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                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 AFM surface investigation of polyethylene modified by ion bombardment Švorčı́k, V.
1998
142 3 p. 349-354
6 p.
artikel
2 A round robin experiment of elemental sensitivity factors in low-energy ion scattering Brongersma, H.H.
1998
142 3 p. 377-386
10 p.
artikel
3 Development and characterization of a neutron tomography system based on image intensifier/CCD system Sinha, Amar
1998
142 3 p. 425-431
7 p.
artikel
4 Development of an rf driven multicusp ion source for nuclear science experiments 1 This work was supported by the Director, Office of Energy Research, Office of High Energy Physics and Nuclear Physics Division of the US Department of Energy under contract No. DE-AC03-76SFF00098. 1 Wutte, D
1998
142 3 p. 409-416
8 p.
artikel
5 Escape probability of low energy electrons and positrons emitted in random directions beneath a plane solid surface Liljequist, D.
1998
142 3 p. 295-307
13 p.
artikel
6 Feasibility of a cylindrical mirror electron analyzer for structural analysis of crystalline materials using weak ion beams Kudo, Hiroshi
1998
142 3 p. 402-408
7 p.
artikel
7 Gas amplification and ionization coefficients in isobutane and argon–isobutane mixtures at low gas pressures Krajcar Bronić, Ines
1998
142 3 p. 219-244
26 p.
artikel
8 Heteroepitaxial Er0.49Gd0.51Si1.7 layers formed by channeled ion beam synthesis Wu, M.F
1998
142 3 p. 355-360
6 p.
artikel
9 Lattice strain measurement of strained In0.1Ga0.9As/GaAs heterostructures by RBS and channeling Siddiqui, Azher M.
1998
142 3 p. 387-392
6 p.
artikel
10 Microstructural investigation of ion beam synthesised germanium nanoclusters embedded in SiO2 layers Markwitz, A
1998
142 3 p. 338-348
11 p.
artikel
11 On the condensed history technique for electron transport Kawrakow, I.
1998
142 3 p. 253-280
28 p.
artikel
12 Oxygen distribution in the heteroepitaxially grown Y2O3 films on Si substrates Kim, H.B.
1998
142 3 p. 393-396
4 p.
artikel
13 Pillar defects, a new type of track in Pb-irradiated Bi-2212 thin films: Nanostructural study and influence on the irreversibility line Hébert, S.
1998
142 3 p. 319-328
10 p.
artikel
14 Preferential effects in low-energy Si bombardment of SiC Hensel, Hartmut
1998
142 3 p. 287-294
8 p.
artikel
15 Pulsed gas injection for X-ray spectroscopy of highly charged ions stored in the magnetic trapping mode of an electron beam ion trap Schweikhard, L
1998
142 3 p. 245-252
8 p.
artikel
16 Pulse-shape discrimination in neutron depth profiling technique Vacı́k, J.
1998
142 3 p. 397-401
5 p.
artikel
17 Refractive index behaviors of helium implanted optical planar waveguides in LiNbO3, KTiOPO4 and Li2B4O7 Bindner, P
1998
142 3 p. 329-337
9 p.
artikel
18 SIMS depth profile correction for the study of the first step of the diffusion of boron in silicon Gautier, B.
1998
142 3 p. 361-376
16 p.
artikel
19 The electroluminescence from porous β-SiC formed on C+ implanted silicon Li, Ning-Sheng
1998
142 3 p. 308-312
5 p.
artikel
20 Theoretical model and computer simulation results of enhanced diffusion of high-temperature implanted aluminum in silicon carbide Gadiyak, G.V.
1998
142 3 p. 313-318
6 p.
artikel
21 Time-of-flight spectrometry applied to 2 MeV He RBS Döbeli, M.
1998
142 3 p. 417-424
8 p.
artikel
22 Triply differential cross section for ionization of multielectronic targets Sánchez, M.D.
1998
142 3 p. 281-286
6 p.
artikel
23 X-ray diffraction by standing surface acoustic waves Roshchupkin, D.V
1998
142 3 p. 432-436
5 p.
artikel
                             23 gevonden resultaten
 
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