| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A crystalline undulator based on graded composition strained layers in a superlattice
|
Mikkelsen, U.
|
|
2000
|
160 |
3 |
p. 435-439
5 p.
|
artikel
|
| 2 |
Effects of H + , Ar + , and self-ion-irradiation on secondary defects in MeV P + -implanted Si(100)
|
Tian, Renhe
|
|
2000
|
160 |
3 |
p. 355-362
8 p.
|
artikel
|
| 3 |
Experimental determination of neutron spectra produced by bombarding thick targets: Deuterons (100 MeV/u) on 9Be, deuterons (100 MeV/u) on 238U and 36Ar (95 MeV/u) on 12C
|
Pauwels, N
|
|
2000
|
160 |
3 |
p. 315-327
13 p.
|
artikel
|
| 4 |
Formation of buried oxide layers in molybdenum by high-fluence oxygen ion implantation
|
Renner, Bernd
|
|
2000
|
160 |
3 |
p. 363-371
9 p.
|
artikel
|
| 5 |
Formation of NbAl3 by Nb ion implantation using metal vapor vacuum arc ion source
|
Miao, W
|
|
2000
|
160 |
3 |
p. 343-348
6 p.
|
artikel
|
| 6 |
Formation of (Nd,Y)-silicides by sequential channeled implantation of Y and Nd ions
|
Jin, S
|
|
2000
|
160 |
3 |
p. 349-354
6 p.
|
artikel
|
| 7 |
In situ performance of the CORAD device measuring contamination levels and penetration ratio of 137Cs
|
Fogh, C.L
|
|
2000
|
160 |
3 |
p. 408-414
7 p.
|
artikel
|
| 8 |
Molecular dynamics simulation of cluster beam Al deposition on Si (100) substrate
|
Zhang, H
|
|
2000
|
160 |
3 |
p. 372-376
5 p.
|
artikel
|
| 9 |
Monte Carlo calculations of hydrogen depth profiles in a-Si and a-Si:H
|
Horiki, H
|
|
2000
|
160 |
3 |
p. 328-332
5 p.
|
artikel
|
| 10 |
Monte Carlo simulations of the effects of thin layers of dislocation loops on dechannelling and backscattering in a silicon crystal
|
Mazzone, A.M
|
|
2000
|
160 |
3 |
p. 333-342
10 p.
|
artikel
|
| 11 |
Neutron long wavelength cut-off filter
|
Høghøj, P.
|
|
2000
|
160 |
3 |
p. 431-434
4 p.
|
artikel
|
| 12 |
Profiles of transmutation isotopes formed in solids by irradiation with charged particles: Formation, analysis and use
|
Didik, V.A.
|
|
2000
|
160 |
3 |
p. 387-396
10 p.
|
artikel
|
| 13 |
Some problems and solutions in the minicyclotron mass spectrometer (SMCAMS)
|
Liu, Yonghao
|
|
2000
|
160 |
3 |
p. 424-430
7 p.
|
artikel
|
| 14 |
Standardization of a micro-PIXE system using NIST iron- and nickel-based alloy reference materials
|
Nejedly, Zdenek
|
|
2000
|
160 |
3 |
p. 415-423
9 p.
|
artikel
|
| 15 |
Study of the TL response of LiF:Mg,Ti to 3 and 7.5 MeV helium ions: Measurements and interpretation in terms of the track interaction model
|
Rodrı́guez-Villafuerte, M
|
|
2000
|
160 |
3 |
p. 377-386
10 p.
|
artikel
|
| 16 |
The transformation of β-FeSi2 under Ar ion bombardment studied by XPS, AES and Mössbauer spectroscopy
|
Reiche, R
|
|
2000
|
160 |
3 |
p. 397-407
11 p.
|
artikel
|
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