| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A systematic study of the surface roughening and sputter rate variations occurring during SIMS ultrashallow depth profile analysis of Si with Cs+
|
van der Heide, P.A.W.
|
|
2003
|
201 |
2 |
p. 413-425
13 p.
|
artikel
|
| 2 |
Calendar
|
|
|
2003
|
201 |
2 |
p. 431-432
2 p.
|
artikel
|
| 3 |
Editorial
|
Andersen, Hans Henrik
|
|
2003
|
201 |
2 |
p. 315-316
2 p.
|
artikel
|
| 4 |
Editorial board
|
|
|
2003
|
201 |
2 |
p. IFC-
1 p.
|
artikel
|
| 5 |
Hard DLC film formation by gas cluster ion beam assisted deposition
|
Kitagawa, Teruyuki
|
|
2003
|
201 |
2 |
p. 405-412
8 p.
|
artikel
|
| 6 |
Interpretation of non-linear Si p–i–n detector response data to low-Z ions
|
Menchaca-Rocha, A.
|
|
2003
|
201 |
2 |
p. 426-430
5 p.
|
artikel
|
| 7 |
K X-ray production induced by 12C on several elements
|
Ozafrán, M.J.
|
|
2003
|
201 |
2 |
p. 317-324
8 p.
|
artikel
|
| 8 |
Slowing down of MeV heavy ions with Z=6–29 in PEN (C7H5O2)
|
Diwan, P.K
|
|
2003
|
201 |
2 |
p. 389-395
7 p.
|
artikel
|
| 9 |
Small angle multiple scattering of fast ions, physics, stochastic theory and numerical calculations
|
Amsel, G.
|
|
2003
|
201 |
2 |
p. 325-388
64 p.
|
artikel
|
| 10 |
Temperature dependence of the electron and ion induced electron emission yield of Al, Cu and Ag
|
Benka, O.
|
|
2003
|
201 |
2 |
p. 396-404
9 p.
|
artikel
|
Tijdschrift beschrijving