no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
A low energy ion scattering investigation of the structure of bilayer islands of nanometric size in the initial stages of growth of iron on Cu 3 Au (001)
|
Terreni, S. |
|
2001 |
183 |
1-2 |
p. 97-107 11 p. |
article |
2 |
Editorial
|
Andersen, Hans Henrik |
|
2001 |
183 |
1-2 |
p. 1-2 2 p. |
article |
3 |
Estimation of the electronic straggling using delta-doped multilayers
|
Moon, D.W. |
|
2001 |
183 |
1-2 |
p. 10-15 6 p. |
article |
4 |
High-resolution depth profiling of ultrathin gate oxides using medium-energy ion scattering
|
Gustafsson, T |
|
2001 |
183 |
1-2 |
p. 146-153 8 p. |
article |
5 |
High-resolution elastic recoil detection utilizing Bayesian probability theory
|
Neumaier, P. |
|
2001 |
183 |
1-2 |
p. 48-61 14 p. |
article |
6 |
Hyperthermal and low-energy Ne+ scattering from Au and Pt surfaces
|
Tolstogouzov, A. |
|
2001 |
183 |
1-2 |
p. 116-127 12 p. |
article |
7 |
Lattice dynamics of RbI(001) surface studied by high-resolution medium energy ion scattering and molecular dynamics simulation
|
Okazawa, T. |
|
2001 |
183 |
1-2 |
p. 108-115 8 p. |
article |
8 |
Layer-resolved depth profiling at single crystal surfaces
|
Busch, B.W. |
|
2001 |
183 |
1-2 |
p. 88-96 9 p. |
article |
9 |
Limitations to depth resolution in ion scattering experiments
|
Schulte, W.H. |
|
2001 |
183 |
1-2 |
p. 16-24 9 p. |
article |
10 |
Measurements of the mean energy-loss of swift heavy ions in carbon with high precision
|
Zhang, Yanwen |
|
2001 |
183 |
1-2 |
p. 34-47 14 p. |
article |
11 |
Medium energy ion scattering for the characterisation of damage profiles of ultra shallow B implants in Si
|
van den Berg, J.A |
|
2001 |
183 |
1-2 |
p. 154-165 12 p. |
article |
12 |
Monolayer resolution in medium energy ion scattering
|
Bailey, P |
|
2001 |
183 |
1-2 |
p. 62-72 11 p. |
article |
13 |
On the limitations introduced by energy spread in elastic recoil detection analysis
|
Szilágyi, E. |
|
2001 |
183 |
1-2 |
p. 25-33 9 p. |
article |
14 |
Oxidation of Si(001) observed by high-resolution RBS
|
Kimura, Kenji |
|
2001 |
183 |
1-2 |
p. 166-170 5 p. |
article |
15 |
Structure determination of surface adsorption and surface alloy phases using medium energy ion scattering
|
Woodruff, D.P |
|
2001 |
183 |
1-2 |
p. 128-139 12 p. |
article |
16 |
Study of magnetic multilayers by RBS with nanometer resolution
|
Nagel, R. |
|
2001 |
183 |
1-2 |
p. 140-145 6 p. |
article |
17 |
Surface physics with low-energy ion scattering
|
Boerma, D.O. |
|
2001 |
183 |
1-2 |
p. 73-87 15 p. |
article |
18 |
The Rossendorf broad-range magnetic spectrometer for high resolution RBS and NRA
|
Grötzschel, R. |
|
2001 |
183 |
1-2 |
p. 3-9 7 p. |
article |