| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Calendar
|
|
|
2002
|
192 |
3 |
p. 345-347
3 p.
|
artikel
|
| 2 |
Defect distribution in MeV proton irradiated silicon measured by high-voltage current transient spectroscopy
|
Hazdra, P.
|
|
2002
|
192 |
3 |
p. 291-300
10 p.
|
artikel
|
| 3 |
Energy-loss spectra of swift ions: Beyond the Landau approximation
|
Glazov, Lev G.
|
|
2002
|
192 |
3 |
p. 239-248
10 p.
|
artikel
|
| 4 |
Halogen lamp-assisted high rate deposition of both hard and elastic carbon films from CH2I2
|
Lindstam, Mikael
|
|
2002
|
192 |
3 |
p. 274-279
6 p.
|
artikel
|
| 5 |
Implantation studies of keV positive muons in thin metallic layers
|
Morenzoni, E.
|
|
2002
|
192 |
3 |
p. 254-266
13 p.
|
artikel
|
| 6 |
Improving neutron detection efficiency by using passive converters
|
Baumann, T.
|
|
2002
|
192 |
3 |
p. 339-344
6 p.
|
artikel
|
| 7 |
Interaction of ambient nitrogen gas and laser ablated carbon plume: Formation of CN
|
Thareja, R.K.
|
|
2002
|
192 |
3 |
p. 301-310
10 p.
|
artikel
|
| 8 |
Lyoluminescence, thermoluminescence and photodecomposition in microcrystalline powder of KCl, KBr, KI and KI:KNO3 crystals
|
Dhoble, S.J.
|
|
2002
|
192 |
3 |
p. 280-290
11 p.
|
artikel
|
| 9 |
Measurement of non-Rutherford cross sections of 4 He ions on 14 N at a laboratory backscattering angle of 171° between 7.5 and 9.8 MeV
|
Berky, W.
|
|
2002
|
192 |
3 |
p. 249-253
5 p.
|
artikel
|
| 10 |
Neutron Doppler broadening studies of tantalum and tungsten metal
|
Lynn, J.Eric
|
|
2002
|
192 |
3 |
p. 318-330
13 p.
|
artikel
|
| 11 |
On the phosphorus characterization in thin SiO2 (P,B) CVD layer deposited onto a silicon substrate by PIXE
|
Nsouli, B.
|
|
2002
|
192 |
3 |
p. 311-317
7 p.
|
artikel
|
| 12 |
Theoretical study on the role of bound electron in backward secondary electron emission induced by He+ incident on solid surfaces
|
Lu, Qiliang
|
|
2002
|
192 |
3 |
p. 267-273
7 p.
|
artikel
|
| 13 |
Upgrading of the ultra-clean injector for depth profiling at the Munich AMS facility
|
Stan-Sion, C.
|
|
2002
|
192 |
3 |
p. 331-338
8 p.
|
artikel
|
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