
|
article
|
| 89 |
Measurement of (d,p) and (d,α) differential cross-sections for 14N
|
Gurbich, A.
|
|
2008
|
266 |
8 |
p. 1206-1208
3 p.
|
article
|
| 90 |
Measurement of natural radioactivity and radon exhalation rate from rock samples of Jaduguda uranium mines and its radiological implications
|
Mahur, A.K.
|
|
2008
|
266 |
8 |
p. 1591-1597
7 p.
|
article
|
| 91 |
Measurement of nitrogen depth profile in steel
|
Curado, J.F.
|
|
2008
|
266 |
8 |
p. 1455-1459
5 p.
|
article
|
| 92 |
Measurements of Sr/Ca in bones to evaluate differences in temperature
|
Santos, P.R.
|
|
2008
|
266 |
8 |
p. 1616-1618
3 p.
|
article
|
| 93 |
100MeV Ag7+ ion induced physicochemical changes in isotactic polypropylene
|
Mathakari, N.L.
|
|
2008
|
266 |
8 |
p. 1793-1798
6 p.
|
article
|
| 94 |
Microbeam analysis of lateral inhomogeneity in depth penetration of Pd in porous silicon
|
Torkiha, M.
|
|
2008
|
266 |
8 |
p. 1507-1510
4 p.
|
article
|
| 95 |
Modification of polymer composite films using 120MeV Ni10+ ions
|
Qureshi, Anjum
|
|
2008
|
266 |
8 |
p. 1775-1779
5 p.
|
article
|
| 96 |
Modification of the etching properties of x-cut Lithium Niobate by ion implantation
|
Bianconi, M.
|
|
2008
|
266 |
8 |
p. 1238-1241
4 p.
|
article
|
| 97 |
Modifications of the structural, electrical and magnetic properties of LaFe0.5Ni0.5O3 thin films by 190MeV Ag ion irradiation
|
Choudhary, R.J.
|
|
2008
|
266 |
8 |
p. 1611-1615
5 p.
|
article
|
| 98 |
Molecular dynamics for ion beam analysis
|
Nordlund, K.
|
|
2008
|
266 |
8 |
p. 1886-1891
6 p.
|
article
|
| 99 |
Multianalytical characterization of a blue pigment used in art-crafts from Central Mexico
|
Solís, C.
|
|
2008
|
266 |
8 |
p. 1411-1415
5 p.
|
article
|
| 100 |
Multi-step mechanism of damage accumulation in irradiated crystals
|
Jagielski, J.
|
|
2008
|
266 |
8 |
p. 1212-1215
4 p.
|
article
|
| 101 |
Nanoindentation on single-crystal Si modified by 100keV Cr+ implantation
|
Mishra, P.
|
|
2008
|
266 |
8 |
p. 1629-1634
6 p.
|
article
|
| 102 |
Nitrogen sublattice analysis in GaN by non-Rutherford He-ion scattering
|
Turos, A.
|
|
2008
|
266 |
8 |
p. 1897-1902
6 p.
|
article
|
| 103 |
Nuclear reaction analysis of 1H and 2H in hafnium silicate films on Si
|
Driemeier, C.
|
|
2008
|
266 |
8 |
p. 1824-1827
4 p.
|
article
|
| 104 |
On the emission of MoCs+ molecular ions from Cs+ irradiated molybdenum surface
|
Saha, Biswajit
|
|
2008
|
266 |
8 |
p. 1386-1391
6 p.
|
article
|
| 105 |
On the ion irradiation stability of Al/Ti versus AlN/TiN multilayers
|
Peruško, D.
|
|
2008
|
266 |
8 |
p. 1749-1753
5 p.
|
article
|
| 106 |
Oxygen intake in ion irradiated fullerene films
|
Kumar, Amit
|
|
2008
|
266 |
8 |
p. 1709-1712
4 p.
|
article
|
| 107 |
Pd/Pt(111) surface structure and metal epitaxy by time-of-flight impact-collision ion scattering spectroscopy and scanning tunneling microscopy: Does lattice mismatch really determine the growth mode?
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2008
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266 |
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Performance of the HVE 5MV AMS system at CEREGE using an absorber foil for isobar suppression
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Klein, M.G.
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2008
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Photoacoustic spectroscopy of Ni+-implanted quartz
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Ghosh, Binita
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2008
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Photocollage
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Photon emission in crystalline undulators
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Korol, A.V.
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PIGE analysis and profiling of aluminium
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Mateus, R.
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2008
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Positron lifetime studies of the dose dependence of nanohole free volumes in ion-irradiated conducting poly-(ethylene-oxide)–salt polymers
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Kumar, Rajesh
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2008
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Post-annealing temperature dependence of blistering in high-fluence ion-implanted H in Si ‹100›
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Liang, J.H.
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Post deposition annealing of Hf aluminate films on Si investigated by ion backscattering and nuclear reaction analyses
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Miotti, L.
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2008
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4 p.
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Proton elastic scattering and proton induced γ-ray emission cross-sections on Na from 2 to 5MeV
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Caciolli, A.
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2008
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p. 1392-1396
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article
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Radiocarbon AMS at IOP: System improvements and dating of groundwater from Bhadrak district, Orissa
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Prasad, G.V. Ravi
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2008
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266 |
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p. 1833-1836
4 p.
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article
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RBS analysis of InGaN/GaN quantum wells for hybrid structures with efficient Förster coupling
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Barradas, N.P.
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2008
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266 |
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p. 1402-1406
5 p.
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article
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| 119 |
RBS/EBS/PIXE measurement of single-walled carbon nanotube modification by nitric acid purification treatment
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Jeynes, J.C.G.
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2008
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266 |
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p. 1569-1573
5 p.
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article
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RBS study of Ti/ZnO interface
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Rahman, A.M.A.
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2008
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266 |
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4 p.
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article
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Recent developments of ion beam induced luminescence at the external scanning microbeam facility of the LABEC laboratory in Florence
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Colombo, E.
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2008
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266 |
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p. 1527-1532
6 p.
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article
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Re-crystallization of Mn implanted GaAs by He+ ion irradiation
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Chen, C.H.
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2008
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266 |
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3 p.
|
article
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RESOLNRA: A new program for optimizing the achievable depth resolution of ion beam analysis methods
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Mayer, M.
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2008
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266 |
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p. 1852-1857
6 p.
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article
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| 124 |
Resonant Rutherford backscattering spectrometry for carbon diffusion in silicon
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Saravanan, K.
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2008
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266 |
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p. 1502-1506
5 p.
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article
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| 125 |
Saturable absorption in gold implanted fused silica
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Ghosh, Binita
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2008
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266 |
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p. 1356-1361
6 p.
|
article
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| 126 |
Search for short-time phase effects in the electronic damage evolution – A case study with silicon
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Schiwietz, G.
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2008
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266 |
8 |
p. 1287-1293
7 p.
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article
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| 127 |
Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
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Vittone, E.
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2008
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266 |
8 |
p. 1312-1318
7 p.
|
article
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| 128 |
Semi-empirical dielectric descriptions of the Bethe surface of the valence bands of condensed water
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Emfietzoglou, D.
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2008
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266 |
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p. 1154-1161
8 p.
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article
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| 129 |
SIMS study of effect of Cr adhesion layer on the thermal stability of silver selenide thin films on Si
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Mohanty, Bhaskar Chandra
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2008
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266 |
8 |
p. 1480-1485
6 p.
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article
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| 130 |
Status of the problem of nuclear cross section data for IBA
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Gurbich, A.
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2008
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266 |
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p. 1198-1202
5 p.
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article
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| 131 |
Stopping power for high energy molecular H 2 + ions interacting with silicon targets
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Touchrift, Brahim
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2008
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266 |
8 |
p. 1177-1179
3 p.
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article
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| 132 |
Structural analysis of DC magnetron sputtered and spin coated thin films using RBS, TEM and X-ray reflectivity methods
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Bhatta, Umananda M.
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2008
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266 |
8 |
p. 1548-1552
5 p.
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article
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| 133 |
Structural and compositional analysis of strain relaxed InGaAs/InP multi quantum wells
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Dhamodaran, S.
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2008
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266 |
8 |
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4 p.
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article
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| 134 |
Structural and surface characteristics of room temperature and low temperature swift heavy ion implanted InAs and InSb wafers
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Sudhakar, S.
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2008
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266 |
8 |
p. 1723-1728
6 p.
|
article
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| 135 |
Structural changes in helium implanted Zr0.8Y0.2O1.9 single crystals characterized by atomic force microscopy and EXAFS spectroscopy
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Kuri, G.
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2008
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266 |
8 |
p. 1216-1223
8 p.
|
article
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| 136 |
Structural characterization of buried nitride layers formed by nitrogen ion implantation in silicon
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Yadav, A.D.
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2008
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266 |
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3 p.
|
article
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| 137 |
Structural studies of silicon oxynitride layers formed by low energy ion implantation
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Chauhan, Alka R.
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2008
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266 |
8 |
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5 p.
|
article
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| 138 |
Studies of effect of deposition parameters on the ZnO films prepared by PLD
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Tripathi, Shuchi
|
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2008
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266 |
8 |
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4 p.
|
article
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| 139 |
Studies of InP nano dots formation after keV Ar+ irradiation
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Paramanik, Dipak
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2008
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266 |
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4 p.
|
article
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| 140 |
Study of ion beam mixing in Pt/Co bilayer by ion beam analysis
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Balaji, S.
|
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2008
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266 |
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5 p.
|
article
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| 141 |
Study of optical band gap and carbonaceous clusters in swift heavy ion irradiated polymers with UV–Vis spectroscopy
|
Kumar, Rajesh
|
|
2008
|
266 |
8 |
p. 1788-1792
5 p.
|
article
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| 142 |
Study of swift (100MeV) Fe9+ ion irradiated gallium antimonide
|
Jadhav, Vidya
|
|
2008
|
266 |
8 |
p. 1764-1767
4 p.
|
article
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| 143 |
Study on evolution of gases from fluoropolymer films bombarded with heavy ions
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Minamisawa, Renato Amaral
|
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2008
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266 |
8 |
p. 1269-1272
4 p.
|
article
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| 144 |
Sub-surface retention of Pb atoms in silicon after low-energy ion implantation and electron beam annealing
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Markwitz, Andreas
|
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2008
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266 |
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p. 1553-1557
5 p.
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article
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| 145 |
Summary of “IAEA intercomparison of IBA software”
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Barradas, N.P.
|
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2008
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266 |
8 |
p. 1338-1342
5 p.
|
article
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| 146 |
Surface roughness of ion-bombarded Si(100) surfaces: Roughening and smoothing with the same roughness exponent
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Roy, Anupam
|
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2008
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266 |
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6 p.
|
article
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| 147 |
Swift heavy ion induced modification in Fe/Ti system studied using X-ray waveguide structure
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Rajput, Parasmani
|
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2008
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266 |
8 |
p. 1680-1684
5 p.
|
article
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| 148 |
Swift heavy ion induced modification on the optical, mechanical and dielectric behaviour of GLS single crystals
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Mythili, P.
|
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2008
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266 |
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p. 1737-1740
4 p.
|
article
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| 149 |
Swift heavy ion induced single event upsets in high density UV-EPROM’s
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Dahiwale, S.S.
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2008
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266 |
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p. 1729-1733
5 p.
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article
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| 150 |
Swift heavy ions induced mixing in metal/semiconductor system
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Kumar, Sarvesh
|
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2008
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266 |
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p. 1759-1763
5 p.
|
article
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| 151 |
Synthesis of nanodimensional TiO2 thin films using energetic ion beam
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Thakurdesai, Madhavi
|
|
2008
|
266 |
8 |
p. 1343-1348
6 p.
|
article
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| 152 |
Taper angle dependence of the focusing effect of high energy heavy ion beams by glass capillaries
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Nebiki, T.
|
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2008
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266 |
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p. 1324-1327
4 p.
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article
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| 153 |
The energy dependence of sputtering induced ripple topography in Al film
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Mishra, P.
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2008
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266 |
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p. 1635-1641
7 p.
|
article
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| 154 |
The new Cyclone 18/9 beam transport line at the CNA (Sevilla) for high energy PIXE applications
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García López, J.
|
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2008
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266 |
8 |
p. 1583-1586
4 p.
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article
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| 155 |
The production of non linear damage under molecular ion implantation
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David, C.
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2008
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266 |
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p. 1252-1256
5 p.
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article
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| 156 |
The use of HI-ERDA/RBS and NRA/RBS to depth profile N in GaAs1−x N x thin films
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Smith, R.W.
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2008
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266 |
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p. 1450-1454
5 p.
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article
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| 157 |
Thickness and MeV Si ions bombardment effects on the thermoelectric properties of Ce3Sb10 thin films
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Güner, S.
|
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2008
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266 |
8 |
p. 1261-1264
4 p.
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article
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| 158 |
Tuning magnetic properties of Co/Pt thin films using energetic ions
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Som, T.
|
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2008
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266 |
8 |
p. 1542-1547
6 p.
|
article
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| 159 |
Ultra-high depth resolution SIMS for the interface analysis of complex low-dimensional structures
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Chakraborty, Purushottam
|
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2008
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266 |
8 |
p. 1858-1865
8 p.
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article
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| 160 |
Visible light emission from silicon dioxide with implanted excess silicon
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Gawlik, Grzegorz
|
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2008
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266 |
8 |
p. 1307-1311
5 p.
|
article
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| 161 |
Wedge etching by anodic oxidation and determination of shallow boron profile by ion beam analysis
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Gyulai, J.
|
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2008
|
266 |
8 |
p. 1434-1438
5 p.
|
article
|
Journal description