| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A study of buried silicon nitride layers formed by nitrogen implantation with a stationary beam
|
Wong, S.P.
|
|
1986
|
17 |
2 |
p. 122-126
5 p.
|
artikel
|
| 2 |
Calendar
|
|
|
1986
|
17 |
2 |
p. 189-191
3 p.
|
artikel
|
| 3 |
Deconvolution of neutron depth profiling spectra
|
Maki, John T.
|
|
1986
|
17 |
2 |
p. 147-155
9 p.
|
artikel
|
| 4 |
Electron beam induced charging of Cu/MgO surfaces
|
Møller, Preben J.
|
|
1986
|
17 |
2 |
p. 137-140
4 p.
|
artikel
|
| 5 |
Experience in SIMS surface analysis of radioactive waste glasses
|
Bart, Gerhard
|
|
1986
|
17 |
2 |
p. 127-136
10 p.
|
artikel
|
| 6 |
Foreign atom location by channeling in a helium irradiated Al-Mn alloy
|
Müller, Manfred
|
|
1986
|
17 |
2 |
p. 141-146
6 p.
|
artikel
|
| 7 |
Generation of a homogeneous large cross section ion beam in a magnetically insulated diode
|
Bistritsky, V.M.
|
|
1986
|
17 |
2 |
p. 182-185
4 p.
|
artikel
|
| 8 |
Large enhancement of TLD-100 sensitivity by irradiation in a reactor core
|
How Mooi Lau,
|
|
1986
|
17 |
2 |
p. 170-172
3 p.
|
artikel
|
| 9 |
Multi-Faraday-cup-type beam profile monitoring system for a dual-beam irradiation facility
|
Asano, Kyoichi
|
|
1986
|
17 |
2 |
p. 186-188
3 p.
|
artikel
|
| 10 |
Passage of nitrogen and oxygen ions through carbon and celluloid films
|
Zaikov, V.P.
|
|
1986
|
17 |
2 |
p. 97-107
11 p.
|
artikel
|
| 11 |
Scattering of low energy K+ and Na from W(110)
|
Tenner, Ariadne D.
|
|
1986
|
17 |
2 |
p. 108-121
14 p.
|
artikel
|
| 12 |
Stochastic filtering of experimental lineshapes: Application to EPR spectra
|
Jones, Richard B.
|
|
1986
|
17 |
2 |
p. 177-181
5 p.
|
artikel
|
| 13 |
Stopping powers of C, Al, Ni, Cu, In, Sn, Ag and Au for 7Li ions of 1.0–4.7 MeV
|
Lin, H.H.
|
|
1986
|
17 |
2 |
p. 91-96
6 p.
|
artikel
|
| 14 |
Structure modifications and mechanical properties of alloys exposed to pulsed ion beams
|
Didenko, A.N.
|
|
1986
|
17 |
2 |
p. 165-169
5 p.
|
artikel
|
| 15 |
Structure of near surface layers of GaAs and Si crystals irradiated by powerful ion beams
|
Bojarko, E.Yu.
|
|
1986
|
17 |
2 |
p. 162-164
3 p.
|
artikel
|
| 16 |
The analysis of the power approximation in thick target PIXE analysis
|
Šmit, Ž.
|
|
1986
|
17 |
2 |
p. 156-161
6 p.
|
artikel
|
| 17 |
Thermal annealing of nuclear tracks in polycarbonate plastic
|
Salamon, M.H.
|
|
1986
|
17 |
2 |
p. 173-176
4 p.
|
artikel
|
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