nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A new approach to deal with non-linearities in Si detector response
|
Menchaca-Rocha, A. |
|
2003 |
207 |
3 |
p. 356-367 12 p. |
artikel |
2 |
Backscattering of 6Li and 7Li Ions from oxygen below 6 MeV
|
Mayer, M. |
|
2003 |
207 |
3 |
p. 263-267 5 p. |
artikel |
3 |
Calendar
|
|
|
2003 |
207 |
3 |
p. 368-371 4 p. |
artikel |
4 |
Doppler broadened γ-lines from exotic nuclei
|
Fynbo, H.O.U. |
|
2003 |
207 |
3 |
p. 275-282 8 p. |
artikel |
5 |
Editorial board
|
|
|
2003 |
207 |
3 |
p. IFC- 1 p. |
artikel |
6 |
Electrical and optical isolation of GaN by high energy ion irradiation
|
Senthil Kumar, M. |
|
2003 |
207 |
3 |
p. 308-313 6 p. |
artikel |
7 |
Electron loss from fast partially stripped C and O ions incident on crystal targets
|
Kudo, Hiroshi |
|
2003 |
207 |
3 |
p. 283-290 8 p. |
artikel |
8 |
Fission-fragment registration and etching properties of diallyl phthalate with reference to its use as an external detector in fission-track dating
|
Yoshioka, Tetsu |
|
2003 |
207 |
3 |
p. 323-332 10 p. |
artikel |
9 |
Formation of MoSi2 and associated fractal growth on Si surface upon high current pulsed Mo-ion implantation
|
Cheng, X.Q. |
|
2003 |
207 |
3 |
p. 301-307 7 p. |
artikel |
10 |
Low current MeV Au2+ ion-induced amorphization in silicon: Rutherford backscattering spectrometry and transmission electron microscopy study
|
Kamila, J. |
|
2003 |
207 |
3 |
p. 291-295 5 p. |
artikel |
11 |
Low energy heavy ion detection with the plastic scintillator NE102E
|
Akhtar, M.N. |
|
2003 |
207 |
3 |
p. 333-338 6 p. |
artikel |
12 |
50 MeV Li3+ ion irradiation induced modifications in dielectric properties of Al3+ substituted Mg–Mn ferrite
|
Dogra, Anjana |
|
2003 |
207 |
3 |
p. 296-300 5 p. |
artikel |
13 |
Nuclear stopping in transmission experiments
|
Glazov, Lev G. |
|
2003 |
207 |
3 |
p. 240-256 17 p. |
artikel |
14 |
Nuclear track-formation models and the response of BP-1 detectors
|
Weaver, B.A. |
|
2003 |
207 |
3 |
p. 314-322 9 p. |
artikel |
15 |
Publisher’s note
|
|
|
2003 |
207 |
3 |
p. 239- 1 p. |
artikel |
16 |
Secondary ion mass spectrometry depth profiling of 59Co implanted into nickel
|
Vincent, L. |
|
2003 |
207 |
3 |
p. 339-344 6 p. |
artikel |
17 |
Some recent progress on the measurement of K-shell ionization cross-sections of atoms by electron impact: Application to Ti and Cr elements
|
An, Z |
|
2003 |
207 |
3 |
p. 268-274 7 p. |
artikel |
18 |
Trace elemental analysis of carcinoma kidney and stomach by PIXE method
|
Reddy, S.Bhuloka |
|
2003 |
207 |
3 |
p. 345-355 11 p. |
artikel |
19 |
ZnO–PbO–B2O3 glasses as gamma-ray shielding materials
|
Singh, Harvinder |
|
2003 |
207 |
3 |
p. 257-262 6 p. |
artikel |